| 1999 | Testing a system-on-a-chip with embedded microprocessor. | Rochit Rajsuman |
| 1999 | The HASS development process. | David Rahe |
| 1999 | Characterization and optimization of the production probing process. | Minh Quach, Rich Samuelson, David Shaw |
| 1999 | DFT advances in the Motorola's MPC7400, a PowerPC G4 microprocessor. | Carol Pyron, Mike Alexander, James Golab, George Joos, Bruce Long, Robert F. Molyneaux, Rajesh Raina, Nandu Tendolkar |
| 1999 | Auto-calibrating analog timer for on-chip testing. | Benoit Provost, Edgar Snchez-Sinencio |
| 1999 | Applying lessons learned from TDDB testing. | E. James Prendergast |
| 1999 | On achieving complete coverage of delay faults in full scan circuits using locally available lines. | Irith Pomeranz, Sudhakar M. Reddy |
| 1999 | An efficient on-line-test and back-up scheme for embedded processors. | Matthias Pflanz, Heinrich Theodor Vierhaus, F. Pompsch |
| 1999 | High Time for Higher Level BIST. | Christos A. Papachristou |
| 1999 | Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. | Phil Nigh, David P. Vallett, Atul Patel, Jason Wright, Franco Motika, Donato O. Forlenza, Ray Kurtulik, Wendy Chong |
| 1999 | Switch-level delay test. | Suriyaprakash Natarajan, Sandeep K. Gupta, Melvin A. Breuer |
| 1999 | Low overhead test point insertion for scan-based BIST. | Michinobu Nakao, Seiji Kobayashi, Kazumi Hatayama, Kazuhiko Iijima, Seiji Terada |
| 1999 | Built-in self-test for GHz embedded SRAMs using flexible pattern generator and new repair algorithm. | Shigeru Nakahara, Keiichi Higeta, Masaki Kohno, Toshiaki Kawamura, Keizo Kakitani |
| 1999 | An embedded technique for at-speed interconnect testing. | Benoit Nadeau-Dostie, Jean-Francois Cote, Harry Hulvershorn, Stephen Pateras |
| 1999 | Synthesis of pattern generators based on cellular automata with phase shifters. | Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski |
| 1999 | DFT, DFY, and DFR; Which One(s) Do You Worry About? | James A. Monzel |
| 1999 | I | Anthony C. Miller |
| 1999 | A design diversity metric and reliability analysis for redundant systems. | Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey |
| 1999 | Self-checking scheme for very fast clocks' skew correction. | Cecilia Metra, Flavio Giovanelli, Mani Soma, Bruno Ricc |
| 1999 | Current ratios: a self-scaling technique for production I_DDQ testing. | Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman |
| 1999 | Testing high speed high accuracy analog to digital converters embedded in systems on a chip. | Solomon Max |
| 1999 | Automatic timing margin failure location analysis by CycleStretch method. | Mitsuo Matsumoto, Yoshiharu Ikeda |
| 1999 | The evolution of a system test process [for Motorola GSM products]. | Simon Martin, Robert Bleck, Chryssa Dislis, Des Farren |
| 1999 | Delay testing of SOI circuits: Challenges with the history effect. | Eric W. MacDonald, Nur A. Touba |
| 1999 | Is there a STIL for mixed signal testing? | Marc Loranger |