| 1998 | Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. | Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey |
| 1998 | Detecting resistive shorts for CMOS domino circuits. | Jonathan T.-Y. Chang, Edward J. McCluskey |
| 1998 | A novel combinational testability analysis by considering signal correlation. | Shih-Chieh Chang, Shi-Sen Chang, Wen-Ben Jone, Chien-Chung Tsai |
| 1998 | A scalable architecture for VLSI test. | Ed Chang, David Cheung, Robert E. Huston, Jim Seaton, Gary Smith |
| 1998 | Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems. | A. Castillejo, D. Veychard, Salvador Mir, Jean-Michel Karam, Bernard Courtois |
| 1998 | Stuck-at fault: a fault model for the next millennium. | Janak H. Patel |
| 1998 | The stuck-at fault: it ain't over 'til it's over. | Kenneth M. Butler |
| 1998 | Testing mixed signal SOCs. | Mark Burns |
| 1998 | Modeling the unknown! Towards model-independent fault and error diagnosis. | Vamsi Boppana, Masahiro Fujita |
| 1998 | Static test sequence compaction based on segment reordering and accelerated vector restoration. | Surendra Bommu, Srimat T. Chakradhar, Kiran B. Doreswamy |
| 1998 | Testing a multichip package for a consumer communications application. | Alex S. Biewenga, Math Muris, Rodger Schuttert, Urs Fawer |
| 1998 | A highly testable and diagnosable fabrication process test chip. | Dilip K. Bhavsar, Ugonna Echeruo, David R. Akeson, William J. Bowhill |
| 1998 | Testability access of the high speed test features in the Alpha 21264 microprocessor. | Dilip K. Bhavsar, David R. Akeson, Michael K. Gowan, Daniel B. Jackson |
| 1998 | A fault injection environment for microprocessor-based boards. | Alfredo Benso, Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza Reorda |
| 1998 | Can model-based and case-based expert systems operate together? | Moshe Ben-Bassat, Israel Beniaminy, David Joseph |
| 1998 | Spice up your life: simulate mixed-signal ICs! | Keith Baker |
| 1998 | Digital oscillation-test method for delay and stuck-at fault testing of digital circuits. | Karim Arabi, Hassan Ihs, Christian Dufaza, Bozena Kaminska |
| 1998 | Generating interconnect models from prototype hardware. | Frank W. Angelotti |
| 1998 | Integrated probe card/interface solutions for specific test applications. | Jim Anderson |
| 1998 | On-line testing of scalable signal processing architectures using a software test method. | Chouki Aktouf, Ghassan Al Hayek, Chantal Robach |
| 1998 | On-chip versus off-chip test: an artificial dichotomy. | Robert C. Aitken |
| 1998 | Scan chain design for test time reduction in core-based ICs. | Joep Aerts, Erik Jan Marinissen |
| 1998 | Quad DCVS dynamic logic fault modeling and testing. | R. Dean Adams, Edmond S. Cooley, Patrick R. Hansen |
| 1997 | Test Requirements for Embedded Core-Based Systems and IEEE P1500. | Yervant Zorian |
| 1997 | Dynamic Testing of ADCs Using Wavelet Transforms. | Takahiro J. Yamaguchi, Mani Soma |