IEEE International Test Conference
ITC
A
CORE rank
CORE rank (raw)
A
Fields of research
Computer Systems Engineering
Papers indexed
4,920
1981–2025
Papers per year
1981207 peak2025
Most published authors
ITC papers
4,920 records sourced from DBLP. Search titles, filter by year, sort by recency.
| Year | Title | Authors |
|---|---|---|
| 2025 | Why is Rigorous PCIe LTSSM Testing a Key to Robust and Reliable Systems? | Sean Chen, Amarildo Garcia, Frank Chang, Joe Obedowski, Victor Castillo |
| 2025 | Genshin: A Generalized Framework with Software-Hardware Co-design and Pruned Fault Injection for Reliability Analysis. | Quan Cheng, Hao-Yang Chi, Chien-Hsing Liang, Yu-Hong Chao, Huizi Zhang, Yuan Liang, Mingtao Zhang, Wang Liao, Jinjun Xiong, Jing-Jia Liou, Masanori Hashimoto, Longyang Lin |
| 2025 | Enhancing Timing Predictability in Automotive Electronics: Addressing Aging and Temperature Distributions. | Jeffery Y.-C. Chen, Jason W.-Y. Cheng, Aaron C.-W. Liang, Charles H.-P. Wen, Gung-Yu Pan, Hen-Ming Lin |
| 2025 | TESLA: Testability Enhancement for Shift-Left Automation via Multi-LLM Collaboration. | Zhiteng Chao, Rengang Zhang, Feng Gu, Hongqin Lyu, Bin Sun, Wenxing Li, Zizhen Liu, Jianan Mu, Jing Ye, Xiaowei Li, Huawei Li |
| 2025 | Early Reliability Estimation in Hardware Accelerators using Improved Colored Petri Nets. | Ernesto Cristopher Villegas Castillo, Felipe Augusto da Silva, Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Michael Gla |
| 2025 | Persistent High-Bandwidth IJTAG Data Delivery. | Jan Burchard, Matthias Kampmann, Ayush Patel, Marta Stepniewska, Przemyslaw Szymanski, Wojciech Janiszewski, Jean-Franois Ct, Michal Olejarz, Olga Przybysz, Lori Schramm, Jonathan Gaudet, Martin Keim |
| 2025 | LA-DOS: Layout-Aware-Defect-Oriented Stress UDFM & ATPG Pattern Generation for Zero Defect Automotive Designs. | Mohammed Zine E. Brahmi, Jennifer Dworak, Martina Perkovic, Megan Appel, Saidapet Ramesh, Ravi J. N, Ramanath Dharmavarm, Arun Kumar Anjaneyareddy, Chen He |
| 2025 | A Benchmark Suite to Evaluate DNN's Resilience. | Cristiana Bolchini, Alberto Bosio, Luca Cassano, Antonio Miele, Salvatore Pappalardo, Dario Passariello, Annachiara Ruospo, Ernesto Snchez, Matteo Sonza Reorda, Vittorio Turco |
| 2025 | SMART: Scalable and Modular Architecture for Routing-Aware Testing of Fan-out Wafer-Level Packages | Partho Bhoumik, Dhruv Thapar, Arjun Chaudhuri, Krishnendu Chakrabarty |
| 2025 | Fault Modeling and Testing of Chiplet-to-Chiplet Interconnects in Fan-out Wafer-Level Packaging | Partho Bhoumik, Arjun Chaudhuri, Sandeep Kumar Goel, Krishnendu Chakrabarty |
| 2025 | Minimal Supervision, Maximum Accuracy: TabPFN for Microcontroller Performance Prediction. | Nicol Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Annachiara Ruospo |
| 2025 | FAMOUS: Fault Attack Mitigation via Exploiting Invariances in Deep Neural Networks. | Javad Bahrami, Parsa Nooralinejad, Hamed Pirsiavash, Naghmeh Karimi |
| 2025 | System-Level Test techniques for Automotive SoCs. | Francesco Angione, Paolo Bernardi, Riccardo Cantoro |
| 2025 | Test Bin Entitlement: Yield Outlier Detection using Die Area and LLM based Bin-Grouping. | Ragad Al-Huq, Yuegui Zheng |
| 2025 | Fault Tolerance in RRAM-based AI Accelerator with Guided Randomized Activation. | Soyed Tuhin Ahmed, Eduardo Ortega, Ryan Depsey, T. Patrick Xiao, Ben Feinberg, Christopher H. Bennett, Matthew J. Marinella, Krishnendu Chakrabarty |
| 2025 | Improving Error Tolerance and Scalability in Pseudo-Boolean SAT-based Generic Side-Channel Analysis. | Shakil Ahmed, Dipali Jain, Kaveh Shamsi |
| 2025 | Secure and Efficient Sharing of On-Chip Resources. | Joel hlund, Markus Trmnen, Erik Larsson |
| 2024 | Diagnosis of Defects on Global Signals. | Xinyang Zhao, Baohua Wang, Yin Zhang, Weiming Zhang, Xiaotian Ding, Yu Huang |
| 2024 | Testing for aging in advanced SRAM: From front end of the line transistors to back end of the line interconnects. | Zhe Zhang, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
| 2024 | Testing STT-MRAMs: Do We Need Magnets in our Automated Test Equipment? | Sicong Yuan, Hanzhi Xun, Woojin Kim, Siddharth Rao, Erik Jan Marinissen, Sebastien Couet, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | WM-Graph: Graph-Based Approach for Wafermap Analytics. | Min Jian Yang, Yueling Jenny Zeng, Li-C. Wang |
| 2024 | Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs. | Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Erbing Hua, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | Defects, Fault Modeling, and Test Development Framework for FeFETs. | Changhao Wang, Sicong Yuan, Hanzhi Xun, Chaobo Li, Mottaqiallah Taouil, Moritz Fieback, Danyang Chen, Xiuyan Li, Lin Wang, Riccardo Cantoro, Chujun Yin, Said Hamdioui |
| 2024 | Functional State Extraction using Scan DFT. | Ilya Wagner, Pankaj Pant, Arani Sinha |
| 2024 | Scan SerDes | Saurabh Upadhyay, Ahmet Tokuz |
76–100 of 4,920← PreviousNext →
Comparable venues
Other A*/A conferences filed under the same field of research.
- ADATEDesign, Automation and Test in Europe Conference
- A*DACDesign Automation Conf
- ASCInternational Conference for High Performance Computing, Networking, Storage and Analysis (was Supercomputing Conference)
- AICCADIEEE/ACM International Conference on Computer-Aided Design
- A*ISCAACM International Symposium on Computer Architecture
- A*MICROInternational Symposium on Microarchitecture
- AISLPEDIEEE/ACM International Symposium on Low Power Electronics and Design
- AICSACM International Conference on Supercomputing