| 1997 | Experimental Results for Current-Based Analog Scan. | Thomas M. Bocek, Tuyen D. Vu, Mani Soma, Jason D. Moffatt |
| 1997 | i | J. S. Beasley, S. Pour-Mozafari, D. Huggett, Alan W. Righter, C. J. Apodaca |
| 1997 | The Search for the Universal Probe Card Solution. | R. Dennis Bates |
| 1997 | H-SCAN+: A Practical Low-Overhead RTL Design-for-Testability Technique for Industrial Designs. | Toshiharu Asaka, Masaaki Yoshida, Subhrajit Bhattacharya, Sujit Dey |
| 1997 | Experiences with Implementation of I | Ralf Arnold, Markus Feuser, Horst-Udo Wedekind, Thorsten Bode |
| 1997 | Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits. | Karim Arabi, Bozena Kaminska |
| 1997 | Design and Realization of an Accurate Built-In Current Sensor for On-Line Power Dissipation Measurement and I | Karim Arabi, Bozena Kaminska |
| 1997 | Thoughts on Core Integration and Test. | Thomas L. Anderson |
| 1997 | Embedded At-Speed Test Probe. | Mitch Aigner |
| 1997 | A Self-Test Circuit for Evaluating Memory Sense-Amplifier Signal. | R. Dean Adams, Edmond S. Cooley, Patrick R. Hansen |
| 1997 | An On-Line Self-Testing Switched-Current Integrator. | Osama K. Abu-Shahla, Ian M. Bell |
| 1996 | Two-Dimensional Test Data Decompressor for Multiple Scan Designs. | Nadime Zacharia, Janusz Rajski, Jerzy Tyszer, John A. Waicukauski |
| 1996 | A Global Algorithm for the Partial Scan Design Problem Using Circuit State Information. | Dong Xiang, Janak H. Patel |
| 1996 | BIST Fault Diagnosis in Scan-Based VLSI Environments. | Yuejian Wu, Saman Adham |
| 1996 | Two New Techniques for Identifying Opens on Printed Circuit Boards: Analog Junction Test, and Radio Frequency Induction Test. | Joe Wrinn |
| 1996 | Test Generation for Ultra-Large Circuits Using ATPG Constraints and Test-Pattern Templates. | Peter Wohl, John A. Waicukauski |
| 1996 | I | Thomas W. Williams, Robert H. Dennard, Rohit Kapur, M. Ray Mercer, Wojciech Maly |
| 1996 | Proposal to Simplify Development of a Mixed-Signal Test Standard. | Lee Whetsel |
| 1996 | A Roadmap for Boundary-Scan Test Reuse. | D. Eugene Wedge, Tom Conner |
| 1996 | Using Target Faults To Detect Non-Tartget Defects. | Li-C. Wang, M. Ray Mercer, Thomas W. Williams |
| 1996 | Analog/Digital Testing of Loaded Boards Without Dedicated Test Points. | Christophe Vaucher, Louis Balme |
| 1996 | An Overview of CMOS VLSI Failure Analysis and the Importance of Test and Diagnostics. | David P. Vallett |
| 1996 | Capacitive Leadframe Testing. | Ted T. Turner |
| 1996 | LFSR Reseeding as a Component of Board Level BIST. | Pieter M. Trouborst |
| 1996 | Testability-Oriented Hardware/Software Partitioning. | Yves Le Traon, Ghassan Al Hayek, Chantal Robach |