| 2010 | Testing the IBM Power 7™ 4 GHz eight core microprocessor. | James Crafts, David Bogdan, Dennis Conti, Donato O. Forlenza, Orazio P. Forlenza, William V. Huott, Mary P. Kusko, Edward Seymour, Timothy Taylor, Brian Walsh |
| 2010 | Solutions for undetected shorts on IEEE 1149.1 self-monitoring pins. | C. J. Clark, Dave Dubberke, Kenneth P. Parker, Bill Tuthill |
| 2010 | Design and test of latch-based circuits to maximize performance, yield, and delay test quality. | Kun Young Chung, Sandeep K. Gupta |
| 2010 | Optimization of burn-in test for many-core processors through adaptive spatiotemporal power migration. | Minki Cho, Nikhil Sathe, Arijit Raychowdhury, Saibal Mukhopadhyay |
| 2010 | The AB-filling methodology for power-aware at-speed scan testing. | Tsung-Tang Chen, Po-Han Wu, Kung-Han Chen, Jiann-Chyi Rau, Shih-Ming Tzeng |
| 2010 | Mining AC delay measurements for understanding speed-limiting paths. | Janine Chen, Brendon Bolin, Li-C. Wang, Jing Zeng, Dragoljub Gagi Drmanac, Michael Mateja |
| 2010 | A kernel-based approach for functional test program generation. | Po-Hsien Chang, Li-C. Wang, Jayanta Bhadra |
| 2010 | Highly efficient parallel ATPG based on shared memory. | X. Cai, Peter Wohl, John A. Waicukauski, Pramod Notiyath |
| 2010 | A tester architecture suitable for MEMS calibration and testing. | Lyl M. Ciganda Brasca, Paolo Bernardi, Matteo Sonza Reorda, Dimitri Barbieri, Maurizio Straiotto, Luciano Bonaria |
| 2010 | A programmable BIST for DRAM testing and diagnosis. | Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Y. Zhang |
| 2010 | Practical active compensation techniques for ATE power supply response for testing of mixed signal data storage SOCs. | Suri Basharapandiyan, Yi Cai |
| 2010 | Timing skew compensation technique using digital filter with novel linear phase condition. | Koji Asami, Hiroyuki Miyajima, Tsuyoshi Kurosawa, Takenori Tateiwa, Haruo Kobayashi |
| 2010 | Evaluation techniques of frequency-dependent I/Q imbalances in wideband quadrature mixers. | Koji Asami, Toshiaki Kurihara, Yushi Inada |
| 2010 | A low-cost ATE phase signal generation technique for test applications. | Sadok Aouini, Kun Chuai, Gordon W. Roberts |
| 2010 | Improving fault diagnosis accuracy by automatic test set modification. | Luca Amati, Cristiana Bolchini, Fabio Salice, Federico Franzoso |
| 2010 | An on-line monitoring technique for electrode degradation in bio-fluidic microsystems. | Qais Al-Gayem, Hongyuan Liu, Andrew Richardson, Nick C. Burd, M. Kumar |
| 2010 | Leveraging existing power control circuits and power delivery architecture for variability measurement. | Dhruva Acharyya, Kanak Agarwal, Jim Plusquellic |
| 2010 | Soft error reliability aware placement and routing for FPGAs. | Mohammed A. Abdul-Aziz, Mehdi Baradaran Tahoori |
| 2009 | Physical defect modeling for fault insertion in system reliability test. | Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty |
| 2009 | Compression-aware pseudo-functional testing. | Feng Yuan, Qiang Xu |
| 2009 | Built-in EVM measurement for OFDM transceivers using all-digital DFT. | Ender Yilmaz, Afsaneh Nassery, Sule Ozev, Erkan Acar |
| 2009 | An economical, precise and limited access In-Circuit Test method for pulse-width modulation (PWM) circuits. | Albert Yeh, Jesse Chou, Max Lin |
| 2009 | Power and thermal constrained test scheduling. | Chunhua Yao, Kewal K. Saluja, Parameswaran Ramanathan |
| 2009 | An industrial case study for X-canceling MISR. | Joon-Sung Yang, Nur A. Touba, Shih-Yu Yang, T. M. Mak |
| 2009 | Test point insertion using functional flip-flops to drive control points. | Joon-Sung Yang, Benoit Nadeau-Dostie, Nur A. Touba |