| 2015 | A deterministic BIST scheme based on EDT-compressed test patterns. | Grzegorz Mrugalski, Janusz Rajski, Lukasz Rybak, Jedrzej Solecki, Jerzy Tyszer |
| 2015 | Electrical package defect testing for volume production. | Xue Ming, Koelz Johann, Lee Chow York, Lee Kwan Wee, Shi Zhi Min |
| 2015 | Developing a modern platform for test engineering - Introducing the origen semiconductor developer's kit. | Stephen McGinty, Daniel Hadad, Chris Nappi, Brian Caquelin |
| 2015 | Automated testing of bare die-to-die stacks. | Erik Jan Marinissen, Bart De Wachter, Teng Wang, Jens Fiedler, Jorg Kiesewetter, Karsten Stoll |
| 2015 | A comparative study of one-shot statistical calibration methods for analog / RF ICs. | Yichuan Lu, Kiruba S. Subramani, He Huang, Nathan Kupp, Ke Huang, Yiorgos Makris |
| 2015 | Tolerance analysis of fixture fabrication, from drilling holes to pointing accuracy. | An-Jim Long, David Tsai, Kent Lien, Steve Hsu |
| 2015 | Concurrent hardware Trojan detection in wireless cryptographic ICs. | Yu Liu, Georgios Volanis, Ke Huang, Yiorgos Makris |
| 2015 | A structured approach to post-silicon validation and debug using symbolic quick error detection. | David Lin, Eshan Singh, Clark W. Barrett, Subhasish Mitra |
| 2015 | On generating high quality tests based on cell functions. | Xijiang Lin, Sudhakar M. Reddy |
| 2015 | AdaTest: An efficient statistical test framework for test escape screening. | Fan Lin, Chun-Kai Hsu, Kwang-Ting Cheng |
| 2015 | Efficient observation-point insertion for diagnosability enhancement in digital circuits. | Zipeng Li, Sandeep Kumar Goel, Frank Lee, Krishnendu Chakrabarty |
| 2015 | Access time minimization in IEEE 1687 networks. | Rene Krenz-Baath, Farrokh Ghani Zadegan, Erik Larsson |
| 2015 | Hardware in loop testing of an insulin pump. | Sriram Karunagaran, Karuna P. Sahoo, Masahiro Fujita |
| 2015 | Modeling the future of semiconductors (and test!). | Andrew B. Kahng |
| 2015 | Yield and reliability enhancement for 3D ICs: Dissertation summary: IEEE TTTC E.J. McCluskey doctoral thesis award competition finalist. | Li Jiang, Qiang Xu |
| 2015 | On diagnosable and tunable 3D clock network design for lifetime reliability enhancement. | Li Jiang, Pu Pang, Naifeng Jing, Sung Kyu Lim, Xiaoyao Liang, Qiang Xu |
| 2015 | A self-compensating built-in self-test solution for RF phased array mismatch. | Jae Woong Jeong, Jennifer Kitchen, Sule Ozev |
| 2015 | An ATE system for testing 2.4-GHz RF digital communication devices with QAM signal interfaces. | Masahiro Ishida, Kiyotaka Ichiyama |
| 2015 | Stochastic timing error rate estimation under process and temporal variations. | Shoichi Iizuka, Yutaka Masuda, Masanori Hashimoto, Takao Onoye |
| 2015 | Hardware Trojans hidden in RTL don't cares - Automated insertion and prevention methodologies. | Nicole Fern, Shrikant Kulkarni, Kwang-Ting (Tim) Cheng |
| 2015 | Stepped parity: A low-cost multiple bit upset detection technique. | Mojtaba Ebrahimi, Mehdi Baradaran Tahoori |
| 2015 | A general testing method for digital microfluidic biochips under physical constraints. | Trung Anh Dinh, Shigeru Yamashita, Tsung-Yi Ho, Krishnendu Chakrabarty |
| 2015 | Test and debug solutions for 3D-stacked integrated circuits. | Sergej Deutsch, Krishnendu Chakrabarty |
| 2015 | Contactless pre-bond TSV fault diagnosis using duty-cycle detectors and ring oscillators. | Sergej Deutsch, Krishnendu Chakrabarty |
| 2015 | Can we ensure reliability in the era of heterogeneous integration? | William R. Bottoms |