| 2014 | Test pattern generation in presence of unknown values based on restricted symbolic logic. | Dominik Erb, Karsten Scheibler, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker |
| 2014 | A Tag based solution for efficient utilization of efuse for memory repair. | Harsharaj Ellur, Kalpesh Shah |
| 2014 | Board security enhancement using new locking SIB-based architectures. | Jennifer Dworak, Zoe Conroy, Alfred L. Crouch, John C. Potter |
| 2014 | Massive signal tracing using on-chip DRAM for in-system silicon debug. | Sergej Deutsch, Krishnendu Chakrabarty |
| 2014 | Low-cost phase noise testing of complex RF ICs using standard digital ATE. | Stephane David-Grignot, Florence Azas, Laurent Latorre, Francois Lefevre |
| 2014 | Delivering security by design in the Internet of Things. | Bill Curtis |
| 2014 | Soft error resiliency characterization and improvement on IBM BlueGene/Q processor using accelerated proton irradiation. | Chen-Yong Cher, K. Paul Muller, Ruud A. Haring, David L. Satterfield, Thomas E. Musta, Thomas Gooding, Kristan D. Davis, Marc Boris Dombrowa, Gerard V. Kopcsay, Robert M. Senger, Yutaka Sugawara, Krishnan Sugavanam |
| 2014 | Wafer Level Chip Scale Package copper pillar probing. | Hao Chen, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang |
| 2014 | Optimizing redundancy design for chip-multiprocessors for flexible utility functions. | Da Cheng, Sandeep K. Gupta |
| 2014 | The case for analyzing system level failures using structural patterns. | Harry H. Chen |
| 2014 | Divide and conquer diagnosis for multiple defects. | Shih-Min Chao, Po-Juei Chen, Jing-Yu Chen, Po-Hao Chen, Ang-Feng Lin, James Chien-Mo Li, Pei-Ying Hsueh, Chun-Yi Kuo, Ying-Yen Chen, Jih-Nung Li |
| 2014 | Analysis and test of the effects of single event upsets affecting the configuration memory of SRAM-based FPGAs. | Luca Cassano |
| 2014 | Fault sharing in a copy-on-write based ATPG system. | X. Cai, Peter Wohl, Daniel Martin |
| 2014 | Compositional verification using formal analysis for a flight critical system. | Guillaume Brat |
| 2014 | Trading-off on-die observability for cache minimum supply voltage reduction in system-on-chip (SoC) processors. | Keith A. Bowman, Alex Park, Venkat Narayanan, Francois Atallah, Alain Artieri, Sei Seung Yoon, Kendrick Yuen, David Hansquine |
| 2014 | Concerns over predictability of supply and quality. | Carl Bowen |
| 2014 | Energy-secure computer architectures. | Pradip Bose |
| 2014 | Logic characterization vehicle design for maximal information extraction for yield learning. | Ronald D. Blanton, Ben Niewenhuis, Carl Taylor |
| 2014 | Read disturb fault detection in STT-MRAM. | Rajendra Bishnoi, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori |
| 2014 | The desire-friction ratio of Adaptive test. | Stacy Ajouri |
| 2014 | Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation. | Ali Ahmadi, Ke Huang, Suriyaprakash Natarajan, John M. Carulli Jr., Yiorgos Makris |
| 2014 | A distributed, reconfigurable, and reusable bist infrastructure for 3D-stacked ICs. | Mukesh Agrawal, Krishnendu Chakrabarty, Bill Eklow |
| 2014 | The importance of DFX, a foundry perspective. | Saman Adham, Jonathan Chang, Hung-Jen Liao, John Hung, Ting-Hua Hsieh |
| 2014 | Low-distortion signal generation for ADC testing. | Fumitaka Abe, Yutaro Kobayashi, Kenji Sawada, Keisuke Kato, Osamu Kobayashi, Haruo Kobayashi |
| 2013 | On the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs. | Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine |