| 2017 | Automotive keynote: Look Mom! No hands! | Joachim Kunkel |
| 2017 | Diagnosing multiple faulty chains with low pin convolution compressor using compressed production test set. | Subhadip Kundu, Kuldip Kumar, Rishi Kumar, Rohit Kapur |
| 2017 | Advanced functional safety mechanisms for embedded memories and IPs in automotive SoCs. | Tal Kogan, Yehonatan Abotbol, Gabriele Boschi, Gurgen Harutyunyan, I. Kroul, Hanna Shaheen, Yervant Zorian |
| 2017 | Testing beyond the green light. | Bob Klosterboer |
| 2017 | Symbol-based health-status analysis in a core router system. | Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu |
| 2017 | Changepoint-based anomaly detection in a core router system. | Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu |
| 2017 | An on-chip ADC BIST solution and the BIST enabled calibration scheme. | Xiankun Jin, Tao Chen, Mayank Jain, Arun Kumar Barman, David Kramer, Doug Garrity, Randall L. Geiger, Degang Chen |
| 2017 | Built-in self-test for stability measurement of low dropout regulator. | Jae Woong Jeong, Ender Yilmaz, LeRoy Winemberg, Sule Ozev |
| 2017 | Low cost dynamic error detection in linearity testing of SAR ADCs. | Nimit Jain, Nitin Agarwal, Rajavelu Thinakaran, Rubin A. Parekhji |
| 2017 | A jitter separation and BER estimation method for asymmetric total jitter distributions. | Masahiro Ishida, Kiyotaka Ichiyama |
| 2017 | A run-pause-resume silicon debug technique with cycle granularity for multiple clock domain systems. | Shuo-Lian Hong, Kuen-Jong Lee |
| 2017 | Analysis and mitigation or IR-Drop induced scan shift-errors. | Stefan Holst, Eric Schneider, Koshi Kawagoe, Michael A. Kochte, Kohei Miyase, Hans-Joachim Wunderlich, Seiji Kajihara, Xiaoqing Wen |
| 2017 | Increasing IJTAG bandwidth and managing security through parallel locking-SIBs. | Saurabh Gupta, Al Crouch, Jennifer Dworak, Daniel Engels |
| 2017 | Improvement of the tolerated raw bit error rate in NAND flash-based SSDs with the help of embedded statistics. | Valentin Gherman, Emna Farjallah, Jean-Marc Armani, Marcelino Seif, Luigi Dilillo |
| 2017 | Non-intrusive detection of defects in mixed-signal integrated circuits using light activation. | Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen |
| 2017 | Run-time hardware trojan detection using performance counters. | Rana Elnaggar, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori |
| 2017 | Fault tolerant electronic system design. | Boyang Du, Luca Sterpone |
| 2017 | Maximizing scan pin and bandwidth utilization with a scan routing fabric. | Yan Dong, Grady Giles, GuoLiang Li, Jeff Rearick, John Schulze, James Wingfield, Tim Wood |
| 2017 | Cross-layer refresh mitigation for efficient and reliable DRAM systems: A comparative study. | Xiaoan Ding, Xi Liang, Yanjing Li |
| 2017 | Concurrent built in test and tuning of beamforming MIMO systems using learning assisted performance optimization. | Sabyasachi Deyati, Barry J. Muldrey, Byunghoo Jung, Abhijit Chatterjee |
| 2017 | High throughput multiple device diagnosis system. | Sameer Chillarige, Anil Malik, Sharjinder Singh, Joe Swenton, Krishna Chakravadhanula |
| 2017 | Advancing test compression to the physical dimension. | Krishna Chakravadhanula, Vivek Chickermane, Paul Cunningham, Brian Foutz, Dale Meehl, Louis Milano, Christos Papameletis, David Scott, Steev Wilcox |
| 2017 | Fault simulation acceleration for TRAX dictionary construction using GPUs. | Matthew Beckler, Ronald D. Blanton |
| 2017 | Layout-aware 2-step window-based pattern reordering for fast bridge/open test generation. | Masayuki Arai, Shingo Inuyama, Kazuhiko Iwasaki |
| 2016 | Low cost ultra-pure sine wave generation with self calibration. | Yuming Zhuang, Akhilesh Kesavan Unnithan, Arun Joseph, Siva Sudani, Benjamin Magstadt, Degang Chen |