IEEE International Test Conference
ITC
A
CORE rank
CORE rank (raw)
A
Fields of research
Computer Systems Engineering
Papers indexed
4,920
1981–2025
Papers per year
1981207 peak2025
Most published authors
ITC papers
4,920 records sourced from DBLP. Search titles, filter by year, sort by recency.
| Year | Title | Authors |
|---|---|---|
| 2008 | A Hybrid A/D Converter with 120dB SNR and -125dB THD. | Mamoru Tamba |
| 2008 | Observations of Supply-Voltage-Noise Dispersion in Sub-nsec. | Kan Takeuchi, Genichi Tanaka, Hiroaki Matsushita, Kenichi Yoshizumi, Yusaku Katsuki, Takao Sato |
| 2008 | Overview of a High Speed Top Side Socket Solution. | John Stewart, Temitope Animashaun |
| 2008 | Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms. | Ganesh Srinivasan, Hui-Chuan Chao, Friedrich Taenzler |
| 2008 | Statistical Yield Modeling for Sub-wavelength Lithography. | Aswin Sreedhar, Sandip Kundu |
| 2008 | Architecture for Testing Multi-Voltage Domain SOC. | Laurent Souef, Christophe Eychenne, Emmanuel Alie |
| 2008 | An Efficient Secure Scan Design for an SoC Embedding AES Core. | Jaehoon Song, Taejin Jung, Junseop Lee, Hyeran Jeong, Byeongjin Kim, Sungju Park |
| 2008 | Optical Diagnostics for IBM POWER6- Microprocessor. | Peilin Song, Stephen Ippolito, Franco Stellari, John Sylvestri, Tim Diemoz, George Smith, Paul Muench, Norm James, Seongwon Kim, Hector Saenz |
| 2008 | Scan Based Testing of Dual/Multi Core Processors for Small Delay Defects. | Adit D. Singh |
| 2008 | Align-Encode: Improving the Encoding Capability of Test Stimulus Decompressors. | Ozgur Sinanoglu |
| 2008 | A Field Analysis of System-level Effects of Soft Errors Occurring in Microprocessors used in Information Systems. | Syed Zafar Shazli, Mohammed A. Abdul-Aziz, Mehdi Baradaran Tahoori, David R. Kaeli |
| 2008 | Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. | Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann |
| 2008 | A Cost Analysis Framework for Multi-core Systems with Spares. | Saeed Shamshiri, Peter Lisherness, Sung-Jui (Song-Ra) Pan, Kwang-Ting Cheng |
| 2008 | Frequency and Power Correlation between At-Speed Scan and Functional Tests. | Shlomi Sde-Paz, Eyal Salomon |
| 2008 | Engineering Test Coverage on Complex Sockets. | Myron Schneider, Ayub Shafi |
| 2008 | Time-dependent Behaviour of Full Open Defects in Interconnect Lines. | Rosa Rodrguez-Montas, Daniel Arum, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
| 2008 | This is a Test: How to Tell if DFT and Test Are Adding Value to Your Company. | Jeff Rearick |
| 2008 | Achieving Zero-Defects for Automotive Applications. | Rajesh Raina |
| 2008 | Computing at the Crossroads (And What Does it Mean to Verification and Test?). | Jan M. Rabaey |
| 2008 | A New Language Approach for IJTAG. | Michele Portolan, Suresh Goyal, Bradford G. Van Treuren, Chen-Huan Chiang, Tapan J. Chakraborty, Thomas B. Cook |
| 2008 | The Importance of Functional-Like Access for Memory Test. | Jonathan Phelps, Chuck Johnson, Corey Goodrich, Aman Kokrady |
| 2008 | Functional Test and Speed/Power Sorting of the IBM POWER6 and Z10 Processors. | Tung N. Pham, Frances Clougherty, Gerard Salem, James M. Crafts, Jon Tetzloff, Pamela Moczygemba, Timothy M. Skergan |
| 2008 | Having FUN with Analog Test. | Robert A. Pease |
| 2008 | DFX of a 3 | Ishwar Parulkar, Sriram Anandakumar, Gaurav Agarwal, Gordon Liu, Krishna Rajan, Frank Chiu, Rajesh Pendurkar |
| 2008 | Launch-on-Shift-Capture Transition Tests. | Intaik Park, Edward J. McCluskey |
1,201–1,225 of 4,920← PreviousNext →
Comparable venues
Other A*/A conferences filed under the same field of research.
- ADATEDesign, Automation and Test in Europe Conference
- A*DACDesign Automation Conf
- ASCInternational Conference for High Performance Computing, Networking, Storage and Analysis (was Supercomputing Conference)
- AICCADIEEE/ACM International Conference on Computer-Aided Design
- A*ISCAACM International Symposium on Computer Architecture
- A*MICROInternational Symposium on Microarchitecture
- AISLPEDIEEE/ACM International Symposium on Low Power Electronics and Design
- AICSACM International Conference on Supercomputing