| 1997 | An Efficient Method for Compressing Test Data. | Takahiro J. Yamaguchi, Masahiro Ishida, Marco Tilgner, Dong Sam Ha |
| 1997 | A Unified Interface for Scan Test Generation Based on STIL. | Peter Wohl, John A. Waicukauski |
| 1997 | Test Access of TAP'ed & Non-TAP'ed Cores. | Lee Whetsel |
| 1997 | An IEEE 1149.1-Based Test Access Architecture for ICs with Embedded Cores. | Lee Whetsel |
| 1997 | Memory Test-Debugging Test Vectors Without ATE. | Steve Westfall |
| 1997 | To DFT or Not to DFT? | Sichao Wei, Pranab K. Nag, Ronald D. Blanton, Anne E. Gattiker, Wojciech Maly |
| 1997 | DS-LFSR: A New BIST TPG for Low Heat Dissipation. | Seongmoon Wang, Sandeep K. Gupta |
| 1997 | A New Validation Methodology Combining Test and Formal Verification for PowerPC | Li-C. Wang, Magdy S. Abadir |
| 1997 | Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis. | Ramakrishna Voorakaranam, Sudip Chakrabarti, Junwei Hou, Alfred V. Gomes, Sasikumar Cherubal, Abhijit Chatterjee, William H. Kao |
| 1997 | Cell Signal Measurement for High-Density DRAMs. | Jrg E. Vollrath |
| 1997 | Diagnosis of Bridging Faults in Sequential Circuits Using Adaptive Simulation, State Storage, and Path-Tracing. | Srikanth Venkataraman, W. Kent Fuchs |
| 1997 | On-Chip Measurement of the Jitter Transfer Function of Charge-Pump Phase-Locked Loops. | Benot R. Veillette, Gordon W. Roberts |
| 1997 | Fault Model Extension for Diagnosing Custom Cell Fails. | Gilbert Vandling, Thomas Bartenstein |
| 1997 | Advances in Probe Technology: Best Sessions of the'97 Southwest Test Workshop. | Dave Unzicker, Michael Bonham, Rey Rincon |
| 1997 | Capacitive Leadframe Testing. | Ted T. Turner |
| 1997 | A Novel Functional Test Generation Method for Processors Using Commercial ATPG. | Raghuram S. Tupuri, Jacob A. Abraham |
| 1997 | Scan-Encoded Test Pattern Generation for BIST. | Kun-Han Tsai, Malgorzata Marek-Sadowska, Janusz Rajski |
| 1997 | Testing the Enterprise IBM System/390 | Otto A. Torreiter, Ulrich Baur, Georg Goecke, Kevin Melocco |
| 1997 | Delay Testing with Clock Control: An Alternative to Enhanced Scan. | Ramesh C. Tekumalla, Premachandran R. Menon |
| 1997 | A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST. | Stephen K. Sunter, Naveena Nagi |
| 1997 | P1149.4-Problem or Solution for Mixed-Signal IC Design? | Stephen K. Sunter |
| 1997 | Parasitic Effect Removal for Analog Measurement in P1149.4 Environment. | Chauchin Su, Yue-Tsang Chen, Shyh-Jye Jou |
| 1997 | BIST-Based Diagnostics of FPGA Logic Blocks. | Charles E. Stroud, Eric Lee, Miron Abramovici |
| 1997 | A Parameterized VHDL Library for On-Line Testing. | Charles E. Stroud, M. Ding, S. Seshadri, Ramesh Karri, I. Kim, Subhajit Roy, S. Wu |
| 1997 | Manufacturing Pattern Development for the Alpha 21164 Microprocessor. | Carol Stolicny, Richard Davies, Pamela McKernan, Tuyen Truong |