| 1998 | Process-tolerant test with energy consumption ratio. | Bapiraju Vinnakota, Wanli Jiang, Dechang Sun |
| 1998 | Designing for scan test of high performance embedded memories. | E. Kofi Vida-Torku, George Joos |
| 1998 | Stimulus generation for built-in self-test of charge-pump phase-locked loops. | Benot R. Veillette, Gordon W. Roberts |
| 1998 | A structured test re-use methodology for core-based system chips. | Prab Varma, Sandeep Bhatia |
| 1998 | System chip test: are we there yet? | Prab Varma |
| 1998 | An almost full-scan BIST solution-higher fault coverage and shorter test application time. | Huan-Chih Tsai, Sudipta Bhawmik, Kwang-Ting Cheng |
| 1998 | Diagnosis method based on ΔIddq probabilistic signatures: experimental results. | Claude Thibeault, Luc Boisvert |
| 1998 | Standard test interface language (STIL), extending the standard. | Tony Taylor |
| 1998 | Embedded self-testing checkers for low-cost arithmetic codes. | Steffen Tarnick, Albrecht P. Stroele |
| 1998 | BIST: required for embedded DRAM. | Satoru Tanoi |
| 1998 | An introduction to area array probing. | Frederick L. Taber |
| 1998 | BIST vs. ATE: need a different vehicle? | Stephen K. Sunter |
| 1998 | Boundary scan BIST methodology for reconfigurable systems. | Chauchin Su, Shung-Won Jeng, Yue-Tsang Chen |
| 1998 | A novel test methodology for core-based system LSIs and a testing time minimization problem. | Makoto Sugihara, Hiroshi Date, Hiroto Yasuura |
| 1998 | Built-in self-test of FPGA interconnect. | Charles E. Stroud, Sajitha Wijesuriya, Carter Hamilton, Miron Abramovici |
| 1998 | How much testing is enough. | Susana Stoica |
| 1998 | A lifecycle approach to design validation is it necessary? Is it feasible? | Susana Stoica |
| 1998 | Test: when is enough enough? | Bret A. Stewart |
| 1998 | Enough is enough already. | William R. Simpson |
| 1998 | Native mode functional test generation for processors with applications to self test and design validation. | Jian Shen, Jacob A. Abraham |
| 1998 | Digital bus faults measuring techniques. | Reuben Schrift |
| 1998 | Semiconductor manufacturing process monitoring using built-in self-test for embedded memories. | Ivo Schanstra, Dharmajaya Lukita, Ad J. van de Goor, Kees Veelenturf, Paul J. van Wijnen |
| 1998 | On applying non-classical defect models to automated diagnosis. | Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess |
| 1998 | IC diagnosis: preventing wars and war stories. | Jayashree Saxena |
| 1998 | Multi-output one-digitizer measurement. | S. Sasho, M. Shibata |