IEEE International Test Conference
ITC
A
CORE rank
CORE rank (raw)
A
Fields of research
Computer Systems Engineering
Papers indexed
4,920
1981–2025
Papers per year
1981207 peak2025
Most published authors
ITC papers
4,920 records sourced from DBLP. Search titles, filter by year, sort by recency.
| Year | Title | Authors |
|---|---|---|
| 2024 | Locked-by-Design: Enhancing White-box Logic Obfuscation with Effective Key Mutation. | Leon Li, Alex Orailoglu |
| 2024 | Boost CPU Turbo Yield Utilizing Explainable Artificial Intelligence. | C. W. Lin, P. C. Tsao, Ross Lee, Khim Koh, Y. J. Ting, Jennifer Hsiao, C. T. Lai, T. H. Lee |
| 2024 | Predictive Testing for Aging in SRAMs and Mitigation. | Yunkun Lin, Mingye Li, Sandeep Gupta |
| 2024 | qFD: Coherent and Depolarizing Fault Diagnosis for Quantum Processors. | Yen-Wei Li, Cheng-Yun Hsieh, Meng-Chen Wu, James Chien-Mo Li |
| 2024 | Diagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies. | Jaehoon Lee, Hyeonuk Son, Seohyun Kang, Dahyun Kang, Dongkwan Han, Jongsin Yun, Artur Pogiel, Etienne Racine, Krzysztof Jurga, Lori Schramm, Martin Keim |
| 2024 | Probe Card Ground Noise Canceling Circuit. | Seongkwan Lee, Minho Kang, Cheolmin Park, Jun Yeon Won, Jaemoo Choi, Chanyeol Park, Sunyong Park, Woonphil Yang |
| 2024 | Small-Bridging-Fault-Aware Built-In-Self-Repair for Cycle-Based Interconnects in a Chiplet Design Using Adjusted Pulse-Vanishing Test. | Chi Lai, Shi-Yu Huang |
| 2024 | TEACH: Outlier Oriented Testing of Analog/Mixed-Signal Circuits Using One-class Hyperdimensional Clustering. | Suhasini Komarraju, Mohamed Mejri, Abhijit Chatterjee, Suriyaprakash Natarajan, Prashant Goteti |
| 2024 | Towards Machine-Learning-based Oracle-Guided Analog Circuit Deobfuscation. | Dipali Jain, Guangwei Zhao, Rajesh Datta, Kaveh Shamsi |
| 2024 | Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing. | Hanieh Jafarzadeh, Florian Klemme, Jan Dennis Reimer, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 2024 | Short Paper: Bus-based Packetized Scan Architecture Trade-offs for Heterogeneous Multi-Core SoCs. | Hiroyuki Iwata, Mahmoud AbdAlwahab, Ron Press, Ohki Sugiura |
| 2024 | Efficient Built-In Self-Test Scheme for Inter-Die Interconnects of Chiplet-Based Chips. | Yi-Chun Huang, Pei-Yun Lin, Jin-Fu Li, Hong-Siang Fu, Yung-Ping Lee |
| 2024 | Identifying Undetectable Defects Using Equivalence Checking. | Lars Hedrich, Inga Abel, Jaafar Mejri, Vladimir A. Zivkovic |
| 2024 | SECT-HI: Enabling Secure Testing for Heterogeneous Integration to Prevent SiP Counterfeits. | Galib Ibne Haidar, Md Sami Ul Islam Sami, Jingbo Zhou, Kimia Zamiri Azar, Mark Tehranipoor, Farimah Farahmandi |
| 2024 | Physical-Aware Interconnect Test for Multi-Die Systems Using 3Dblox Open Standard. | Sandeep Kumar Goel, Ankita Patidar, Moiz Khan, Frank Lee, Anshuman Chandra, Martin Keim, Naim Lemar, Jonathan Gaudet, Quoc Phan, Vidya Neerkundar |
| 2024 | Handling Die-to-Die I/O Pads for 3DIC Interconnect Tests. | Sandeep Kumar Goel, Moiz Khan, Ankita Patidar, Frank Lee, Vuong Nguyen, Bharath Shankaranarayanan, Doo Kim, Manish Arora |
| 2024 | High-Bandwidth IJTAG over SSN. | Jonathan Gaudet, Jan Burchard, Matthias Kampmann, Jean-Franois Ct, Tim Callahan, Hung Ho Chai, Ivy Ee Hsia Lim, Lori Schramm, Olga Przybysz, Marta Stepniewska, Sascha Ochsenknecht, Michal Olejarz, Martin Keim |
| 2024 | A Cell-aware Transistor State Stress Model and its Application for Quality Measurement. | Stephan Eggersgl, Andreas Glowatz |
| 2024 | Evaluating Vulnerability of Chiplet-Based Systems to Contactless Probing Techniques. | Aleksa Deric, Kyle Mitard, Shahin Tajik, Daniel E. Holcomb |
| 2024 | Adaptive Diagnosis Points for 100% Chain Diagnosis Coverage. | Wu-Tung Cheng, Manish Sharma, Xin Yang, Artur Stelmach, Szczepan Urban, Jakub Janicki, Preston McWithey |
| 2024 | SEC-CiM: Selective Error Compensation for ReRAM-based Compute-in-Memory | Ashish Reddy Bommana, Farshad Firouzi, Chukwufumnanya Ogbogu, Biresh Kumar Joardar, Janardhan Rao Doppa, Partha Pratim Pande, Krishnendu Chakrabarty |
| 2024 | Electrical Stimulus Based Calibration of MEMS Accelerometer. | Ishaan Bassi, Sule Ozev |
| 2024 | Power-Aware Test Scheduling for Memory BIST. | Albert Au, Michal Kpinski, Makary Orczyk, Artur Pogiel |
| 2024 | Design-for-Test for Silicon Photonic Circuits. | Pratishtha Agnihotri, Priyank Kalla, Steve Blair |
| 2024 | A Robust On-Chip Sensor for Online Monitoring of BTI-Induced Aging in Integrated Circuits. | Daniel Adjei, Emmanuel Nti Darko, Degang Chen |
126–150 of 4,920← PreviousNext →
Comparable venues
Other A*/A conferences filed under the same field of research.
- ADATEDesign, Automation and Test in Europe Conference
- A*DACDesign Automation Conf
- ASCInternational Conference for High Performance Computing, Networking, Storage and Analysis (was Supercomputing Conference)
- AICCADIEEE/ACM International Conference on Computer-Aided Design
- A*ISCAACM International Symposium on Computer Architecture
- A*MICROInternational Symposium on Microarchitecture
- AISLPEDIEEE/ACM International Symposium on Low Power Electronics and Design
- AICSACM International Conference on Supercomputing