| 2012 | 8Gbps CMOS pin electronics hardware macro with simultaneous bi-directional capability. | Shoji Kojima, Yasuyuki Arai, Tasuku Fujibe, Tsuyoshi Ataka, Atsushi Ono, Ken-ichi Sawada, Daisuke Watanabe |
| 2012 | BS 1149.1 extensions for an online interconnect fault detection and recovery. | Somayeh Sadeghi Kohan, Majid Namaki-Shoushtari, Fatemeh Javaheri, Zainalabedin Navabi |
| 2012 | In-system constrained-random stimuli generation for post-silicon validation. | Adam B. Kinsman, Ho Fai Ko, Nicola Nicolici |
| 2012 | Methodology for fault grading high speed I/O interfaces used in complex Graphics Processing Unit. | Animesh Khare, P. Kishore, S. Reddy, K. Rajan, A. Sanghani |
| 2012 | Multi-gigahertz arbitrary timing generator and data pattern serializer/formatter. | David C. Keezer, Te-Hui Chen, Carl Edward Gray, Hyun Woo Choi, Sungyeol Kim, Seongkwan Lee, Hosun Yoo |
| 2012 | Functional test content optimization for peak-power validation - An experimental study. | Vinayak Kamath, Wen Chen, Nik Sumikawa, Li-C. Wang |
| 2012 | RNA: Advanced phase tracking method for digital waveform reconstruction. | Takashi Ito, Hideo Okawara, Jinlei Liu |
| 2012 | Power integrity control of ATE for emulating power supply fluctuations on customer environment. | Masahiro Ishida, Toru Nakura, Toshiyuki Kikkawa, Takashi Kusaka, Satoshi Komatsu, Kunihiro Asada |
| 2012 | Real-time testing method for 16 Gbps 4-PAM signal interface. | Masahiro Ishida, Kiyotaka Ichiyama, Daisuke Watanabe, Masayuki Kawabata, Toshiyuki Okayasu |
| 2012 | Calibration of a flexible high precision Power-On Reset during production test. | Gerald Hilber, Dominik Gruber, Michael Sams, Timm Ostermann |
| 2012 | Cell-aware Production test results from a 32-nm notebook processor. | Friedrich Hapke, Michael Reese, Jason Rivers, A. Over, V. Ravikumar, Wilfried Redemund, Andreas Glowatz, Jrgen Schlffel, Janusz Rajski |
| 2012 | Are industrial test problems real problems? I thought research has resolved them all! | Xinli Gu |
| 2012 | Adaptive test selection for post-silicon timing validation: A data mining approach. | Ming Gao, Peter Lisherness, Kwang-Ting (Tim) Cheng |
| 2012 | Improved volume diagnosis throughput using dynamic design partitioning. | Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Brady Benware |
| 2012 | A digital method for phase noise measurement. | Allan Ecker, Kenneth Blakkan, Mani Soma |
| 2012 | A frequency measurement BIST implementation targeting gigahertz application. | Matthieu Dubois, Emeric de Foucauld, Christopher Mounet, Serigne Dia, Cedric Mayor |
| 2012 | On-die instrumentation to solve challenges for 28nm, 28Gbps timing variability and stressing. | Weichi Ding, Mingde Pan, Wilson Wong, Daniel Chow, Mike Peng Li, Sergey Y. Shumarayev |
| 2012 | DfT architecture and ATPG for Interconnect tests of JEDEC Wide-I/O memory-on-logic die stacks. | Sergej Deutsch, Brion L. Keller, Vivek Chickermane, Subhasish Mukherjee, Navdeep Sood, Sandeep Kumar Goel, Ji-Jan Chen, Ashok Mehta, Frank Lee, Erik Jan Marinissen |
| 2012 | Testing high-frequency and low-power designs: Do the standard rules and tools apply? | Scott Davidson |
| 2012 | Low power test application with selective compaction in VLSI designs. | Dariusz Czysz, Janusz Rajski, Jerzy Tyszer |
| 2012 | Board assisted-BIST: Long and short term solutions for testpoint erosion - Reaching into the DFx toolbox. | Zoe Conroy, James J. Grealish, Harrison Miles, Anthony J. Suto, Alfred L. Crouch, Skip Meyers |
| 2012 | Are the IC guys helping or hindering board test? | Zoe Conroy |
| 2012 | On-chip diagnosis for early-life and wear-out failures. | Matthew Beckler, R. D. (Shawn) Blanton |
| 2012 | Modeling, verification and pattern generation for reconfigurable scan networks. | Rafal Baranowski, Michael A. Kochte, Hans-Joachim Wunderlich |
| 2012 | Making predictive analog/RF alternate test strategy independent of training set size. | Haithem Ayari, Florence Azas, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell |