| 2021 | Open-short Normalization Method for a Quick Defect Identification in Branched Traces with High-resolution Time-domain Reflectometry. | Yang Shang, Makoto Shinohara, Eiji Kato, Masaichi Hashimoto, Joanna Kiljan |
| 2021 | Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies. | Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jianglin Wei, Takayuki Nakatani, Yujie Zhao, Shogo Katayama, Shuhei Yamamoto, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi |
| 2021 | Impeccable Circuits III. | Shahram Rasoolzadeh, Aein Rezaei Shahmirzadi, Amir Moradi |
| 2021 | LL-ATPG: Logic-Locking Aware Test Using Valet Keys in an Untrusted Environment. | M. Sazadur Rahman, Henian Li, Rui Guo, Fahim Rahman, Farimah Farahmandi, Mark Tehranipoor |
| 2021 | Exploiting Application Tolerance for Functional Safety. | V. Prasanth, Rubin A. Parekhji, Bharadwaj Amrutur |
| 2021 | Security EDA Extension through P1687.1 and 1687 Callbacks. | Michele Portolan, Vincent Reynaud, Paolo Maistri, Rgis Leveugle, Giorgio Di Natale |
| 2021 | AAA: Automated, On-ATE AI Debug of Scan Chain Failures. | Chris Nigh, Gaurav Bhargava, Ronald D. Blanton |
| 2021 | Is your secure test infrastructure secure enough? : Attacks based on delay test patterns using transient behavior analysis. | Sergej Meschkov, Dennis R. E. Gnad, Jonas Krautter, Mehdi B. Tahoori |
| 2021 | Relevant Signals and Devices for Failure Analysis of Analog and Mixed-signal Circuits. | Tommaso Melis, Emmanuel Simeu, Luc Saury, Etienne Auvray |
| 2021 | Automatic Verification of Mixed-Signal ATE Test Programs using Device Variation. | Franziska Mayer, Christian Schott, Enrico Billich, Saeid Yazdani, Ulrich Heinkel, Georg Daler, Bernhard Ruf, Ricardo Pannuzzo, Wolfgang Dickenscheid |
| 2021 | Analyzing and Mitigating Sensing Failures in Spintronic-based Computing in Memory. | Mahta Mayahinia, Christopher Mnch, Mehdi B. Tahoori |
| 2021 | Testability-Enhancing Resynthesis of Reconfigurable Scan Networks. | Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich |
| 2021 | Triplet Convolutional Networks for Classifying Mixed-Type WBM Patterns with Noisy Labels. | Chenwei Liu, Qiaoyue Tang |
| 2021 | Smart Sampling for Efficient System Level Test: A Robust Machine Learning Approach. | Chenwei Liu, Jie Ou |
| 2021 | Adaptive Methods for Machine Learning-Based Testing of Integrated Circuits and Boards. | Mengyun Liu, Krishnendu Chakrabarty |
| 2021 | Testability-Aware Low Power Controller Design with Evolutionary Learning. | Min Li, Zhengyuan Shi, Zezhong Wang, Weiwei Zhang, Yu Huang, Qiang Xu |
| 2021 | WGrid: Wafermap Grid Pattern Recognition with Machine Learning Techniques. | Peter Yi-Yu Liao, Katherine Shu-Min Li, Leon Li-Yang Chen, Sying-Jyan Wang, Andrew Yi-Ann Huang, Ken Chau-Cheung Cheng, Nova Cheng-Yen Tsai, Leon Chou |
| 2021 | A Fast and Low Cost Embedded Test Solution for CMOS Image Sensors. | Julia Lefevre, Philippe Debaud, Patrick Girard, Arnaud Virazel |
| 2021 | 3.5Gsps MIPI C-PHY Receiver Circuit for Automatic Test Equipment. | Seongkwan Lee, Minho Kang, Cheolmin Park, HyungSun Ryu, Jaemoo Choi, Byunghyun Yim |
| 2021 | Accessing general IEEE Std. 1687 networks via functional ports. | Erik Larsson, Prathamesh Murali, Ziling Zhang |
| 2021 | Minimum Operating Voltage Prediction in Production Test Using Accumulative Learning. | Yen-Ting Kuo, Wei-Chen Lin, Chun Chen, Chao-Ho Hsieh, James Chien-Mo Li, Eric Jia-Wei Fang, Sung S.-Y. Hsueh |
| 2021 | Machine Learning for Circuit Aging Estimation under Workload Dependency. | Florian Klemme, Hussam Amrouch |
| 2021 | A Scalable Design Flow for Performance Monitors Using Functional Path Ring Oscillators. | Tobias Kilian, Heiko Ahrens, Daniel Tille, Martin Huch, Ulf Schlichtmann |
| 2021 | Summing Node and False Summing Node Methods: Accurate Operational Amplifier AC Characteristics Testing without Audio Analyzer. | Daisuke Iimori, Takayuki Nakatani, Shogo Katayama, Gaku Ogihara, Akemi Hatta, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jianglin Wei, Yujie Zhao, Minh Tri Tran, Kazumi Hatayama, Haruo Kobayashi |
| 2021 | Semi-supervised Wafer Map Pattern Recognition using Domain-Specific Data Augmentation and Contrastive Learning. | Hanbin Hu, Chen He, Peng Li |