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IEEE International Test Conference

ITC

A

CORE rank

CORE rank (raw)

A

Fields of research

Computer Systems Engineering

Papers indexed

4,920

1981–2025

Papers per year

1981207 peak2025

ITC papers

4,920 records sourced from DBLP. Search titles, filter by year, sort by recency.

YearTitleAuthors
2019Machine Learning-Based Automatic Generation of eFuse Configuration in NAND Flash Chip.Jisuk Kim, Jinyub Lee, Sungjoo Yoo
2019Breaking Analog Locking Techniques via Satisfiability Modulo Theories.Nithyashankari Gummidipoondi Jayasankaran, Adriana C. Sanabria-Borbon, Amr Abuellil, Edgar Snchez-Sinencio, Jiang Hu, Jeyavijayan Rajendran
2019Asian Test Symposium - Past, Present and Future -.Michiko Inoue, Xiaowei Li, Cheng-Wen Wu
2019Subtle Anomaly Detection of Microscopic Probes using Deep learning based Image Completion.Kosuke Ikeda, Keith Schaub, Ira Leventhal, Yiorgos Makris, Constantinos Xanthopoulos, Deepika Neethirajan
2019A Jitter Injection Module for Production Test of 52-Gbps PAM4 Signal Interfaces.Kiyotaka Ichiyama, Takashi Kusaka, Masahiro Ishida
2019DARS: An EDA Framework for Reliability and Functional Safety Management of System-on-Chips.Ahmed M. Y. Ibrahim, Hans G. Kerkhoff
2019TestDNA: Novel Wafer Defect Signature for Diagnosis and Yield Learning.Andrew Yi-Ann Huang, Katherine Shu-Min Li, Cheng-Yen Tsai, Ken Chau-Cheung Cheng, Sying-Jyan Wang, Xu-Hao Jiang, Leon Chou, Chen-Shiun Lee
2019Variation-Aware Small Delay Fault Diagnosis on Compressed Test Responses.Stefan Holst, Eric Schneider, Michael A. Kochte, Xiaoqing Wen, Hans-Joachim Wunderlich
2019Time-Slicing Soft Error Resilience in Microprocessors for Reliable and Energy-Efficient Execution.Yi He, Yanjing Li
2019Advanced Burn-In - An Optimized Product Stress and Test Flow for Automotive Microcontrollers.Chen He
2019Testing Computation-in-Memory Architectures Based on Emerging Memories.Said Hamdioui, Moritz Fieback, Surya Nagarajan, Mottaqiallah Taouil
2019Testing of Neuromorphic Circuits: Structural vs Functional.Anteneh Gebregiorgis, Mehdi Baradaran Tahoori
2019Application of Cell-Aware Test on an Advanced 3nm CMOS Technology Library.Zhan Gao, Santosh Malagi, Min-Chun Hu, Joe Swenton, Rogier Baert, Jos Huisken, Bilal Chehab, Kees Goossens, Erik Jan Marinissen
2019IEEE International Symposium on Hardware Oriented Security and Trust (HOST): Past, Present, and Future.Domenic Forte, Swarup Bhunia, Ramesh Karri, Jim Plusquellic, Mark Tehranipoor
2019A Decentralized Scheduler for On-line Self-test Routines in Multi-core Automotive System-on-Chips.Andrea Floridia, Davide Piumatti, Annachiara Ruospo, Ernesto Snchez, Sergio de Luca, Rosario Martorana
2019Device-Aware Test: A New Test Approach Towards DPPB Level.Moritz Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, Siddharth Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui
2019SoC Security Verification using Property Checking.Nusrat Farzana, Fahim Rahman, Mark Tehranipoor, Farimah Farahmandi
2019IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR).Szilrd Enyedi, Liviu Miclea
2019IEEE European Test Symposium (ETS).Stephan Eggersgl, Said Hamdioui, Artur Jutman, Maria K. Michael, Jaan Raik, Matteo Sonza Reorda, Mehdi Baradaran Tahoori, Elena-Ioana Vatajelu
2019Towards Complete Fault Coverage by Test Point Insertion using Optimization-SAT Techniques.Stephan Eggersgl
2019Characterization of Locked Combinational Circuits via ATPG.Danielle Duvalsaint, Xiaoxiao Jin, Benjamin Niewenhuis, R. D. (Shawn) Blanton
2019FPGA Bitstream Security: A Day in the Life.Adam Duncan, Fahim Rahman, Andrew Lukefahr, Farimah Farahmandi, Mark Tehranipoor
2019Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs.Wim Dobbelaere, Frederik Colle, Anthony Coyette, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen
2019Simulation-based Equivalence Checking between IEEE 1687 ICL and RTL.Aleksa Damljanovic, Artur Jutman, Michele Portolan, Ernesto Snchez, Giovanni Squillero, Anton Tsertov
2019Overall Strategy for Online Clock System Checking Supporting Heterogeneous Integration.Wei Chu, Shi-Yu Huang
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