| 2014 | Recruiting distributed resources for grid resilience: The need for transparency. | Alexandra von Meier |
| 2014 | Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface. | Erik Jan Marinissen, Bart De Wachter, Ken Smith, Jorg Kiesewetter, Mottaqiallah Taouil, Said Hamdioui |
| 2014 | Vesuvius-3D: A 3D-DfT demonstrator. | Erik Jan Marinissen, Bart De Wachter, Stephen O'Loughlin, Sergej Deutsch, Christos Papameletis, Tobias Burgherr |
| 2014 | Interposer test: Testing PCBs that have shrunk 100x. | T. M. Mak |
| 2014 | Feature engineering with canonical analysis for effective statistical tests screening test escapes. | Fan Lin, Chun-Kai Hsu, Kwang-Ting Cheng |
| 2014 | Redundancy architectures for channel-based 3D DRAM yield improvement. | Bing-Yang Lin, Wan-Ting Chiang, Cheng-Wen Wu, Mincent Lee, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang |
| 2014 | Yield and performance improvement through technology-design co-optimization in advanced technology nodes. | Yue Liang |
| 2014 | An efficient diagnosis-aware pattern generation procedure for transition faults. | Kuen-Jong Lee, Cheng-Hung Wu |
| 2014 | Protecting against emerging vmin failures in advanced technology nodes. | J. K. Jerry Lee, Amr Haggag, William Eklow |
| 2014 | Thermal-aware mobile SoC design and test in 14nm finfet technology. | Bong Hyun Lee |
| 2014 | Emulation and its connection to test. | Kenneth Larsen |
| 2014 | Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening. | Andreas Kux, Rudolf Ullmann, Thomas Kern, Roland Strunz, Hanno Melzner, Stephan Beuven, Andreas Haase |
| 2014 | Isometric test compression with low toggling activity. | Amit Kumar, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang |
| 2014 | Efficient testing of hierarchical core-based SOCs. | Brion L. Keller, Krishna Chakravadhanula, Brian Foutz, Vivek Chickermane, Akhil Garg, Richard Schoonover, James Sage, Don Pearl, Thomas J. Snethen |
| 2014 | Efficient RAS support for die-stacked DRAM. | Hyeran Jeon, Gabriel H. Loh, Murali Annavaram |
| 2014 | Statistical silicon results of dynamic power integrity control of ATE for eliminating overkills and underkills. | Masahiro Ishida, Takashi Kusaka, Toru Nakura, Satoshi Komatsu, Kunihiro Asada |
| 2014 | Error prediction and detection methodologies for reliable circuit operation under NBTI. | Julio Vazquez Hernandez |
| 2014 | FAST-BIST: Faster-than-at-Speed BIST targeting hidden delay defects. | Sybille Hellebrand, Thomas Indlekofer, Matthias Kampmann, Michael A. Kochte, Chang Liu, Hans-Joachim Wunderlich |
| 2014 | On the testing of hazard activated open defects. | Chao Han, Adit D. Singh |
| 2014 | Comparing the effectiveness of cache-resident tests against cycleaccurate deterministic functional patterns. | Sankar Gurumurthy, Mustansir Pratapgarhwala, Curtis Gilgan, Jeff Rearick |
| 2014 | Design and test of analog circuits towards sub-ppm level. | Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Baris Esen |
| 2014 | Big data and test. | Anne Gattiker |
| 2014 | Efficient SAT-based ATPG techniques for all multiple stuck-at faults. | Masahiro Fujita, Alan Mishchenko |
| 2014 | Market opportunities and testing challenges for millimeter-wave radios and radars. | Brian A. Floyd |
| 2014 | Testing silicon TV tuners on ATE without TV signal generator. | Y. Fan, A. Verma, J. Janney, S. Kumar |