| 1996 | Altering a Pseudo-Random Bit Sequence for Scan-Based BIST. | Nur A. Touba, Edward J. McCluskey |
| 1996 | Test Pattern Generation for Circuits with Asynchronous Signals Based on Scan. | Mitsuo Teramoto, Tomoo Fukazawa |
| 1996 | Opens Board Test Coverage: When is 99% Really 40%? | Mick Tegethoff, Kenneth P. Parker, Ken Lee |
| 1996 | Standard Test Interface Language (STIL): A New Language for Patterns and Waveforms. | Anthony Taylor, Gregory A. Maston |
| 1996 | Constructive Multi-Phase Test Point Insertion for Scan-Based BIST. | Nagesh Tamarapalli, Janusz Rajski |
| 1996 | Analog AC Harmonic Method for Detecting Solder Opens. | Anthony J. Suto |
| 1996 | Using ILA Testing for BIST in FPGAs. | Charles E. Stroud, Eric Lee, Srinivasa Konala, Miron Abramovici |
| 1996 | Cost Effective Frequency Measurement for Production Testing. | Ralf Stoffels |
| 1996 | Practical Issues of Failure Diagnosis and Analysis in a Fast Cycle Time Environment. | Donald Staab |
| 1996 | IC Failure Analysis Tools and Techniques - Macig, Mystery, and Science. | Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson |
| 1996 | Synthesis-for-Initializability of Asynchronous Sequential Machines. | Montek Singh, Steven M. Nowick |
| 1996 | The Key to Concurrent Engineering is Design Tools. | William R. Simpson |
| 1996 | An Asynchronous Scan Path Concept for Micropipelines using the Bundled Data Convention. | Volker Schber, Thomas Kiel |
| 1996 | MCM Compute Node Thermal Failure - Design or Test Problem? | Edward P. Sayre |
| 1996 | Towards an Effective I | Jos van Sas, Urbain Swerts, Marc Darquennes |
| 1996 | Optimal Multiple Chain Relay Testing Scheme for MCMs on Large Area Substrates. | Koppolu Sasidhar, Abhijit Chatterjee, Yervant Zorian |
| 1996 | Four Multi Probing Test for 16 Bit DAC with Vertical Contact Probe Card. | Seiji Sasho, Teruhisa Sakata |
| 1996 | System Level Fault Simulation. | Pablo Sanchez, Isabel Hidalgo |
| 1996 | A Built-In Self-Test Circuit with Timing Margin Test Function in a 1Gbit Synchronous DRAM. | Narumi Sakashita, Fumihiro Okuda, Ken'ichi Shimomura, Hiroki Shimano, Mitsuhiro Hamada, Tetsuo Tada, Shinji Komori, Kazuo Kyuma, Akihiko Yasuoka, Haruhiko Abe |
| 1996 | Deep Sub-micron I | Manoj Sachdev |
| 1996 | A Method of Extending an 1149.1 Bus for Mixed-Signal Testing. | Robert J. Russell |
| 1996 | On Potential Fault Detection in Sequential Circuits. | Elizabeth M. Rudnick, Janak H. Patel, Irith Pomeranz |
| 1996 | Test Quality of Asynchronous Circuits: A Defect-oriented Evaluation. | Marly Roncken, Eric Bruls |
| 1996 | Optimal Scan for Pipelined Testing: An Asynchronous Foundation. | Marly Roncken, Emile H. L. Aarts, Wim F. J. Verhaegh |
| 1996 | Asynchronous Design: Working the Fast Lane. | Marly Roncken |