| 2008 | An Effective and Flexible Multiple Defect Diagnosis Methodology Using Error Propagation Analysis. | Xiaochun Yu, Ronald D. Blanton |
| 2008 | SoC Test Architecture Design and Optimization Considering Power Supply Noise Effects. | Feng Yuan, Qiang Xu |
| 2008 | Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects. | Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor |
| 2008 | Diagnosis of Mask-Effect Multiple Timing Faults in Scan Chains. | Jing Ye, Fei Wang, Yu Hu, Xiaowei Li |
| 2008 | Detection of Internal Stuck-open Faults in Scan Chains. | Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz |
| 2008 | A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing. | Takahiro J. Yamaguchi, Masayuki Kawabata, Mani Soma, Masahiro Ishida, K. Sawami, Koichiro Uekusa |
| 2008 | Overview of IEEE P1450.6.2 Standard; Creating CTL Model For Memory Test and Repair. | |
| 2008 | Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing. | Meng-Fan Wu, Jiun-Lang Huang, Xiaoqing Wen, Kohei Miyase |
| 2008 | SAT-based State Justification with Adaptive Mining of Invariants. | Weixin Wu, Michael S. Hsiao |
| 2008 | A Study of Outlier Analysis Techniques for Delay Testing. | Sean H. Wu, Dragoljub Gagi Drmanac, Li-C. Wang |
| 2008 | Test-Access Solutions for Three-Dimensional SOCs. | Xiaoxia Wu, Yibo Chen, Krishnendu Chakrabarty, Yuan Xie |
| 2008 | The Test Features of the Quad-Core AMD Opteron- Microprocessor. | Tim Wood, Grady Giles, Chris Kiszely, Martin Schuessler, Daniela Toneva, Joel Irby, Michael Mateja |
| 2008 | Increasing Scan Compression by Using X-chains. | Peter Wohl, John A. Waicukauski, Frederic Neuveux |
| 2008 | Measurement Repeatability for RF Test Within the Load-board Constraints of High Density and Fine Pitch SOC Applications. | Thomas P. Warwick, Gustavo Rivera, David Waite, James Russell, Jeffrey Smith |
| 2008 | Deterministic Diagnostic Pattern Generation (DDPG) for Compound Defects. | Fei Wang, Yu Hu, Huawei Li, Xiaowei Li, Jing Ye, Yu Huang |
| 2008 | Turbo1500: Toward Core-Based Design for Test and Diagnosis Using the IEEE 1500 Standard. | Laung-Terng Wang, Ravi Apte, Shianling Wu, Boryau Sheu, Kuen-Jong Lee, Xiaoqing Wen, Wen-Ben Jone, Chia-Hsien Yeh, Wei-Shin Wang, Hao-Jan Chao, Jianghao Guo, Jinsong Liu, Yanlong Niu, Yi-Chih Sung, Chi-Chun Wang, Fangfang Li |
| 2008 | Leveraging IEEE 1641 for Tester-Independent ATE Software. | Bethany Van Wagenen, Jon Vollmar, Dan Thornton |
| 2008 | Embedded Power Delivery Decoupling in Small Form Factor Test Sockets. | Omer Vikinski, Shaul Lupo, Gregory Sizikov, Chee Yee Chung |
| 2008 | Implementation Update: Logic Mapping On SPARC- Microprocessors. | Anjali Vij, Richard Ratliff |
| 2008 | SoC Yield Improvement: Redundant Architectures to the Rescue? | Julien Vial, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |
| 2008 | The Economics of Harm Prevention through Design for Testability. | Louis Y. Ungar |
| 2008 | A Shared Parallel Built-In Self-Repair Scheme for Random Access Memories in SOCs. | Tsu-Wei Tseng, Jin-Fu Li |
| 2008 | Problems Using Boundary-Scan for Memory Cluster Tests. | Bradford G. Van Treuren, Chen-Huan Chiang, Kenneth Honaker |
| 2008 | System JTAG Initiative Group Advancements. | Bradford G. Van Treuren |
| 2008 | On-chip Programmable Capture for Accurate Path Delay Test and Characterization. | Rajeshwary Tayade, Jacob A. Abraham |