| 1997 | Modifying User-Defined Logic for Test Access to Embedded Cores. | Bahram Pouya, Nur A. Touba |
| 1997 | Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data. | James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan |
| 1997 | Design, Fabrications and Use of Mixed-Signal IC Testability Structures. | Kenneth P. Parker, John E. McDermid, Rodney A. Browen, Kozo Nuriya, Katsuhiro Hirayama, Akira Matsuzawa |
| 1997 | Fault Macromodeling for Analog/Mixed-Signal Circuits. | Chen-Yang Pan, Kwang-Ting Cheng |
| 1997 | Unpowered Opens Test with X-Ray Laminography. | Stig Oresjo |
| 1997 | Testability Enhancement for Behavioral Descriptions Containing Conditional Statements. | Kelly A. Ockunzzi, Christos A. Papachristou |
| 1997 | Why Would an ASIC Foundry Accept Anything Less than Full Scan? | Steven F. Oakland |
| 1997 | So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. | Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly |
| 1997 | Application and Analysis of IDDQ Diagnostic Software. | Phil Nigh, Donato O. Forlenza, Franco Motika |
| 1997 | On-Line Testing for VLSI. | Michael Nicolaidis |
| 1997 | A Low-Cost Massively-Parallel Interconnect Test Method for MCM Substrates. | K. E. Newman, David C. Keezer |
| 1997 | An Efficient Scheme to Diagnose Scan Chains. | Sridhar Narayanan, Ashutosh Das |
| 1997 | Parameterizable Testing Scheme for FIR Filters. | Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer |
| 1997 | An IDDQ Sensor Circuit for Low-Voltage ICs. | Yukiya Miura |
| 1997 | Scan Synthesis for One-Hot Signals. | Subhasish Mitra, LaNae J. Avra, Edward J. McCluskey |
| 1997 | On-Line Testing Scheme for Clock's Faults. | Cecilia Metra, Michele Favalli, Bruno Ricc |
| 1997 | Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique. | Anne Meixner, Jash Banik |
| 1997 | Incorporating Physical Design-for-Test into Routing. | Richard McGowen, F. Joel Ferguson |
| 1997 | RF Introduction and Analog Junction Techniques for Finding Opens. | B. Karen McElfresh |
| 1997 | Plug and Play or Plug and Pray: We Have a Right to Know It Will Work (Or Why It Won't). | Colin M. Maunder |
| 1997 | A Case Study of the Test Development for the 2nd Generation ColdFire Microprocessors. | Michael Mateja, Alfred L. Crouch, Renny Eisele, Grady Giles, Dale Amason |
| 1997 | Structuring STIL for Incremental Test Development. | Gregory A. Maston |
| 1997 | OLDEVDTP: A Novel Environment for Off-Line Debugging of VLSI Device Test Programs. | Yuhai Ma, Wanchun Shi |
| 1997 | Tree-Structured Linear Cellular Automata and Their Applications as PRPGs. | J. Li, X. Sun, K. Soon |
| 1997 | Efficient Identification of Non-Robustly Untestable Path Delay Faults. | Zhongcheng Li, Robert K. Brayton, Yinghua Min |