| 1999 | Finite state machine synthesis with concurrent error detection. | Chaohuang Zeng, Nirmal R. Saxena, Edward J. McCluskey |
| 1999 | SymSim: symbolic fault simulation of data-flow data-path designs at the Register-Transfer level. | Sitaran Yadavalli, Sudhakar M. Reddy |
| 1999 | Interconnect delay fault testing with IEEE 1149.1. | Yuejian Wu, Paul Soong |
| 1999 | "DFY and DFR are more important than DFT". | David M. Wu |
| 1999 | DFT is all I can afford, who cares about Design for Yield or Design for Reliability! | David M. Wu |
| 1999 | The test and debug features of the AMD-K7 microprocessor. | Timothy J. Wood |
| 1999 | Position Statement: Testing in a VLSI Design Course. | Wayne H. Wolf |
| 1999 | Using Verilog simulation libraries for ATPG. | Peter Wohl, John A. Waicukauski |
| 1999 | Output in still, input in still. | Peter Wohl |
| 1999 | Practical optical waveform probing of flip-chip CMOS devices. | Keneth R. Wilsher, William K. Lo |
| 1999 | PC manufacturing test in a high volume environment. | David Williams |
| 1999 | Addressable test ports an approach to testing embedded cores. | Lee Whetsel |
| 1999 | At-speed structural test. | Burnell G. West |
| 1999 | Accuracy requirements in at-speed functional test. | Burnell G. West |
| 1999 | An accurate simulation model of the ATE test environment for very high speed devices. | Thomas P. Warwick, Jung Cho, Yi Cai, Bill Ortner |
| 1999 | Tradeoff analysis for producing high quality tests for custom circuits in PowerPC microprocessors. | Li-C. Wang, Magdy S. Abadir |
| 1999 | Design for Yield and Reliability is MORE Important Than DFT. | D. M. H. Walker |
| 1999 | Design for test and time to market-friends or foes. | Jon Turino |
| 1999 | STAR-ATPG: a high speed test pattern generator for large scan designs. | Kuo-Hui Tsai, Tompson, Janusz Rajski, Malgorzata Marek-Sadowska |
| 1999 | Accurate path delay fault coverage is feasible. | Spyros Tragoudas |
| 1999 | An histogram based procedure for current testing of active defects. | Claude Thibeault |
| 1999 | Robust testability of primitive faults using test points. | Ramesh C. Tekumalla, Premachandran R. Menon |
| 1999 | Automatic Functional Test Generation - A Reality. | Raghuram S. Tapuri |
| 1999 | A new approach to RF impedance test. | Dino Ren Tao |
| 1999 | LT-RTPG: a new test-per-scan BIST TPG for low heat dissipation. | Seongmoon Wang, Sandeep K. Gupta |