IEEE International Test Conference

ITC

CORE rank

CORE rank (raw)

Fields of research

Computer Systems Engineering

Papers indexed

4,920

1981–2025

Best Computer Systems Engineering conferences

Papers per year

1981207 peak2025

Most published authors

ITC papers

4,920 records sourced from DBLP. Search titles, filter by year, sort by recency.

Year	Title	Authors
2020	Industrial Application of IJTAG Standards to the Test of Big-A/little-d devices.	Hans Martin von Staudt, Mohamed Anas Benhebibi, Jeff Rearick, Michael Laisne
2020	Test Challenges of Intel IA Cores.	Uri Shpiro, Khen Wee, Kun-Han Tsai, Justyna Zawada, Xijiang Lin
2020	Methods for Susceptibility Analysis of Logic Gates in the Presence of Single Event Transients.	Rafael B. Schvittz, Paulo F. Butzen, Leomar S. da Rosa
2020	High Speed Serial Links Risk Assessment in Industrial Post-Silicon Validation Exploiting Machine Learning Techniques.	Cesar A. Snchez-Martnez, Paulo Lpez-Meyer, Esdras Jurez-Hernndez, Aaron Desiga-Orenday, Andrs Viveros-Wacher
2020	Schmitt Trigger-Based Key Provisioning for Locking Analog/RF Integrated Circuits.	Adriana C. Sanabria-Borbon, Nithyashankari Gummidipoondi Jayasankaran, Sir Yee Lee, Edgar Snchez-Sinencio, Jiang Hu, Jeyavijayan (JV) Rajendran
2020	Robust DfT Techniques for Built-in Fault Detection in Operational Amplifiers with High Coverage.	Marampally Saikiran, Mona Ganji, Degang Chen
2020	Avionics Simulation Environment.	Hseyin Sagirkaya, Gkhan Durgun
2020	Machine Intelligence for Efficient Test Pattern Generation.	Soham Roy, Spencer K. Millican, Vishwani D. Agrawal
2020	Automating Design For Yield: Silicon Learning to Predictive Models and Design Optimization.	Srikanth Venkataraman, Pongpachara Limpisathian, Pascal Meinerzhagen, Suriyaprakash Natarajan, Eric Yang
2020	Selecting Close-to-Functional Path Delay Faults for Test Generation.	Irith Pomeranz
2020	Using Volume Cell-aware Diagnosis Results to Improve Physical Failure Analysis Efficiency.	Hanson Peng, Mao-Yuan Hsia, Man-Ting Pang, I.-Y. Chang, Jeff Fan, Huaxing Tang, Manish Sharma, Wu Yang
2020	Unsupervised Root-Cause Analysis for Integrated Systems.	Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu
2020	SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts.	Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Sanya Gupta, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee
2020	Novel Eye Diagram Estimation Technique to Assess Signal Integrity in High-Speed Memory Test.	Youngsu Oh, Dongmin Han, Byeongseon Go, Seungtaek Lee, Woosik Jeong
2020	Improved Chain Diagnosis Methodology for Clock and Control Signal Defect Identification.	Bharath Nandakumar, Sameer Chillarige, Anil Malik, Atul Chabbra, Nicholai L'Esperance, Robert Redburn
2020	Memory repair logic sharing techniques and their impact on yield.	Benoit Nadeau-Dostie, Luc Romain
2020	Concurrent Error Detection in Embedded Digital Control of Nonlinear Autonomous Systems Using Adaptive State Space Checks.	Md Imran Momtaz, Chandramouli N. Amarnath, Abhijit Chatterjee
2020	A Learning-Based Cell-Aware Diagnosis Flow for Industrial Customer Returns.	Safa Mhamdi, Patrick Girard, Arnaud Virazel, Alberto Bosio, Aymen Ladhar
2020	Fast Bring-Up of an AI SoC through IEEE 1687 Integrating Embedded TAPs and IEEE 1500 Interfaces.	Haiying Ma, Ligang Lu, Haitao Qian, Jing Han, Xin Wen, Fanjin Meng, Rahul Singhal, Martin Keim, Yu Huang, Wu Yang
2020	Security Preserving Integration and Resynthesis of Reconfigurable Scan Networks.	Natalia Lylina, Ahmed Atteya, Chih-Hao Wang, Hans-Joachim Wunderlich
2020	Data-driven fault model development for superconducting logic.	Mingye Li, Fangzhou Wang, Sandeep Gupta
2020	X-Tolerant Tunable Compactor for In-System Test.	Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Bartosz Wldarczak
2020	Online Fault Detection in ReRAM-Based Computing Systems by Monitoring Dynamic Power Consumption.	Mengyun Liu, Krishnendu Chakrabarty
2020	Fail Memory Configuration Set for RA Estimation.	Hayoung Lee, Keewon Cho, Sungho Kang, Wooheon Kang, Seungtaek Lee, Woosik Jeong
2020	Modeling Novel Non-JTAG IEEE 1687-Like Architectures.	Mike Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, M. Abdalwahab, Bradford G. Van Treuren, Jeff Rearick

351–375 of 4,920← Previous Next →

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