IEEE International Test Conference
ITC
A
CORE rank
CORE rank (raw)
A
Fields of research
Computer Systems Engineering
Papers indexed
4,920
1981–2025
Papers per year
1981207 peak2025
Most published authors
ITC papers
4,920 records sourced from DBLP. Search titles, filter by year, sort by recency.
| Year | Title | Authors |
|---|---|---|
| 2025 | CP-Bench: A PyTorch Test Suite to Detect AI Hardware Failure, Performance Degradation, and Silent Data Corruption. | Xun Jiao, Sunny Yang, Suman Gumudavelli, Shreya Varshini, Abhinav Pandey, Abhinav Jauhri, Francesco Caggioni, Gautham Vunnam, Harish Dattatraya Dixit, Jason Liang, Philip Henzler, Sameeksha Gupta, Tyler Graf, Venkat Ramesh, Fan Fred Lin |
| 2025 | Deep Learning-based IC Monitoring. | Iresh M. Jayawardana, Krishna Dahal, Spyros Tragoudas, Khader S. Abdel-Hafez, Danushka Senarathna |
| 2025 | A Novel Omnidirectional 3D Test Access Architecture for Advanced System-on-Wafer (SoW) Applications. | Hiroyuki Iwata, Sandeep Kumar Goel, Ankita Patidar, Fumiaki Takashima, Frank Lee |
| 2025 | Push-on mating 57- to 81- GHz mm-Wave interface with high repeatability for ATE application. | Minoru Iida, Norio Kobayashi, Hideki Shirasu, Masayuki Nakamura |
| 2025 | Holistic Validation Pattern Generation for IEEE 1687 and Streaming Scan Networks. | Sebastian Huhn, Matthias Kampmann, Jan Burchard, Reinhard Meier, Kacper Czerniawski, Lori Schramm, Sandipan Sharma, Nikita Naresh, Wilson Pradeep, Prachi Sinha, Mayank Parasrampuria, Jonathan Gaudet, Martin Keim |
| 2025 | Wafer Map Pattern Recognition for Multisite Probe with Synthetic Data Augmented Training. | Chen He, Rebecca Chen, Patrick Goertz |
| 2025 | Scan Chain Diagnosis in Advanced Process Nodes: The Art of Balancing Resolution, Repairability, and Cost. | Sandeep Kumar Goel, Ankita Patidar, Yue Tian, Frank Lee |
| 2025 | Leveraging UCIe Interface for Silicon Health & Reliabiilty of Chiplets in a 3D Stack. | Sandeep Kumar Goel, Ankita Patidar, Stanley John, Frank Lee, Min-Jer Wang, Daniel F. J. Yang, Yervant Zorian, Manish Arora, Firooz Massoudi, Shaan Awasthi, Stelios Balalis, Velmurugan Pathervellaichamy, Bharath Shankaranarayanan, Narasimhalu Raju, Gurgen Harutyunyan, Grigor Tshagharyan, Vahagn Hovakimyan, Arman Karagyozyan, Alvina Manucharyan |
| 2025 | Test Pattern Aware Streaming Fabric-based Scan Test Methodology. | Krishna Prasad Gnawali, Andrea Costa, Nathalie Etono, Denis Martin, Bala Tarun Nelapatla, Amit Purohit |
| 2025 | A Novel Tester-Based Approach for Functional Testing of Hardware Timers. | Nicola Di Gruttola Giardino |
| 2025 | An SMT-Based Method for Identifying State-Holding Elements in Extracted Netlists. | Aric Fowler, Carl Sechen, Yiorgos Makris |
| 2025 | FSWGEN: a Device-tree Specification driven System-Level Test workload generator. | Gabriele Filipponi |
| 2025 | Power Side-Channel Vulnerabilities of a RISC-V Cryptography Accelerator Integrated into CVA6 via Core-V eXtension Interface (CV-X-IF). | Behnam Farnaghinejad, Davide Bellizia, Alessandra Dolmeta, Guido Masera, Antonio Porsia, Annachiara Ruospo, Stefano Di Carlo, Alessandro Savino, Ernesto Snchez |
| 2025 | Scan Strategies for High Quality Latch Array Testing. | Bin Du, Nehal Patel, Yerong Chen, Jeremy Chin, Katherine Tian |
| 2025 | LLM-Aided In-Field Workload Generation for Detecting Silent Data Corruptions at Scale. | Peter Domanski, Deepesh Sahoo, Eduardo Ortega, Farshad Firouzi, Krishnendu Chakrabarty |
| 2025 | Efficient Delay Fault Characterization of Resistive Open Defects in Standard Cells Using Resistive Fault Dominance. | Gowsika Dharmaraj, Abhijit Chatterjee, Adit D. Singh, Arani Sinha |
| 2025 | Ultra-Pure High-Resolution Waveform Generation Using Low-Cost Data Converters with Dithering. | Emmanuel Nti Darko, Saeid Karimpour, Ekaniyere Oko-Odion, Godfred Bonsu, Degang Chen |
| 2025 | Hybrid Static Learning for ATPG. | Jonathon E. Colburn, Peter Wohl, John A. Waicukauski, Yasunari Kanzawa |
| 2025 | Small Delay Defect Diagnosis via Timing-Aware Fault Simulation with Variant Delay Insertion. | Cheng-En Chung, Jun-Han Jian, Kuen-Jong Lee, Nan-Hsin Tseng, Hsin-Wei Hung, Hao-Yu Yang, Dong-Yi Chen |
| 2025 | Chiplet Interconnect Test and Repair. | Po-Yao Chuang, Cheng-Wen Wu, Erik Jan Marinissen |
| 2025 | Chiplets' Die-to-Die Interconnect Repair Language (IRL). | Po-Yao Chuang, Erik Jan Marinissen |
| 2025 | Test and Calibration Methods for Process Variation of ReRAM-based Spiking Neural Networks. | Po-Sheng Chiu, Chih-Yu Hsu, Chih-Tsun Huang, Jing-Jia Liou |
| 2025 | Embedded Trace: A Key Enabler for Silicon Lifecycle Management. | Vivek Chickermane, Marcel Zak, Mat O'Donnell |
| 2025 | Embedded Trace: A Key Enabler for Silicon Lifecycle Management. | Vivek Chickermane, Marcel Zak, Mat O'Donnell |
| 2025 | Using Distinguishing Bits to Improve Chain Diagnosis Coverage for Silicon Defects. | Wu-Tung Cheng, Manish Sharma, Artur Stelmach, Jakub Janicki, Preston McWithey, Gaurav Veda, Szczepan Urban, Jayant D'Souza |
51–75 of 4,920← PreviousNext →
Comparable venues
Other A*/A conferences filed under the same field of research.
- ADATEDesign, Automation and Test in Europe Conference
- A*DACDesign Automation Conf
- ASCInternational Conference for High Performance Computing, Networking, Storage and Analysis (was Supercomputing Conference)
- AICCADIEEE/ACM International Conference on Computer-Aided Design
- A*ISCAACM International Symposium on Computer Architecture
- A*MICROInternational Symposium on Microarchitecture
- AISLPEDIEEE/ACM International Symposium on Low Power Electronics and Design
- AICSACM International Conference on Supercomputing