| 1997 | Board Level Automated Fault Injection for Fault Coverage and Diagnostic Efficiency. | Bret A. Stewart |
| 1997 | A New Probe Card Technology Using Compliant Microsprings | Nicholas Sporck |
| 1997 | IC Diagnosis: Industry Issues. | Jerry M. Soden, Christopher L. Henderson |
| 1997 | Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study. | Adit D. Singh, Phil Nigh, C. Mani Krishna |
| 1997 | A Symbolic Simulation-Based ANSI/IEEE Std 1149.1 Compliance Checker and BSDL Generator. | Harbinder Singh, James Beausang, Girish Patankar |
| 1997 | Ethics, Professionalism and Accountability in Testing. | William R. Simpson |
| 1997 | Implementation of Mixed Current/Voltage Testing Using the IEEE P1149.4 Infrastructure. | Jos Machado da Silva, Ana C. Leo, Jos Silva Matos, Jos Carlos Alves |
| 1997 | Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)-A New Standard for System Diagnostics. | John W. Sheppard, Leslie A. Orlidge |
| 1997 | Supervisors for Testing Non-Deterministically Specified Systems. | Tony Savor, Rudolph E. Seviora |
| 1997 | Scan Latch Design for Delay Test. | Jacob Savir |
| 1997 | Logical Diagnosis Solutions Must Drive Yield Improvement. | Paul G. Ryan |
| 1997 | Putting the Squeeze on Test Sequences. | Elizabeth M. Rudnick, Janak H. Patel |
| 1997 | Analog AC Harmonic Method for Detecting Solder Opens. | Chuck Robinson |
| 1997 | Test Strategy Sensitivity to Defect Parameters. | Michel Renovell, Yves Bertrand |
| 1997 | The Case of Partial Scan. | Jeff Rearick |
| 1997 | Why Automate Optical Inspection? | Douglas W. Raymond, Dominic F. Haigh |
| 1997 | Finding Opens with Optics. | Douglas W. Raymond |
| 1997 | Fault Diagnosis in Scan-Based BIST. | Janusz Rajski, Jerzy Tyszer |
| 1997 | How Seriously Do You Take Your Possible-Detect Faults? | Rajesh Raina, Charles Njinda, Robert F. Molyneaux |
| 1997 | Analyzing a PowerPC | Richard Raimi, James Lear |
| 1997 | Real-Time In-situ Monitoring and Characterization of Production Wafer Probing Process. | Minh Quach, Kim Harper |
| 1997 | Next-Generation PowerPC | Carol Pyron, Javier Prado, James Golab |
| 1997 | Vision Inspection: Meeting the Promise? | Richard Pye |
| 1997 | A DSP-Based Feedback Loop for Mixed-Signal VLSI Testing. | Lakshmikantha S. Prabhu, Daniel A. Rosenthal |
| 1997 | A 256Meg SDRAM BIST for Disturb Test Application. | Theo J. Powell, Dan Cline, Francis Hii |