| 2016 | What we know after twelve years developing and deploying test data analytics solutions. | Kenneth M. Butler, Amit Nahar, W. Robert Daasch |
| 2016 | Efficient cross-layer concurrent error detection in nonlinear control systems using mapped predictive check states. | Suvadeep Banerjee, Abhijit Chatterjee, Jacob A. Abraham |
| 2016 | SERDES external loopback test using production parametric-test hardware. | Shalini Arora, Aman Aflaki, Sounil Biswas, Masashi Shimanouchi |
| 2016 | Known-good-die test methods for large, thin, high-power digital devices. | Dave Armstrong, Gary Maier |
| 2016 | A novel diagnostic test generation methodology and its application in production failure isolation. | M. Enamul Amyeen, Dongok Kim, Maheshwar Chandrasekar, Mohammad Noman, Srikanth Venkataraman, Anurag Jain, Neha Goel, Ramesh Sharma |
| 2016 | Recycled FPGA detection using exhaustive LUT path delay characterization. | Md. Mahbub Alam, Mark Tehranipoor, Domenic Forte |
| 2016 | Harnessing process variations for optimizing wafer-level probe-test flow. | Ali Ahmadi, Constantinos Xanthopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris |
| 2015 | FASTrust: Feature analysis for third-party IP trust verification. | Song Yao, Xiaoming Chen, Jie Zhang, Qiaoyi Liu, Jia Wang, Qiang Xu, Yu Wang, Huazhong Yang |
| 2015 | Testing methods for quaternary content addressable memory using charge-sharing sensing scheme. | Hao-Yu Yang, Rei-Fu Huang, Chin-Lung Su, Kuan-Hong Lin, Hang-Kaung Shu, Chi-Wei Peng, Mango Chia-Tso Chao |
| 2015 | A new method for measuring alias-free aperture jitter in an ADC output. | Takahiro J. Yamaguchi, Katsuhiko Degawa, Masayuki Kawabata, Masahiro Ishida, Koichiro Uekusa, Mani Soma |
| 2015 | Rapid prototyping and test before silicon of integrated pressure sensors. | Adrian I. Voinea, Stefan Kampfer |
| 2015 | Test-access-mechanism optimization for multi-Vdd SoCs. | Fotios Vartziotis, Xrysovalantis Kavousianos, Panagiotis Georgiou, Krishnendu Chakrabarty |
| 2015 | Extending residue-based fault tolerance to encrypted computation. | Nektarios Georgios Tsoutsos, Michail Maniatakos |
| 2015 | Monitoring the delay of long interconnects via distributed TDC. | Meng-Ting Tsai, Shi-Yu Huang, Kun-Han Tsai, Wu-Tung Cheng |
| 2015 | How many probes is enough? A low cost method for probe card depopulation with low risk. | Kevin Tiernan, Snehamay Sinha, Lily Pang, Robert Williams, Ken Delling |
| 2015 | Information-theoretic and statistical methods of failure log selection for improved diagnosis. | Sarmad Tanwir, Sarvesh Prabhu, Michael S. Hsiao, Loganathan Lingappan |
| 2015 | Streaming fast access to ADCs and DACs for mixed-signal ATPG. | Stephen K. Sunter, Jean-Francois Cote, Jeff Rearick |
| 2015 | Evaluation of low-cost mixed-signal test techniques for circuits with long simulation times. | Haralampos-G. D. Stratigopoulos, Manuel J. Barragn, Salvador Mir, Herv Le Gall, Neha Bhargava, Ankur Bal |
| 2015 | Generalization of an outlier model into a "global" perspective. | Sebastian Siatkowski, Chia-Ling Chang, Li-C. Wang, Nikolas Sumikawa, LeRoy Winemberg, W. Robert Daasch |
| 2015 | A DLL-based test solution for through silicon via (TSV) in 3D-stacked ICs. | Rashid Rashidzadeh, Esrafil Jedari, Tareq Muhammad Supon, Vladimir Mashkovtsev |
| 2015 | Platform IO and system memory test using L3 cache based test (CBT) and parallel execution of CPGC Intel BIST engine. | Bruce Querbach, Tan Peter Yanyang, Lovelace Van, David Blankenbeckler, Rahul Khanna, Sudeep Puligundla, Patrick Chiang |
| 2015 | A case study: Leverage IEEE 1687 based method to automate modeling, verification, and test access for embedded instruments in a server processor. | Tassanee Payakapan, Senwen Kan, Ken Pham, Kathy Yang, Jean-Francois Cote, Martin Keim, Jennifer Dworak |
| 2015 | eRNA: Refining of reconstructed digital waveform. | Hideo Okawara |
| 2015 | Optimizing delay tests at the memory boundary. | Kelly A. Ockunzzi, Michael R. Ouellette, Kevin W. Gorman |
| 2015 | Cross-layer approaches for an aging-aware design of nanoscale microprocessors: Dissertation summary: IEEE TTTC E.J. McCluskey doctoral thesis award competition finalist. | Fabian Oboril, Mehdi Baradaran Tahoori |