| 1998 | Failure modes for stiction in surface-micromachined MEMS. | Abhijeet Kolpekwar, Ronald D. Blanton, David Woodilla |
| 1998 | Diagnosis and characterization of timing-related defects by time-dependent light emission. | Daniel R. Knebel, Pia N. Sanda, Moyra K. McManus, Jeffrey A. Kash, James C. Tsang, David P. Vallett, Leendert M. Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika |
| 1998 | Diagnostic techniques for the UltraSPARC microprocessors. | Anjali Kinra, Aswin Mehta, Neal Smith, Jackie Mitchell, Fred Valente |
| 1998 | Built in self repair for embedded high density SRAM. | Ilyoung Kim, Yervant Zorian, Goh Komoriya, Hai Pham, Frank P. Higgins, Jim L. Lewandowski |
| 1998 | Test session oriented built-in self-testable data path synthesis. | Han Bin Kim, Takeshi Takahashi, Dong Sam Ha |
| 1998 | A high throughput test methodology for MCM substrates. | Bruce C. Kim, David C. Keezer, Abhijit Chatterjee |
| 1998 | High-coverage ATPG for datapath circuits with unimplemented blocks. | HyungWon Kim, John P. Hayes |
| 1998 | Deterministic BIST with multiple scan chains. | Gundolf Kiefer, Hans-Joachim Wunderlich |
| 1998 | Towards an automatic diagnosis for high-level design validation. | Maisaa Khalil, Yves Le Traon, Chantal Robach |
| 1998 | BIST vs. ATE for testing system-on-a-chip. | Neil Kelly |
| 1998 | ATPG in practical and non-traditional applications. | Brion L. Keller, Kevin McCauley, Joseph Swenton, James Youngs |
| 1998 | Alternative interface methods for testing high speed bidirectional signals. | David C. Keezer, Q. Zhou |
| 1998 | Improved sensitivity for parallel test of substrate interconnections. | David C. Keezer, K. E. Newman, John S. Davis |
| 1998 | High speed testing-have the laws of physics finally caught up with us? | Jerry Katz |
| 1998 | Versatile BIST: an integrated approach to on-line/off-line BIST. | Ramesh Karri, Nilanjan Mukherjee |
| 1998 | A comprehensive approach to the partial scan problem using implicit state enumeration. | Priyank Kalla, Maciej J. Ciesielski |
| 1998 | A tree-structured LFSR synthesis scheme for pseudo-exhaustive testing of VLSI circuits. | Wen-Ben Jone, Jiann-Chyi Rau, Shih-Chieh Chang, Yu-Liang Wu |
| 1998 | Test vector decompression via cyclical scan chains and its application to testing core-based designs. | Abhijit Jas, Nur A. Touba |
| 1998 | Fine pitch (45 micron) P4 probing. | Toshinori Ishii, Hideaki Yoshida |
| 1998 | Design and implementation of the "G2" PowerPC 603e-embedded microprocessor core. | Craig Hunter, Justin Gaither |
| 1998 | Correlations between path delays and the accuracy of performance prediction. | Leendert M. Huisman |
| 1998 | Maximization of power dissipation under random excitation for burn-in testing. | Kuo-Chan Huang, Chung-Len Lee, Jwu E. Chen |
| 1998 | A new path-oriented effect-cause methodology to diagnose delay failures. | Yuan-Chieh Hsu, Sandeep K. Gupta |
| 1998 | Reduction of errors due to source and meter in the nonlinearity test. | Luke S. L. Hsieh |
| 1998 | A new approach to scan chain reordering using physical design information. | Mokhtar Hirech, James Beausang, Xinli Gu |