| 2020 | Test and Diagnosis Solution for Functional Safety. | M. Casarsa, Gurgen Harutyunyan, Yervant Zorian |
| 2020 | Machine Learning based Performance Prediction of Microcontrollers using Speed Monitors. | Riccardo Cantoro, Martin Huch, Tobias Kilian, Raffaele Martone, Ulf Schlichtmann, Giovanni Squillero |
| 2020 | New Perspectives on Core In-field Path Delay Test. | Riccardo Cantoro, Dario Foti, Sandro Sartoni, Matteo Sonza Reorda, Lorena Anghel, Michele Portolan |
| 2020 | Multi-Level Access Protection for Future IEEE P1687.1 IJTAG Networks. | David Brauchler, Jennifer Dworak |
| 2020 | On the Measurement of Safe Fault Failure Rates in High-Performance Compute Processors. | Richard Bramley, Yanxiang Huang, Guangshan Duan, Nirmal R. Saxena, Paul Racunas |
| 2020 | Die-to-Die Testing and ECC Error Mitigation in Automotive and Industrial Safety Applications. | Gabriele Boschi, Elisa Spano, Hayk T. Grigoryan, Arun Kumar, Gurgen Harutyunyan |
| 2020 | IJTAG Through a Two-Pin Chip Interface. | Manu Baby, Bernd Bttner, Piet Engelke, Ulrike Pfannkuchen, Reinhard Meier, Jonathan Gaudet, Jean-Franois Ct, Givargis Danialy, Martin Keim, Lori Schramm |
| 2020 | Digital Design Techniques for Dependable High Performance Computing. | Sarah Azimi, Luca Sterpone |
| 2020 | Design Optimization for N-port RF Network Reflectometers under Noise and Gain Imperfections. | Muslum Emir Avci, Sule Ozev |
| 2020 | Cost-Effective Test Method for screening out Unexpected Failure in High Speed Serial Interface IPs. | Sang-Uck Ahn, Beom-Kyu Seo, Hyun-Woo Kim, Yeoun-Sook Shin, Hyung-Tae Kim, Ghil-Geun Oh, Young-Dae Kim |
| 2020 | Automated Socket Anomaly Detection through Deep Learning. | Nidhi Agrawal, Min-Jian Yang, Constantinos Xanthopoulos, Vijayakumar Thangamariappan, Joe Xiao, Chee-Wah Ho, Keith Schaub, Ira Leventhal |
| 2020 | High Defect-Density Yield Learning using Three-Dimensional Logic Test Chips. | Zeye Liu, R. D. Shawn Blanton |
| 2019 | Machine Learning-Based DFT Recommendation System for ATPG QOR. | Apik Zorian, Basim Shanyour, Milir Vaseekar |
| 2019 | 17th IEEE East-West Design and Test Symposium. | Yervant Zorian, Vladimir Hahanov, Svetlana Chumachenko, Eugenia Litvinova |
| 2019 | Structural Test and Functional Test for Digital Acoustofluidic Biochips. | Zhanwei Zhong, Haodong Zhu, Peiran Zhang, Tony Jun Huang, Krishnendu Chakrabarty |
| 2019 | Fault Recovery in Micro-Electrode-Dot-Array Digital Microfluidic Biochips Using an IJTAG NetworkBehaviors. | Zhanwei Zhong, Krishnendu Chakrabarty |
| 2019 | A Framework for Design of Self-Repairing Digital Systems. | Jingchi Yang, David C. Keezer |
| 2019 | Safety Design of a Convolutional Neural Network Accelerator with Error Localization and Correction. | Zheng Xu, Jacob Abraham |
| 2019 | Multi-cell characterization: Developing robust cells and abstraction for Rapid Single Flux Quantum (RSFQ) Logic. | Fangzhou Wang, Sandeep Gupta |
| 2019 | Is Backside the New Backdoor in Modern SoCs?: Invited Paper. | Nidish Vashistha, M. Tanjidur Rahman, Olivia P. Paradis, Navid Asadizanjani |
| 2019 | Efficient Analog Defect Simulation. | Stephen Sunter |
| 2019 | On Freedom from Interference in Mixed-Criticality Systems: A Causal Learning Approach. | Fei Su, Prashant Goteti, Min Zhang |
| 2019 | International Symposium on Design and Diagnostics of Electronic Circuits and Systems. | Zoran Stamenkovic, Alberto Bosio, Gyrgy Cserey, Ondrej Novk, Witold A. Pleskacz, Luks Sekanina, Andreas Steininger, Goran Stojanovic, Viera Stopjakov |
| 2019 | An Adaptive Approach to Minimize System Level Tests Targeting Low Voltage DVFS Failures. | Adit D. Singh |
| 2019 | Armenia: Communicating to World Community in Electronic Test and Design. | Samvel K. Shoukourian, Yuri Shoukourian, Vladimir Sahakyan |