IEEE International Test Conference
ITC
A
CORE rank
CORE rank (raw)
A
Fields of research
Computer Systems Engineering
Papers indexed
4,920
1981–2025
Papers per year
1981207 peak2025
Most published authors
ITC papers
4,920 records sourced from DBLP. Search titles, filter by year, sort by recency.
| Year | Title | Authors |
|---|---|---|
| 2022 | 4.5 Gsps MIPI D-PHY Receiver Circuit for Automatic Test Equipment. | Seongkwan Lee, Cheolmin Park, Minho Kang, Jun Yeon Won, HyungSun Ryu, Jaemoo Choi, Byunghyun Yim |
| 2022 | IEEE P1687.1: Extending the Network Boundaries for Test. | Michael Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo |
| 2022 | Diagnosing Double Faulty Chains through Failing Bit Separation. | Cheng-Sian Kuo, Bing-Han Hsieh, James Chien-Mo Li, Chris Nigh, Gaurav Bhargava, Mason Chern |
| 2022 | RIBoNN: Designing Robust In-Memory Binary Neural Network Accelerators. | Shamik Kundu, Akul Malhotra, Arnab Raha, Sumeet Kumar Gupta, Kanad Basu |
| 2022 | Using Custom Fault Models to Improve Understanding of Silicon Failures. | Subhadip Kundu, Gaurav Bhargava, Lesly Endrinal, Lavakumar Ranganathan |
| 2022 | A Path Selection Flow for Functional Path Ring Oscillators using Physical Design Data. | Tobias Kilian, Markus Hanel, Daniel Tille, Martin Huch, Ulf Schlichtmann |
| 2022 | RTL-FSMx: Fast and Accurate Finite State Machine Extraction at the RTL for Security Applications. | Rasheed Kibria, M. Sazadur Rahman, Farimah Farahmandi, Mark Tehranipoor |
| 2022 | Test Generation for an Iterative Design Flow with RTL Changes. | Jerin Joe, Nilanjan Mukherjee, Irith Pomeranz, Janusz Rajski |
| 2022 | Fault Diagnosis for Resistive Random-Access Memory and Monolithic Inter-tier Vias in Monolithic 3D Integration. | Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty |
| 2022 | Runtime Fault Diagnostics for GPU Tensor Cores. | Saurabh Hukerikar, Nirmal R. Saxena |
| 2022 | Neural Fault Analysis for SAT-based ATPG. | Junhua Huang, Hui-Ling Zhen, Naixing Wang, Hui Mao, Mingxuan Yuan, Yu Huang |
| 2022 | Existence of Single-Event Double-Node Upsets (SEDU) in Radiation-Hardened Latches for Sub-65nm CMOS Technologies. | Sam M.-H. Hsiao, Lowry P.-T. Wang, Aaron C.-W. Liang, Charles H.-P. Wen |
| 2022 | Fault Modeling and Testing of Memristor-Based Spiking Neural Networks. | Kuan-Wei Hou, Hsueh-Hung Cheng, Chi Tung, Cheng-Wen Wu, Juin-Ming Lu |
| 2022 | Defect-Directed Stress Testing Based on Inline Inspection Results. | Chen He, Paul Grosch, Onder Anilturk, Joyce Witowski, Carl Ford, Rahul Kalyan, John C. Robinson, David W. Price, Jay Rathert, Barry Saville, Dave Lee |
| 2022 | Challenges for High Volume Testing of Embedded IO Interfaces in Disaggregated Microprocessor Products. | Esteban Garita-Rodrguez, Renato Rimolo-Donadio, Rafael Zamora-Salazar |
| 2022 | PPA Optimization of Test Points in Automotive Designs. | Brian Foutz, Sarthak Singhal, Prateek Kumar Rai, Krishna Chakravadhanula, Vivek Chickermane, Bharath Nandakumar, Sameer Chillarige, Christos Papameletis, Satish Ravichandran |
| 2022 | In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip. | Gabriele Filipponi, Giusy Iaria, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre |
| 2022 | Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing. | Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen |
| 2022 | Accurate Failure Rate Prediction Based on Gaussian Process Using WAT Data. | Makoto Eiki, Tomoki Nakamura, Masuo Kajiyama, Michiko Inoue, Michihiro Shintani |
| 2022 | A Comprehensive Learning-Based Flow for Cell-Aware Model Generation. | P. D'Hondt, Aymen Ladhar, Patrick Girard, Arnaud Virazel |
| 2022 | GreyConE: Greybox Fuzzing + Concolic Execution Guided Test Generation for High Level Designs. | Mukta Debnath, Animesh Basak Chowdhury, Debasri Saha, Susmita Sur-Kolay |
| 2022 | ADWIL: A Zero-Overhead Analog Device Watermarking Using Inherent IP Features. | Upoma Das, Md Rafid Muttaki, Mark Tehranipoor, Farimah Farahmandi |
| 2022 | A Multi-level Approach to Evaluate the Impact of GPU Permanent Faults on CNN's Reliability. | Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Fernando Fernandes dos Santos, Matteo Sonza Reorda, Paolo Rech |
| 2022 | TAMED: Transitional Approaches for LFI Resilient State Machine Encoding. | Muhtadi Choudhury, Minyan Gao, Shahin Tajik, Domenic Forte |
| 2022 | Scan-Based Test Chip Design with XOR-based C-testable Functional Blocks. | Yan-Fu Chen, Duo-Yao Kang, Kuen-Jong Lee |
251–275 of 4,920← PreviousNext →
Comparable venues
Other A*/A conferences filed under the same field of research.
- ADATEDesign, Automation and Test in Europe Conference
- A*DACDesign Automation Conf
- ASCInternational Conference for High Performance Computing, Networking, Storage and Analysis (was Supercomputing Conference)
- AICCADIEEE/ACM International Conference on Computer-Aided Design
- A*ISCAACM International Symposium on Computer Architecture
- A*MICROInternational Symposium on Microarchitecture
- AISLPEDIEEE/ACM International Symposium on Low Power Electronics and Design
- AICSACM International Conference on Supercomputing