| 1998 | Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs. | Manoj Sachdev, Peter Janssen, Victor Zieren |
| 1998 | SOC test: the devil is in the details of integration/implementation. | Kamalesh N. Ruparel |
| 1998 | When "almost" is good enough: a fresh look at DSP clock rates. | Eric Rosenfeld, Solomon Max |
| 1998 | Learning to knit SOCs profitably. | Todd E. Rockoff |
| 1998 | The rise and fall of the ATE industry. | Todd E. Rockoff |
| 1998 | CMOS IC reliability indicators and burn-in economics. | Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell |
| 1998 | SRAM-based FPGA's: testing the LUT/RAM modules. | Michel Renovell, Jean-Michel Portal, Joan Figueras, Yervant Zorian |
| 1998 | Buying time for the stuck-at fault model. | Jeff Rearick |
| 1998 | TAO: regular expression based high-level testability analysis and optimization. | Srivaths Ravi, Ganesh Lakshminarayana, Niraj K. Jha |
| 1998 | Design for diagnostics views and experiences. | Vallluri R. Rao |
| 1998 | Automated synthesis of large phase shifters for built-in self-test. | Janusz Rajski, Nagesh Tamarapalli, Jerzy Tyszer |
| 1998 | Modular logic built-in self-test for IP cores. | Janusz Rajski, Jerzy Tyszer |
| 1998 | High quality, easy to use, on time ATE software Can it be done? | Dan Proskauer |
| 1998 | A diagnostic test generation procedure for synchronous sequential circuits based on test elimination. | Irith Pomeranz, Sudhakar M. Reddy |
| 1998 | Temperature control of a handler test interface. | Andreas C. Pfahnl, John H. Lienhard V, Alexander H. Slocum |
| 1998 | Maximizing handler thermal throughput with a rib-roughened test tray. | Andreas C. Pfahnl, John H. Lienhard V, Alexander H. Slocum |
| 1998 | DfT and on-line test of high-performance data converters: a practical case. | Eduardo J. Peralas, Adoracin Rueda, Juan A. Prieto, Jos L. Huertas |
| 1998 | A distributed BIST technique for diagnosis of MCM interconnections. | Rajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian |
| 1998 | A non-enumerative path delay fault simulator for sequential circuits. | Carlos G. Parodi, Vishwani D. Agrawal, Michael L. Bushnell, Shianling Wu |
| 1998 | Novel optical probing technique for flip chip packaged microprocessors. | Mario Paniccia, Travis M. Eiles, V. R. M. Rao, Wai Mun Yee |
| 1998 | probe card-a solution for at-speed, high density, wafer probing. | Rajiv Pandey, Dan Higgins |
| 1998 | Detection of CMOS address decoder open faults with March and pseudo random memory tests. | Jan Otterstedt, Dirk Niggemeyer, T. W. Williams |
| 1998 | How real is the new SIA roadmap for mixed-signal test equipment? | William R. Ortner |
| 1998 | Leveraging new standards in ATE software. | John Oonk |
| 1998 | Defect level prediction for I_DDQ testing. | Yukio Okuda, Isao Kubota, Masahiro Watanabe |