| 2016 | DE-LOC: Design validation and debugging under limited observation and control, pre- and post-silicon for mixed-signal systems. | Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee |
| 2016 | Test point insertion in hybrid test compression/LBIST architectures. | Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada |
| 2016 | Test chip design for optimal cell-aware diagnosability. | Soumya Mittal, Zeye Liu, Ben Niewenhuis, R. D. (Shawn) Blanton |
| 2016 | Minimal area test points for deterministic patterns. | Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Sudhakar M. Reddy, Janusz Rajski, Jerzy Tyszer |
| 2016 | Diagnostic resolution improvement through learning-guided physical failure analysis. | Carlston Lim, Yang Xue, Xin Li, Ronald D. Blanton, M. Enamul Amyeen |
| 2016 | Built-in self-test for micro-electrode-dot-array digital microfluidic biochips. | Zipeng Li, Kelvin Yi-Tse Lai, Po-Hsien Yu, Krishnendu Chakrabarty, Tsung-Yi Ho, Chen-Yi Lee |
| 2016 | Defect tolerance for CNFET-based SRAMs. | Tianjian Li, Li Jiang, Xiaoyao Liang, Qiang Xu, Krishnendu Chakrabarty |
| 2016 | Output bit selection methodology for test response compaction. | Wei-Cheng Lien, Kuen-Jong Lee |
| 2016 | An on-chip self-test architecture with test patterns recorded in scan chains. | Kuen-Jong Lee, Pin-Hao Tang, Michael A. Kochte |
| 2016 | Handling wrong mapping: A new direction towards better diagnosis with low pin convolution compressors. | Subhadip Kundu, Parthajit Bhattacharya, Rohit Kapur |
| 2016 | Machine learning-based defense against process-aware attacks on Industrial Control Systems. | Anastasis Keliris, Hossein Salehghaffari, Brian R. Cairl, Prashanth Krishnamurthy, Michail Maniatakos, Farshad Khorrami |
| 2016 | Supply-voltage optimization to account for process variations in high-volume manufacturing testing. | Gurunath Kadam, Markus Rudack, Krishnendu Chakrabarty, Juergen Alt |
| 2016 | Active reliability monitor: Defect level extrinsic reliability monitoring on 22nm POWER8 and zSeries processors. | Michael Johnson, Brian Noble, Mark Johnson, Jim Crafts, Cynthia Manya, John Deforge |
| 2016 | Accurate anomaly detection using correlation-based time-series analysis in a core router system. | Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu |
| 2016 | Advanced test methodology for complex SoCs. | Pavan Kumar Datla Jagannadha, Mahmut Yilmaz, Milind Sonawane, Sailendra Chadalavada, Shantanu Sarangi, Bonita Bhaskaran, Ayub Abdollahian |
| 2016 | Variation and failure characterization through pattern classification of test data from multiple test stages. | Chun-Kai Hsu, Peter Sarson, Gregor Schatzberger, Friedrich Peter Leisenberger, John M. Carulli Jr., Siddhartha Siddhartha, Kwang-Ting Cheng |
| 2016 | A built-in self-repair scheme for DRAMs with spare rows, columns, and bits. | Chih-Sheng Hou, Yong-Xiao Chen, Jin-Fu Li, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou |
| 2016 | Keynote address Thursday: Addressing semiconductor industry needs: Defining the future through creative, exciting research. | Ken Hansen |
| 2016 | Logic characterization vehicle design reflection via layout rewiring. | Phillip Fynan, Zeye Liu, Benjamin Niewenhuis, Soumya Mittal, Marcin Strajwas, R. D. (Shawn) Blanton |
| 2016 | RF test accuracy and capacity enhancement on ATE for silicon TV tuners. | Y. Fan, A. Verma, Y. Su, L. Rose, J. Janney, V. Do, S. Kumar |
| 2016 | Effective DC fault models and testing approach for open defects in analog circuits. | Baris Esen, Anthony Coyette, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren |
| 2016 | Analog fault coverage improvement using final-test dynamic part average testing. | Wim Dobbelaere, Ronny Vanhooren, Willy De Man, Koen Matthijs, Anthony Coyette, Baris Esen, Georges G. E. Gielen |
| 2016 | A reconfigurable built-in memory self-repair architecture for heterogeneous cores with embedded BIST datapath. | V. R. Devanathan, Sumant Kale |
| 2016 | Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis. | Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen |
| 2016 | An accurate algorithm for computing mutation coverage in model checking. | Huina Chao, Huawei Li, Tiancheng Wang, Xiaowei Li, Bo Liu |