| 2000 | Application of deterministic logic BIST on industrial circuits. | Gundolf Kiefer, Hans-Joachim Wunderlich, Harald P. E. Vranken, Erik Jan Marinissen |
| 2000 | Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ. | Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Manoj Sachdev, Krishnamurthy Soumyanath, Vivek De |
| 2000 | Programming of flash with ICT rights and responsibilities. | Julia A. Keahey |
| 2000 | A built-in self-repair analyzer (CRESTA) for embedded DRAMs. | Tomoya Kawagoe, Jun Ohtani, Mitsutaka Niiro, Tukasa Ooishi, Mitsuhiro Hamada, Hideto Hidaka |
| 2000 | Test response compaction by an accumulator behaving as a multiple input non-linear feedback shift register. | Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos |
| 2000 | A new paradigm in test for the next millennium. | Jerry Katz, Rochit Rajsuman |
| 2000 | Algorithm level re-computing with shifted operands-a register transfer level concurrent error detection technique. | Ramesh Karri, Kaijie Wu |
| 2000 | Power pin testing: making the test coverage complete. | Frans G. M. de Jong, Ben Kup, Rodger Schuttert |
| 2000 | Challenges of high supply currents during VLSI test. | Gerald H. Johnson |
| 2000 | Streamlining programmable device and system test using IEEE Std 1532. | Neil G. Jacobson |
| 2000 | Static property checking using ATPG vs. BDD techniques. | Chung-Yang Huang, Bwolen Yang, Huan-Chih Tsai, Kwang-Ting Cheng |
| 2000 | Testing and characterization of the one-bit first-order delta-sigma modulator for on-chip analog signal analysis. | Jiun-Lang Huang, Kwang-Ting Cheng |
| 2000 | Microwave test mismatch and power de-embedding. | Peter M. Higgins, Jim Lampos |
| 2000 | A mixed mode BIST scheme based on reseeding of folding counters. | Sybille Hellebrand, Hans-Joachim Wunderlich, Huaguo Liang |
| 2000 | The implementation of IEEE Std 1149.1 boundary scan test strategy within a cellular infrastructure production environment. | Stephen Harrison, Peter Collins, Greg Noeninckx |
| 2000 | A stand-alone integrated test core for time and frequency domain measurements. | Mohamed M. Hafed, Nazmy Abaskharoun, Gordon W. Roberts |
| 2000 | Industrial evaluation of DRAM SIMM tests. | Ad J. van de Goor, A. Paalvast |
| 2000 | Test and on-line debug capabilities of IEEE Std 1149.1 in UltraSPARC-III microprocessor. | Farideh Golshan |
| 2000 | Low power BIST design by hypergraph partitioning: methodology and architectures. | Patrick Girard, Christian Landrault, Los Guiller, Serge Pravossoudovitch |
| 2000 | Test point insertion for compact test sets. | M. J. Geuzebroek, J. Th. van der Linden, Ad J. van de Goor |
| 2000 | Concurrent error detection in block ciphers | Santiago Fernndez-Gomez, Juan J. Rodrguez-Andina, Enrique Mandado |
| 2000 | Optical interferometric probing of advanced microprocessors. | Travis M. Eiles, Keneth R. Wilsher, William K. Lo, G. Xiao |
| 2000 | Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D. | Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer |
| 2000 | An approach to testing 200 ps echo clock to output timing on the double data rate synchronous memory. | Dieu Van Dinh, Virginia Rabitoy |
| 2000 | Universal test generation using fault tuples. | Rao Desineni, Kumar N. Dwarakanath, Ronald D. Blanton |