IEEE International Test Conference

ITC

CORE rank

CORE rank (raw)

Fields of research

Computer Systems Engineering

Papers indexed

4,920

1981–2025

Best Computer Systems Engineering conferences

Papers per year

1981207 peak2025

Most published authors

ITC papers

4,920 records sourced from DBLP. Search titles, filter by year, sort by recency.

Year	Title	Authors
2019	FAE: Autoencoder-Based Failure Binning of RTL Designs for Verification and Debugging.	Cheng-Hsien Shen, Aaron C.-W. Liang, Charles C.-H. Hsu, Charles H.-P. Wen
2019	Deploying A Machine Learning Solution As A Surrogate.	Chuanhe Jay Shan, Ahmed Wahba, Li-C. Wang, Nik Sumikawa
2019	Efficiency Measurement Method for Fully Integrated Voltage Regulators used in 4	Gerhard Schrom, Michael J. Hill, Sarath Makala, Ravi Sankar Vunnam, Arun Krishnamoorthy, Ryan Ferguson
2019	Effectively Using Machine Learning to Expedite System Level Test Failure Debug.	Luis D. Rojas, Kevin Hess, Christina Carter-Brown
2019	VIPER: A Versatile and Intuitive Pattern GenERator for Early Design Space Exploration.	Gaurav Rajavendra Reddy, Mohammad-Mahdi Bidmeshki, Yiorgos Makris
2019	Compaction of a Functional Broadside Test Set through the Compaction of a Functional Test Sequence without Sequential Fault Simulation.	Irith Pomeranz
2019	Iterative Test Generation for Gate-Exhaustive Faults to Cover the Sites of Undetectable Target Faults.	Irith Pomeranz
2019	Optimized Physical DFT Synthesis of Unified Compression and LBIST for Automotive Applications.	Christos Papameletis, Vivek Chickermane, Brian Foutz, Sarthak Singhal, Krishna Chakravadhanula
2019	Characterization of Library Cells for Open-circuit Defect Exposure: A Systematic Methodology.	Sujay Pandey, Sanya Gupta, Madhu Sudhan L., Suriya Natarajan, Arani Sinha, Abhijit Chatterjee
2019	A New Test Method for the Large Current Magnetic Sensors.	Toshiyuki Omuro, Shigeo Nakamura Surname, Takashi Kimura, Kiyokawa Omuro
2019	Applications of Hierarchical Test.	Kelly Ockunzzi, Richard Grupp, Brion Keller, Mark Taylor, Sreekanth Pai, Greeshma Jayakumar
2019	Methodology of Generating Timing-Slack-Based Cell-Aware Tests.	Yu-Teng Nien, Kai-Chiang Wu, Dong-Zhen Lee, Ying-Yen Chen, Po-Lin Chen, Mason Chern, Jih-Nung Lee, Shu-Yi Kao, Mango Chia-Tso Chao
2019	Test Time and Area Optimized BrST Scheme for Automotive ICs.	Nilanjan Mukherjee, Jerzy Tyszer, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki
2019	An Efficient Supervised Learning Method to Predict Power Supply Noise During At-speed Test.	Seyed Nima Mozaffari, Bonita Bhaskaran, Kaushik Narayanun, Ayub Abdollahian, Vinod Pagalone, Shantanu Sarangi, Jonathon E. Colburn
2019	The Challenges of Implementing an MBIST Interface: A Practical Application.	Teresa McLaurin, Rob Knoth
2019	A Hybrid Space Compactor for Adaptive X-Handling.	Mohammad Urf Maaz, Alexander Sprenger, Sybille Hellebrand
2019	Security Compliance Analysis of Reconfigurable Scan Networks.	Natalia Lylina, Ahmed Atteya, Pascal Raiola, Matthias Sauer, Bernd Becker, Hans-Joachim Wunderlich
2019	Resiliency of automotive object detection networks on GPU architectures.	Atieh Lotfi, Saurabh Hukerikar, Keshav Balasubramanian, Paul Racunas, Nirmal R. Saxena, Richard Bramley, Yanxiang Huang
2019	Knowledge Transfer in Board-Level Functional Fault Identification using Domain Adaptation.	Mengyun Liu, Xin Li, Krishnendu Chakrabarty, Xinli Gu
2019	Improving Test Chip Design Efficiency via Machine Learning.	Zeye Liu, Qicheng Huang, Chenlei Fang, R. D. (Shawn) Blanton
2019	China Test Conference (CTC) - Extending the Global Test Forum to China.	Huawei Li, Xiaowei Li, Yinhe Han
2019	Programmable Daisychaining of Microelectrodes for IP Protection in MEDA Biochips.	Tung-Che Liang, Krishnendu Chakrabarty, Ramesh Karri
2019	International Test Conference in Asia (ITC-Asia) - Bridging ITC and Test Community in Asia.	Kuen-Jong Lee, Shi-Yu Huang, Huawei Li, Tomoo Inoue, Yervant Zorian
2019	IEEE Std. P1687.1: Translator and Protocol.	Erik Larsson, Prathamesh Murali, Gani Kumisbek
2019	Virtual Memory Structures Facilitating Memory BIST Insertion In Complex SoCs.	Tal Kogan, Yehonatan Abotbol

426–450 of 4,920← Previous Next →

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