| 2024 | Deterministic In-Fleet Scan Test for a Cloud Computing Platform. | Dan Trock, Subramanian Mahadevan, Nilanjan Mukherjee, Lee Harrison, Janusz Rajski, Jerzy Tyszer |
| 2024 | AI-Enabled Board Level Vibration Testing: Unveiling The Physics of Degradation. | Varun Thukral, Chen He, Rebecca Chen, Letian Zhang, Romuald Roucou, Michiel van Soestbergen, Jeroen J. M. Zaal, Rene Rongen, Willem D. van Driel, G. Q. Zhang |
| 2024 | Defect Analysis for FeFETs using a Compact Model. | Dhruv Thapar, Arjun Chaudhuri, Kai Ni, Krishnendu Chakrabarty |
| 2024 | Safety-Guided Test Generation for Structural Faults. | Xuanyi Tan, Dhruv Thapar, Deepesh Sahoo, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty, Rubin A. Parekhji |
| 2024 | Digital Scan and ATPG for Analog Circuits. | Stephen Sunter, Krzysztof Jurga |
| 2024 | Toward Fault-Tolerant Applications on Reconfigurable Systems-on-Chip. | Corrado De Sio, Luca Sterpone |
| 2024 | A Fast, Statistical, Machine-learning Approach for Automotive Semiconductor Test Reduction. | Mehul D. Shroff, Nguyen Nguyen, Kiran Sunny Thota |
| 2024 | A graph-based algorithm for NVM address decoders testing. | Pierre Scaramuzza, Thomas Kern, Matteo Coppetta, Alessandro Grossi, Rudolf Ullmann |
| 2024 | Unsupervised Learning Provides Intelligence for Testing Hard to Detect Faults. | Soham Roy, Vishwani D. Agrawal |
| 2024 | Test Data Encryption with a New Stream Cipher. | Janusz Rajski, Maciej Trawka, Jerzy Tyszer, Bartosz Wlodarczak |
| 2024 | FAT-RABBIT: Fault-Aware Training towards Robustness AgainstBit-flip Based Attacks in Deep Neural Networks. | Hossein Pourmehrani, Javad Bahrami, Parsa Nooralinejad, Hamed Pirsiavash, Naghmeh Karimi |
| 2024 | Functionally-Possible Gate-Exhaustive Bridging Faults. | Irith Pomeranz |
| 2024 | From Hybrid to Integrated: The Evolution of DFT Integration in SoC Design at Intel. | Brian Pajak, Pankaj Pant, Vidya Neerkundar |
| 2024 | E-SCOUT: Efficient-Spatial Clustering-based Outlier Detection through Telemetry. | Eduardo Ortega, Jonti Talukdar, Woohyun Paik, Fei Su, Rita Chattopadhyay, Krishnendu Chakrabarty |
| 2024 | Generation and Quality Evaluation of Synthetic Process Control Monitoring Data. | Matthew Nigh, John M. Carulli, Yiorgos Makris |
| 2024 | Cross-Layer Reliability Evaluation of In-Memory Similarity Computation. | Ali Nezhadi, Mahta Mayahinia, Mehdi B. Tahoori |
| 2024 | Effectiveness of Timing-Aware Scan Tests in Targeting Marginal Failures and Silent Data Errors in a Data Center Processor. | Suriyaprakash Natarajan, Chaitali S. Oak, Vijay Kakollu, Nipun Chaplot, Soham Roy, Apurva Lonkar, Gerardo J. Perfecto Reyes |
| 2024 | A Fast and Efficient Graph-Based Methodology for Cell-Aware Model Generation. | Gianmarco Mongelli, Eric Faehn, Dylan Robins, Patrick Girard, Arnaud Virazel |
| 2024 | Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification. | Abhishek Kumar Mishra, Suman Kumar, Anush Niranjan Lingamoorthy, Anup Das, Nagarajan Kandasamy |
| 2024 | A Scalable & Cost Efficient Next-Gen Scan Architecture: Streaming Scan Test via NVIDIA MATHS. | Kunal Jain Mangilal, Mahmut Yilmaz, Vishal Agarwal, Shantanu Sarangi, Kaushik Narayanun |
| 2024 | MBIST-based MRAM defect screening for safety-critical applications. | Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi B. Tahoori |
| 2024 | Scalable BIST for Linearity Testing of Sigma-Delta Modulators. | Krishna Pramod Madabhushi, Trevor LaBanz, Sudip Dandnaik, Eslam Hag |
| 2024 | Wafer-View Defect-Pattern-Prominent GDBN Method Using MetaFormer Variant. | Shu-Wen Li, Chia-Heng Yen, Shuo-Wen Chang, Ying-Hua Chu, Kai-Chiang Wu, Mango Chia-Tso Chao |
| 2024 | LESER-2: Detailed Consideration in Latch Design under Process Migration for Prevention of Single-Event Double-Node Upsets. | Alan S.-M. Liu, Lowry P.-T. Wang, Charles H.-P. Wen, Herming Chiueh |
| 2024 | Enhancing Functional Verification with Dynamic Instruction Generation by Exploiting Processor Runtime States. | Anlin Liu, Tianyao Lu, Yuhao Xi, Yangfan Liu, Peng Liu |