| 2000 | Case-based reasoning: diagnosis of faults in complex systems through reuse of experience. | L. Derere |
| 2000 | Analysis of failure sources in surface-micromachined MEMS. | Nilmoni Deb, Ronald D. Blanton |
| 2000 | Reducing test data volume using external/LBIST hybrid test patterns. | Debaleena Das, Nur A. Touba |
| 2000 | Variance reduction using wafer patterns in I_ddQ data. | W. Robert Daasch, James McNames, Daniel Bockelman, Kevin Cota |
| 2000 | Hardware for production test of RFID interface embedded into chips for smart cards and labels used in contactless applications. | Cristo da Costa |
| 2000 | Test structure verification of logical BIST: problems and solutions. | Michael Cogswell, Don Pearl, James Sage, Alan Troidl |
| 2000 | Non-intrusive BIST for systems-on-a-chip. | Silvia Chiusano, Paolo Prinetto, Hans-Joachim Wunderlich |
| 2000 | Optimal INL/DNL testing of A/D converters using a linear model. | Sasikumar Cherubal, Abhijit Chatterjee |
| 2000 | Digital serial communication device testing and its implications on automatic test equipment architecture. | Yongming Cai, T. P. Warwick, Sunil G. Rane, E. Masserrat |
| 2000 | Design and implementation of a parallel automatic test pattern generation algorithm with low test vector count. | Robert Butler, Brion L. Keller, Sarala Paliwal, Richard Schoonover, Joseph Swenton |
| 2000 | Reducing device yield fallout at wafer level test with electrohydrodynamic (EHD) cleaning. | Jerry J. Broz, James C. Andersen, Reynaldo M. Rincon |
| 2000 | Digital signature proposal for mixed-signal circuits. | Anna Maria Brosa, Joan Figueras |
| 2000 | BISTing data paths at behavioral level. | David Berthelot, Marie-Lise Flottes, Bruno Rouzeyre |
| 2000 | A software development kit for dependable applications in embedded systems. | Alfredo Benso, Silvia Chiusano, Paolo Prinetto |
| 2000 | A programmable BIST architecture for clusters of multiple-port SRAMs. | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni |
| 2000 | HD | Alfredo Benso, Silvia Chiusano, Stefano Di Carlo, Paolo Prinetto, Fabio Ricciato, Maurizio Spadari, Yervant Zorian |
| 2000 | Bridging the gap between embedded test and ATE. | Martin Bell, Givargis Danialy, Michael C. Howells, Stephen Pateras |
| 2000 | Deterministic partitioning techniques for fault diagnosis in scan-based BIST. | Ismet Bayraktaroglu, Alex Orailoglu |
| 2000 | Fault distinguishing pattern generation. | Thomas Bartenstein |
| 2000 | End-to-end testing for boards and systems using boundary scan. | Robert W. Barr, Chen-Huan Chiang, Edward L. Wallace |
| 2000 | DIST-based detection and diagnosis of multiple faults in FPGAs. | Miron Abramovici, Charles E. Stroud |
| 2000 | A framework to evaluate test tradeoffs in embedded core based systems-case study on TI's TMS320C27xx. | Jais Abraham, Narayan Prasad, Srinivasa Chakravarthy B. S., Ameet Bagwe, Rubin A. Parekhji |
| 2000 | Test generation for path-delay faults in one-dimensional iterative logic arrays. | Nabil M. Abdulrazzaq, Sandeep K. Gupta |
| 1999 | Towards a standard for embedded core test: an example. | Yervant Zorian, Erik Jan Marinissen, Rohit Kapur, Tony Taylor, Lee Whetsel |
| 1999 | Using LSSD to test modules at the board level. | Thomas A. Ziaja |