| 1999 | A new method for jitter decomposition through its distribution tail fitting. | Mike Peng Li, Jan B. Wilstrup, Ross Jessen, Dennis Petrich |
| 1999 | Design for (physical) debug for silicon microsurgery and probing of flip-chip packaged integrated circuits. | Richard H. Livengood, Donna Medeiros |
| 1999 | The integration of boundary-scan test methods to a mixed-signal environment. | Adam W. Ley |
| 1999 | Critical path identification and delay tests of dynamic circuits. | Kyung Tek Lee, Jacob A. Abraham |
| 1999 | Eliminating the Ouija board: automatic thresholds and probabilistic I_DDQ diagnosis. | David B. Lavo, Tracy Larrabee, Jonathon E. Colburn |
| 1999 | Exploiting defect clustering to screen bare die for infant mortality failures: an experimental study. | David R. Lakin II, Adit D. Singh |
| 1999 | Relating linearity test results to design flaws of pipelined analog to digital converters. | Turker Kuyel, Haydar Bilhan |
| 1999 | Linearity testing issues of analog to digital converters. | Turker Kuyel |
| 1999 | Transient current testing of 0.25 μm CMOS devices. | Bram Kruseman, Peter Janssen, Victor Zieren |
| 1999 | Benchmarking DAT with the ITC'99 ATPG Benchmarks. | Mario Konijnenburg, Hans van der Linden, Jeroen Geuzebroek |
| 1999 | Testability of the Philips 80C51 micro-controller. | M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor |
| 1999 | Flexible ATE module with reconfigurable circuit and its application [to CMOS imager test]. | Tagashi Kitagaki |
| 1999 | Towards reducing "functional only" fails for the UltraSPARC microprocessors. | Anjali Kinra |
| 1999 | A probe scheduling algorithm for MCM substrates. | Bruce C. Kim, Pinshan Jiang, Se Hyun Park |
| 1999 | Delay fault testing of IP-based designs via symbolic path modeling. | HyungWon Kim, John P. Hayes |
| 1999 | A high-level BIST synthesis method based on a region-wise heuristic for an integer linear programming. | Han Bin Kim, Dong Sam Ha |
| 1999 | Speed-up of high accuracy analog test stimulus optimization. | Abdelhakim Khouas, Anne Derieux |
| 1999 | Using STIL to describe embedded core test requirements. | Brion L. Keller |
| 1999 | Test support processors for enhanced testability of high performance circuits. | David C. Keezer, Q. Zhou |
| 1999 | High level ATPG is important and is on its way! | Rohit Kapur |
| 1999 | Is Analog Fault Simulation a Key to Product Quality? Practical Considerations. | Bozena Kaminska |
| 1999 | Static component interconnection test technology in practice. | Frans G. M. de Jong, Rob Raaijmakers |
| 1999 | SCITT: Back to Basics in Mass Production Testing. | Frans G. M. de Jong |
| 1999 | Is DFT right for you? | Jim Johnson |
| 1999 | Statistical threshold formulation for dynamic I_dd test. | Wanli Jiang, Bapiraju Vinnakota |