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IEEE International Test Conference

ITC

A

CORE rank

CORE rank (raw)

A

Fields of research

Computer Systems Engineering

Papers indexed

4,920

1981–2025

Papers per year

1981207 peak2025

ITC papers

4,920 records sourced from DBLP. Search titles, filter by year, sort by recency.

YearTitleAuthors
2019Recycled Analog and Mixed Signal Chip Detection at Zero Cost Using LDO Degradation.Sreeja Chowdhury, Fatemeh Ganji, Troy Bryant, Nima Maghari, Domenic Forte
2019High Quality Test Methodology for Highly Reliable Devices.Hao Chen, Mincent Lee, Liang-Yen Chen, Min-Jer Wang
2019Built-in self-test and self-calibration for analog and mixed signal circuits.Tao Chen, Degang Chen
2019Hardware Fault Tolerance for Binary RRAM Crossbars.Arjun Chaudhuri, Bonan Yan, Yiran Chen, Krishnendu Chakrabarty
2019Fault-Tolerant Neuromorphic Computing Systems.Arjun Chaudhuri, Mengyun Liu, Krishnendu Chakrabarty
2019Memory FIT Rate Mitigation Technique for Automotive SoCs.Gabriele Boschi, Donato Luongo, Duccio Lazzarotti, Hanna Shaheen, Hayk T. Grigoryan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
2019Reliability Modeling and Mitigation for Embedded Memories.Innocent Okwudili Agbo, Mottaqiallah Taouil, Said Hamdioui
2019An Overview of the International Verification and Security Workshop (IVSW).Magdy Abadir, Sohrab Aftabjahani
2019An Overview of the International Microprocessor/ SoC Test, Security and Validation (MTV)Workshop.Magdy Abadir, Sohrab Aftabjahani
2018Access-Time Minimization in the IEEE 1687 Network Using Broadcast and Hardware Parallelism.Zhanwei Zhong, Guoliang Li, Qinfu Yang, Krishnendu Chakrabarty
2018Built-In Self-Diagnosis and Fault-Tolerant Daisy-Chain Design in MEDA Biochips.Ling Zhang, Zipeng Li, Krishnendu Chakrabarty
2018Towards Provably Secure Logic Locking for Hardening Hardware Security Dissertation Summary: IEEE TTTC E.J. McCluskey Doctoral Thesis Award Competition.Muhammad Yasin, Ozgur Sinanoglu
2018Electrical Modeling of STT-MRAM Defects.Lizhou Wu, Mottaqiallah Taouil, Siddharth Rao, Erik Jan Marinissen, Said Hamdioui
2018XLBIST: X-Tolerant Logic BIST.Peter Wohl, John A. Waicukauski, Gregory A. Maston, Jonathon E. Colburn
2018Lightweight Timing Channel Protection for Shared DRAM Controller.Ying Wang, Wen Li, Huawei Li, Xiaowei Li
2018An Autonomous System View To Apply Machine Learning.Li-C. Wang
2018Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications.Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian, Anteneh Gebregiorgis, Mohammad Saber Golanbari, Rajendra Bishnoi, Mehdi Baradaran Tahoori
2018Improving Analog Functional Safety Using Data-Driven Anomaly Detection.Fei Su, Prashant Goteti
2018EMFORCED: EM-based Fingerprinting Framework for Counterfeit Detection with Demonstration on Remarked and Cloned ICs.Andrew Stern, Ulbert Botero, Bicky Shakya, Hao-Ting Shen, Domenic Forte, Mark Tehranipoor
2018Artificial Neural Network Based Test Escape Screening Using Generative Model.Michihiro Shintani, Michiko Inoue, Yoshiyuki Nakamura
2018Test methodology for PCHB/PCFB Asynchronous Circuits.Ting-Yu Shen, Chia-Cheng Pai, Tsai-Chieh Chen, James Chien-Mo Li, Samuel Pan
2018Detection of Low Power Trojans in Standard Cell Designs using Built-in Current Sensors.Basim Shanyour, Spyros Tragoudas
2018Transmitter and Receiver Equalizers Optimization Methodologies for High-Speed Links in Industrial Computer Platforms Post-Silicon Validation.Francisco E. Rangel-Patino, Jos Ernesto Rayas-Snchez, Nagib Hakim
2018On New Class of Test Points and Their Applications.Janusz Rajski, Jerzy Tyszer, Justyna Zawada
2018On Close-to-Functional Test Sequences.Irith Pomeranz
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