IEEE International Test Conference
ITC
A
CORE rank
CORE rank (raw)
A
Fields of research
Computer Systems Engineering
Papers indexed
4,920
1981–2025
Papers per year
1981207 peak2025
Most published authors
ITC papers
4,920 records sourced from DBLP. Search titles, filter by year, sort by recency.
| Year | Title | Authors |
|---|---|---|
| 2022 | Improving Test Quality of Memory Chips by a Decision Tree-Based Screening Method. | Ya-Chi Cheng, Pai-Yu Tan, Cheng-Wen Wu, Ming-Der Shieh, Chien-Hui Chuang, Gordon Liao |
| 2022 | Wafer Defect Pattern Classification with Explainable-Decision Tree Technique. | Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Sying-Jyan Wang, Andrew Yi-Ann Huang, Chen-Shiun Lee, Leon Li-Yang Chen, Peter Yi-Yu Liao, Nova Cheng-Yen Tsai |
| 2022 | AI-Driven Assurance of Hardware IP against Reverse Engineering Attacks. | Prabuddha Chakraborty, Swarup Bhunia |
| 2022 | Zero Trust Approach to IC Manufacturing and Testing. | Brian Buras, Constantinos Xanthopoulos, Ken Butler, Jason Kim |
| 2022 | New R&R Methodology in Semiconductor Manufacturing Electrical Testing. | Lorella Bordogna, Fabio Brembilla, Alberto Pagani, Marco Spinetta |
| 2022 | Application of Sampling in Industrial Analog Defect Simulation. | Mayukh Bhattacharya, Beatrice Solignac, Michael Drr |
| 2022 | Low Cost High Accuracy Stimulus Generator for On-chip Spectral Testing. | Kushagra Bhatheja, Shravan K. Chaganti, Degang Chen, Xiankun Robert Jin, Chris C. Dao, Juxiang Ren, Abhishek Kumar, Daniel Correa, Mark Lehmann, Thomas Rodriguez, Eric Kingham, Joel R. Knight, Allan Dobbin, Scott W. Herrin, Doug Garrity |
| 2022 | Unsupervised Learning-based Early Anomaly Detection in AMS Circuits of Automotive SoCs. | Ayush Arunachalam, Athulya Kizhakkayil, Shamik Kundu, Arnab Raha, Suvadeep Banerjee, Robert Jin, Fei Su, Kanad Basu |
| 2022 | A Novel Protection Technique for Embedded Memories with Optimized PPA. | Costas Argyrides, Vilas Sridharan, Hayk Danoyan, Gurgen Harutyunyan, Yervant Zorian |
| 2022 | An innovative Strategy to Quickly Grade Functional Test Programs. | Francesco Angione, Paolo Bernardi, Andrea Calabrese, Lorenzo Cardone, A. Niccoletti, Davide Piumatti, Stefano Quer, Davide Appello, Vincenzo Tancorre, Roberto Ugioli |
| 2022 | Compact Functional Test Generation for Memristive Deep Learning Implementations using Approximate Gradient Ranking. | Soyed Tuhin Ahmed, Mehdi B. Tahoori |
| 2022 | Comprehensive Power-Aware ATPG Methodology for Complex Low-Power Designs. | Khader S. Abdel-Hafez, Michael Dsouza, Likith Kumar Manchukonda, Elddie Tsai, Karthikeyan Natarajan, Ting-Pu Tai, Wenhao Hsueh, Smith Lai |
| 2022 | RCANet: Root Cause Analysis via Latent Variable Interaction Modeling for Yield Improvement. | Xiaopeng Zhang, Shoubo Hu, Zhitang Chen, Shengyu Zhu, Evangeline F. Y. Young, Pengyun Li, Cheng Chen, Yu Huang, Jianye Hao |
| 2022 | Next Generation Design For Testability, Debug and Reliability Using Formal Techniques. | Sebastian Huhn, Rolf Drechsler |
| 2021 | MINiature Interactive Offset Networks (MINIONs) for Wafer Map Classification. | Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan |
| 2021 | ACE-Pro: Reduction of Functional Errors with ACE Propagation Graph. | Dun-An Yang, Yu-Teng Chang, Ting-Shuo Hsu, Jing-Jia Liou, Harry H. Chen |
| 2021 | Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions. | Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui |
| 2021 | Improving Volume Diagnosis and Debug with Test Failure Clustering and Reorganization. | Mu-Ting Wu, Cheng-Sian Kuo, James Chien-Mo Li, Chris Nigh, Gaurav Bhargava |
| 2021 | SymbA: Symbolic Execution at C-level for Hardware Trojan Activation. | Arash Vafaei, Nick Hooten, Mark Tehranipoor, Farimah Farahmandi |
| 2021 | Adaptive High Voltage Stress Methodology to Enable Automotive Quality on FinFET Technologies. | Stephen Traynor, Chen He, Y. Y. Yu, Ken Klein |
| 2021 | A BIST-based Dynamic Obfuscation Scheme for Resilience against Removal and Oracle-guided Attacks | Jonti Talukdar, Siyuan Chen, Amitabh Das, Sohrab Aftabjahani, Peilin Song, Krishnendu Chakrabarty |
| 2021 | Seamless Physical Implementation of ASIC Hierarchical Integrated Scan Architecture. | Bambang Suparjo, Jugantor Chetia, Ankit R. Shah |
| 2021 | Low Power Shift and Capture through ATPG-Configured Embedded Enable Capture Bits. | Yi Sun, Hui Jiang, Lakshmi Ramakrishnan, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, R. Iris Bahar |
| 2021 | An automated formal-based approach for reducing undetected faults in ISO 26262 hardware compliant designs. | Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer |
| 2021 | Wafer-level Variation Modeling for Multi-site RF IC Testing via Hierarchical Gaussian Process. | Michihiro Shintani, Riaz-ul-haque Mian, Michiko Inoue, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki |
276–300 of 4,920← PreviousNext →
Comparable venues
Other A*/A conferences filed under the same field of research.
- ADATEDesign, Automation and Test in Europe Conference
- A*DACDesign Automation Conf
- ASCInternational Conference for High Performance Computing, Networking, Storage and Analysis (was Supercomputing Conference)
- AICCADIEEE/ACM International Conference on Computer-Aided Design
- A*ISCAACM International Symposium on Computer Architecture
- A*MICROInternational Symposium on Microarchitecture
- AISLPEDIEEE/ACM International Symposium on Low Power Electronics and Design
- AICSACM International Conference on Supercomputing