| 1998 | AVM | Bob Hickling |
| 1998 | Compact two-pattern test set generation for combinational and full scan circuits. | Ilker Hamzaoglu, Janak H. Patel |
| 1998 | Consequences of port restrictions on testing two-port memories. | Said Hamdioui, Ad J. van de Goor |
| 1998 | A high speed and area efficient on-chip analog waveform extractor. | Ara Hajjar, Gordon W. Roberts |
| 1998 | Defect-oriented test quality assessment using fault sampling and simulation. | Fernando M. Gonalves, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira |
| 1998 | Delay test of chip I/Os using LSSD boundary scan. | Pamela S. Gillis, Francis Woytowich, Kevin McCauley, Ulrich Baur |
| 1998 | Toward understanding "Iddq-only" fails. | Anne E. Gattiker, Wojciech Maly |
| 1998 | Current signatures: application [to CMOS]. | Anne E. Gattiker, Wojciech Maly |
| 1998 | The CAT-exact data transfer to DDS-generated clock domains in a single-chip modular solution. | Robert Gage, Ben Brown |
| 1998 | Microelectromechanical systems (MEMS) tutorial. | Kaigham J. Gabriel |
| 1998 | Testing the design: the evolution of test simulation. | Craig Force, Tom Austin |
| 1998 | Implicit test generation for behavioral VHDL models. | Fabrizio Ferrandi, Franco Fummi, Donatella Sciuto |
| 1998 | Flying probe test systems: capabilities for effective testing. | Jack Ferguson |
| 1998 | Increasing the performance of arbitrary waveform generators using sigma-delta coding techniques. | Benoit Dufort, Gordon W. Roberts |
| 1998 | Accumulator based deterministic BIST. | Rainer Dorsch, Hans-Joachim Wunderlich |
| 1998 | An algorithmic approach to optimizing fault coverage for BIST logic synthesis. | Srinivas Devadas, Kurt Keutzer |
| 1998 | Cost of test reduction. | Herv Deshayes |
| 1998 | Shared I/O-cell structures: a framework for extending the IEEE 1149.1 boundary-scan standard. | Bulent I. Dervisoglu, Mike Ricchetti, William Eklow |
| 1998 | Test methodology for a microprocessor with partial scan. | Leland L. Day, Paul A. Ganfield, Dennis M. Rickert, Fred J. Ziegler |
| 1998 | ASIC jeopardy-diagnosing without a FAB. | Scott Davidson |
| 1998 | Measuring jitter of high speed data channels using undersampling techniques. | Wajih Dalal, Daniel A. Rosenthal |
| 1998 | Switch-level bridging fault simulation in the presence of feedbacks. | Peter Dahlgren |
| 1998 | Accounting for the unexpected: fault diagnosis out of the ivory tower. | Brian Chess |
| 1998 | Test generation in VLSI circuits for crosstalk noise. | Weiyu Chen, Sandeep K. Gupta, Melvin A. Breuer |
| 1998 | National Science Foundation Workshop on Future Research Directions in Testing of Electronic Circuits and Systems: executive summary of workshop report. | Kwang-Ting Cheng |