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IEEE International Test Conference

ITC

A

CORE rank

CORE rank (raw)

A

Fields of research

Computer Systems Engineering

Papers indexed

4,920

1981–2025

Papers per year

1981207 peak2025

ITC papers

4,920 records sourced from DBLP. Search titles, filter by year, sort by recency.

YearTitleAuthors
2021Adaptive NN-based Root Cause Analysis in Volume Diagnosis for Yield Improvement.Xin Huang, Min Qin, Ruosheng Xu, Cheng Chen, Shangling Jui, Zhihao Ding, Pengyun Li, Yu Huang
2021Efficient Functional In-Field Self-Test for Deep Learning Accelerators.Yi He, Takumi Uezono, Yanjing Li
2021Brain-Inspired Computing for Wafer Map Defect Pattern Classification.Paul R. Genssler, Hussam Amrouch
2021Systematic Hardware Error Identification and Calibration for Massive Multisite Testing.Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2021On Reduction of Deterministic Test Pattern Sets.Stephan Eggersgl, Sylwester Milewski, Janusz Rajski, Jerzy Tyszer
2021Characterizing Corruptibility of Logic Locks using ATPG.Danielle Duvalsaint, R. D. Shawn Blanton
2021Multi-Transition Fault Model (MTFM) ATPG patterns towards achieving 0 DPPB on automotive designs.Jorge Corso, Saidapet Ramesh, Kumar Abishek, Ley Teng Tan, Chik Hooi Lew
2021Semi-Supervised Framework for Wafer Defect Pattern Recognition with Enhanced Labeling.Leon Li-Yang Chen, Katherine Shu-Min Li, Xu-Hao Jiang, Sying-Jyan Wang, Andrew Yi-Ann Huang, Jwu E. Chen, Hsing-Chung Liang, Chun-Lung Hsu
2021The Security Enhancement Techniques of the Double-layer PUF Against the ANN-based Modeling Attack.Yongliang Chen, Xiaole Cui, Wenqiang Ye, Xiaoxin Cui
2021On-line Functional Testing of Memristor-mapped Deep Neural Networks using Backdoored Checksums.Ching-Yuan Chen, Krishnendu Chakrabarty
2021Efficient Fault-Criticality Analysis for AI Accelerators using a Neural TwinArjun Chaudhuri, Ching-Yuan Chen, Jonti Talukdar, Siddarth Madala, Abhishek Kumar Dubey, Krishnendu Chakrabarty
2021Compositional Fault Propagation Analysis in Embedded Systems using Abstract Interpretation.Christian Bartsch, Stephan Wilhelm, Daniel Kstner, Dominik Stoffel, Wolfgang Kunz
2021Background Receiver IQ Imbalance Correction for in-Field and Post-Production Testing and Calibration.Muslum Emir Avci, Sule Ozev
2021Hierarchical Failure Modeling and Machine Learning Assisted Correction of Electro-Mechanical Subsystem Failures in Autonomous Vehicles.Chandramouli N. Amarnath, Md Imran Momtaz, Abhijit Chatterjee
2021Study on High-Accuracy and Low-Cost Recycled FPGA Detection.Foisal Ahmed, Michihiro Shintani, Michiko Inoue
2020Learning A Wafer Feature With One Training Sample.Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan, Nik Sumikawa
2020FAT: Training Neural Networks for Reliable Inference Under Hardware Faults.Ussama Zahid, Giulio Gambardella, Nicholas J. Fraser, Michaela Blott, Kees A. Vissers
2020MBIST Supported Multi Step Trim for Reliable eMRAM Sensing.Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Lori Schramm, Cyrille Dray, El Mehdi Boujamaa, Khushal Gelda
2020Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs.Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui
2020qATG: Automatic Test Generation for Quantum Circuits.Chen-Hung Wu, Cheng-Yun Hsieh, Jiun-Yun Li, James Chien-Mo Li
2020Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations.Fong-Jyun Tsai, Chong-Siao Ye, Kuen-Jong Lee, Shi-Xuan Zheng, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Chen Wang, Justyna Zawada
2020Introduction to Quantum Computation Reliability.Mitchell A. Thornton
2020Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs.Stephen Sunter, Michal Wolinski, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Nektar Xama, Jhon Gomez, Georges G. E. Gielen
2020Unleashing the Power of Anomaly Data for Soft Failure Predictive Analytics.Fei Su, Prashant Goteti, Min Zhang
2020SPARTA: A Laser Probing Approach for Trojan Detection.Andrew Stern, Dhwani Mehta, Shahin Tajik, Farimah Farahmandi, Mark Tehranipoor
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