IEEE International Test Conference
ITC
A
CORE rank
CORE rank (raw)
A
Fields of research
Computer Systems Engineering
Papers indexed
4,920
1981–2025
Papers per year
1981207 peak2025
Most published authors
ITC papers
4,920 records sourced from DBLP. Search titles, filter by year, sort by recency.
| Year | Title | Authors |
|---|---|---|
| 2010 | Dynamic channel allocation for higher EDT compression in SoC designs. | Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jakub Janicki, Jerzy Tyszer |
| 2010 | Precision audio nulling instrumentation achieves near -140dB measurements in a production environment. | Carl Karandjeff, Chris Hannaford |
| 2010 | Using context based methods for test data compression. | Sara Karamati, Zainalabedin Navabi |
| 2010 | RADPro: Automatic RF analyzer and diagnostic program generation tool. | Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzlar, Richard Antley, Craig Force, Falah Mohammed |
| 2010 | A MEMS based device interface board. | Nabeeh Kandalaft, Iftekhar Ibne Basith, Rashid Rashidzadeh |
| 2010 | Modeling TSV open defects in 3D-stacked DRAM. | Li Jiang, Yuxi Liu, Lian Duan, Yuan Xie, Qiang Xu |
| 2010 | Redundant core testing on the cell BE microprocessor. | David Iverson, Dan Dickinson, John Masson, Christina Newman-LaBounty, Daniel Simmons, William Tanona |
| 2010 | Detecting memory faults in the presence of bit line coupling in SRAM devices. | Sandra Irobi, Zaid Al-Ars, Said Hamdioui |
| 2010 | Case study of scan chain diagnosis and PFA on a low yield wafer. | Yu Huang, Brady Benware, Wu-Tung Cheng, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen |
| 2010 | QED: Quick Error Detection tests for effective post-silicon validation. | Ted Hong, Yanjing Li, Sung-Boem Park, Diana Mui, David Lin, Ziyad Abdel Kaleq, Nagib Hakim, Helia Naeimi, Donald S. Gardner, Subhasish Mitra |
| 2010 | Principal Component Analysis-based compensation for measurement errors due to mechanical misalignments in PCB testing. | Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird |
| 2010 | On generation of a universal path candidate set containing testable long paths. | Zijian He, Tao Lv, Huawei Li, Xiaowei Li |
| 2010 | Defect-oriented cell-internal testing. | Friedrich Hapke, Wilfried Redemund, Jrgen Schlffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger |
| 2010 | A roaming memory test bench for detecting particle induced SEUs. | Jean-Marc Gallire, Paolo Rech, Patrick Girard, Luigi Dilillo |
| 2010 | MT-SBST: Self-test optimization in multithreaded multicore architectures. | Nikos Foutris, Mihalis Psarakis, Dimitris Gizopoulos, Andreas Apostolakis, Xavier Vera, Antonio Gonzlez |
| 2010 | A new method for estimating spectral performance of ADC from INL. | Jingbo Duan, Le Jin, Degang Chen |
| 2010 | Automated test program generation for automotive devices. | Anke Drappa, Peter Huber, Jon Vollmar |
| 2010 | Multiple fault activation cycle tests for transistor stuck-open faults. | Narendra Devta-Prasanna, Arun Gunda, Sudhakar M. Reddy, Irith Pomeranz |
| 2010 | Clock Gate Test Points. | Narendra Devta-Prasanna, Arun Gunda |
| 2010 | Towards effective and compression-friendly test of memory interface logic. | V. R. Devanathan, Alan Hales, Sumant Kale, Dharmesh Sonkar |
| 2010 | Hard to find, easy to find systematics; just find them. | Rao Desineni, Leah Pastel, Maroun Kassab, Robert Redburn |
| 2010 | Mutation-based diagnostic test generation for hardware design error diagnosis. | Shujun Deng, Kwang-Ting Cheng, Jinian Bian, Zhiqiu Kong |
| 2010 | Post-manufacturing ECC customization based on Orthogonal Latin Square codes and its application to ultra-low power caches. | Rudrajit Datta, Nur A. Touba |
| 2010 | Low power compression of incompatible test cubes. | Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Przemyslaw Szczerbicki, Jerzy Tyszer |
| 2010 | AXIe: Open architecture test system standard. | Al Czamara |
1,051–1,075 of 4,920← PreviousNext →
Comparable venues
Other A*/A conferences filed under the same field of research.
- ADATEDesign, Automation and Test in Europe Conference
- A*DACDesign Automation Conf
- ASCInternational Conference for High Performance Computing, Networking, Storage and Analysis (was Supercomputing Conference)
- AICCADIEEE/ACM International Conference on Computer-Aided Design
- A*ISCAACM International Symposium on Computer Architecture
- A*MICROInternational Symposium on Microarchitecture
- AISLPEDIEEE/ACM International Symposium on Low Power Electronics and Design
- AICSACM International Conference on Supercomputing