IEEE International Test Conference
ITC
A
CORE rank
CORE rank (raw)
A
Fields of research
Computer Systems Engineering
Papers indexed
4,920
1981–2025
Papers per year
1981207 peak2025
Most published authors
ITC papers
4,920 records sourced from DBLP. Search titles, filter by year, sort by recency.
| Year | Title | Authors |
|---|---|---|
| 2018 | Concept Recognition in Production Yield Data Analytics. | Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa |
| 2018 | Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM. | Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian |
| 2018 | Improving Power, Performance and Area with Test: A Case Study. | Teresa L. McLaurin, Ignatius P. Lawrence |
| 2018 | Solutions to Multiple Probing Challenges for Test Access to Multi-Die Stacked Integrated Circuits. | Erik Jan Marinissen, Ferenc Fodor, Arnita Podpod, Michele Stucchi, Yu-Rong Jian, Cheng-Wen Wu |
| 2018 | Production Tests Coverage Analysis in the Simulation Environment. | Niveditha Manjunath, Dieter Haerle, Stephen Sabanal, Herbert Eichinger, Hermann Tauber, Andreas Machne, Christian Manthey, Mikko Vaananen, Radu Grosu, Dejan Nickovic |
| 2018 | Fault Tolerance for RRAM-Based Matrix Operations. | Mengyun Liu, Lixue Xia, Yu Wang, Krishnendu Chakrabarty |
| 2018 | Fine-Grained Adaptive Testing Based on Quality Prediction. | Mengyun Liu, Renjian Pan, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu |
| 2018 | Deterministic Stellar BIST for In-System Automotive Test. | Yingdi Liu, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer |
| 2018 | Machine Learning for Yield Learning and Optimization. | Yibo Lin, Mohamed Baker Alawieh, Wei Ye, David Z. Pan |
| 2018 | Influence-Directed Explanations for Deep Convolutional Networks. | Klas Leino, Shayak Sen, Anupam Datta, Matt Fredrikson, Linyi Li |
| 2018 | Design Automation for Intelligent Automotive Systems. | Shuyue Lan, Chao Huang, Zhilu Wang, Hengyi Liang, Wenhao Su, Qi Zhu |
| 2018 | Generating Compact Test Patterns for DC and AC Faults Using One ATPG Run. | Yi-Cheng Kung, Kuen-Jong Lee, Sudhakar M. Reddy |
| 2018 | Advanced Uniformed Test Approach For Automotive SoCs. | Tal Kogan, Yehonatan Abotbol, Gabriele Boschi, Gurgen Harutyunyan, N. Martirosyan, Yervant Zorian |
| 2018 | Test of Supply Noise for Emerging Non-Volatile Memory. | Mohammad Nasim Imtiaz Khan, Swaroop Ghosh |
| 2018 | On-Chip Toggle Generators to Provide Realistic Conditions during Test of Digital 2D-SoCs and 3D-SICs. | Leonidas Katselas, Alkis A. Hatzopoulos, Hailong Jiao, Christos Papameletis, Erik Jan Marinissen |
| 2018 | Hardware Dithering: A Run-Time Method for Trojan Neutralization in Wireless Cryptographic ICs. | Christiana Kapatsori, Yu Liu, Angelos Antonopoulos, Yiorgos Makris |
| 2018 | IJTAG Integrity Checking with Chained Hashing. | Senwen Kan, Jennifer Dworak |
| 2018 | Self-Learning Health-Status Analysis for a Core Router System. | Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu |
| 2018 | A Stressed Eye Testing Module for Production Test of 30-Gbps NRZ Signal Interfaces. | Kiyotaka Ichiyama, Takashi Kusaka, Masahiro Ishida |
| 2018 | Online Scan Diagnosis : A Novel Approach to Volume Diagnosis. | I-De Huang, Pallav Gupta, Loganathan Lingappan, Vijay Gangaram |
| 2018 | Improving Diagnosis Efficiency via Machine Learning. | Qicheng Huang, Chenlei Fang, Soumya Mittal, R. D. Shawn Blanton |
| 2018 | DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. | Will Howell, Friedrich Hapke, Edward Brazil, Srikanth Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski |
| 2018 | Variation-Aware Hardware Trojan Detection through Power Side-channel. | Fakir Sharif Hossain, Michihiro Shintani, Michiko Inoue, Alex Orailoglu |
| 2018 | Hardware IP Trust Validation: Learn (the Untrustworthy), and Verify. | Tamzidul Hoque, Jonathan Cruz, Prabuddha Chakraborty, Swarup Bhunia |
| 2018 | An Effective Intra-Cell Diagnosis Flow for Industrial SRAMs. | Tien-Phu Ho, Eric Faehn, Arnaud Virazel, Alberto Bosio, Patrick Girard |
501–525 of 4,920← PreviousNext →
Comparable venues
Other A*/A conferences filed under the same field of research.
- ADATEDesign, Automation and Test in Europe Conference
- A*DACDesign Automation Conf
- ASCInternational Conference for High Performance Computing, Networking, Storage and Analysis (was Supercomputing Conference)
- AICCADIEEE/ACM International Conference on Computer-Aided Design
- A*ISCAACM International Symposium on Computer Architecture
- A*MICROInternational Symposium on Microarchitecture
- AISLPEDIEEE/ACM International Symposium on Low Power Electronics and Design
- AICSACM International Conference on Supercomputing