| 2012 | "Managing process variance in analog designs". | Eugene R. Atwood |
| 2012 | DC temperature measurements for power gain monitoring in RF power amplifiers. | Josep Altet, Diego Mateo, Didac Gmez, Xavier Perpi, Miquel Vellveh, Xavier Jord |
| 2012 | FPGA-based synthetic instrumentation for board test. | Igor Aleksejev, Artur Jutman, Sergei Devadze, Sergei Odintsov, Thomas Wenzel |
| 2012 | A dynamic programming solution for optimizing test delivery in multicore SOCs. | Mukesh Agrawal, Michael Richter, Krishnendu Chakrabarty |
| 2012 | Experiences with non-intrusive sensors for RF built-in test. | Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Christophe Kelma |
| 2011 | Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks. | Zhaobo Zhang, Krishnendu Chakrabarty, Zhanglei Wang, Zhiyuan Wang, Xinli Gu |
| 2011 | Challenges and best practices in advanced silicon debug. | Jing Zeng |
| 2011 | Faster-than-at-speed test for increased test quality and in-field reliability. | Tomokazu Yoneda, Keigo Hori, Michiko Inoue, Hideo Fujiwara |
| 2011 | Adaptive multidimensional outlier analysis for analog and mixed signal circuits. | Ender Yilmaz, Sule Ozev, Kenneth M. Butler |
| 2011 | Online timing variation tolerance for digital integrated circuits. | Guihai Yan, Xiaowei Li |
| 2011 | A novel scan segmentation design method for avoiding shift timing failure in scan testing. | Yuta Yamato, Xiaoqing Wen, Michael A. Kochte, Kohei Miyase, Seiji Kajihara, Laung-Terng Wang |
| 2011 | Application of a continuous-time level crossing quantization method for timing noise measurements. | Takahiro J. Yamaguchi, Mani Soma, Takafumi Aoki, Yasuo Furukawa, Katsuhiko Degawa, Kunihiro Asada, Mohamed Abbas, Satoshi Komatsu |
| 2011 | Test clock domain optimization for peak power supply noise reduction during scan. | Jen-Yang Wen, Yu-Chuan Huang, Min-Hong Tsai, Kuan-Yu Liao, James Chien-Mo Li, Ming-Tung Chang, Min-Hsiu Tsai, Chih-Mou Tseng, Hung-Chun Li |
| 2011 | Lithography aware critical area estimation and yield analysis. | Priyamvada Vijayakumar, Vikram B. Suresh, Sandip Kundu |
| 2011 | A Software-Based Self-Test methodology for on-line testing of processor caches. | George Theodorou, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos |
| 2011 | Physically-aware analysis of systematic defects in integrated circuits. | Wing Chiu Tam, R. D. (Shawn) Blanton |
| 2011 | Actual implementation of multi domain test: Further reduction of cost of test. | Yasuhiro Takahashi, Akinori Maeda, Mitsuhiro Ogura |
| 2011 | Adaptive parametric BIST of high-speed parallel I/Os via standard boundary scan. | Stephen K. Sunter, Aubin Roy |
| 2011 | Forward prediction based on wafer sort data - A case study. | Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir |
| 2011 | A novel robust and accurate spectral testing method for non-coherent sampling. | Siva Sudani, Minshun Wu, Degang Chen |
| 2011 | Evaluation of TSV and micro-bump probing for wide I/O testing. | Ken Smith, Peter Hanaway, Mike Jolley, Reed Gleason, Eric Strid, Tom Daenen, Luc Dupas, Bruno Knuts, Erik Jan Marinissen, Marc Van Dievel |
| 2011 | A systems perspective on the R&D of industrial technology. | Jyuo-Min Shyu |
| 2011 | Partial state monitoring for fault detection estimation. | Yiwen Shi, Kantapon Kaewtip, Wan-Chan Hu, Jennifer Dworak |
| 2011 | A novel Test Access Mechanism for failure diagnosis of multiple isolated identical cores. | Manish Sharma, Avijit Dutta, Wu-Tung Cheng, Brady Benware, Mark Kassab |
| 2011 | End-to-end error correction and online diagnosis for on-chip networks. | Saeed Shamshiri, Amirali Ghofrani, Kwang-Ting Cheng |