| 2008 | Boundary-Scan Testing of Power/Ground Pins. | Kenneth P. Parker, Neil G. Jacobson |
| 2008 | Production Multivariate Outlier Detection Using Principal Components. | Peter M. O'Neill |
| 2008 | Wireless Test Structure for Integrated Systems. | Ziad Noun, Philippe Cauvet, Marie-Lise Flottes, David Andreu, Serge Bernard |
| 2008 | Augmenting Boundary-Scan Tests for Enhanced Defect Coverage. | Dayton Norrgard, Kenneth P. Parker |
| 2008 | Efficient High-Speed Interface Verification and Fault Analysis. | Thomas Nirmaier, Jose Torres Zaguirre, Eric Liau, Wolfgang Spirkl, Armin Rettenberger, Doris Schmitt-Landsiedel |
| 2008 | A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs. | Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian |
| 2008 | Using Implications for Online Error Detection. | Kundan Nepal, Nuno Alves, Jennifer Dworak, R. Iris Bahar |
| 2008 | EVM Testing of Wireless OFDM Transceivers Using Intelligent Back-End Digital Signal Processing Algorithms. | Vishwanath Natarajan, Hyun Woo Choi, Deuk Lee, Rajarajan Senguttuvan, Abhijit Chatterjee |
| 2008 | A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method. | Junghyun Nam, Sunghoon Chun, Gibum Koo, Yanggi Kim, Byungsoo Moon, Jonghyoung Lim, Jaehoon Joo, Sangseok Kang, Hoonjung Kim, Kyeongseon Shin, Kisang Kang, Sungho Kang |
| 2008 | An Automatic Post Silicon Clock Tuning System for Improving System Performance based on Tester Measurements. | Kelageri Nagaraj, Sandip Kundu |
| 2008 | Power-Aware At-Speed Scan Test Methodology for Circuits with Synchronous Clocks. | Benoit Nadeau-Dostie, Kiyoshi Takeshita, Jean-Francois Cote |
| 2008 | IEEE 1500 Core Wrapper Optimization Techniques and Implementation. | Brendan Mullane, Michael Higgins, Ciaran MacNamee |
| 2008 | High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST. | Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer |
| 2008 | Beyond 10 Gbps? Challenges of Characterizing Future I/O Interfaces with Automated Test Equipment. | Jose Moreira, Heidi Barnes, Hiroshi Kaga, Michael Comai, Bernhard Roth, Morgan Culver |
| 2008 | Non-contact Testing for SoC and RCP (SIPs) at Advanced Nodes. | Brian Moore, Marc Mangrum, Chris Sellathamby, Md. Mahbub Reja, T. Weng, Brenda Bai, Edwin Walter Reid, Igor M. Filanovsky, Steven Slupsky |
| 2008 | RTL Error Diagnosis Using a Word-Level SAT-Solver. | Saeed Mirzaeian, Feijun (Frank) Zheng, Kwang-Ting (Tim) Cheng |
| 2008 | Low Energy On-Line SBST of Embedded Processors. | Andreas Merentitis, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos |
| 2008 | External Loopback Testing Experiences with High Speed Serial Interfaces. | Anne Meixner, Akira Kakizawa, Benoit Provost, Serge Bedwani |
| 2008 | Platform Independent Test Access Port Architecture. | Arie Margulis, David Akselrod, Tim Wood, Sopho Metsis |
| 2008 | Fabrication Defects and Fault Models for DNA Self-Assembled Nanoelectronics. | Vincent Mao, Chris Dwyer, Krishnendu Chakrabarty |
| 2008 | Power Distribution Failure Analysis Using Transition-Delay Fault Patterns. | Junxia Ma, Jeremy Lee, Mohammad Tehranipoor |
| 2008 | Embedded Testing in an In-Circuit Test Environment. | John Malian, Bill Eklow |
| 2008 | Jitters in high performance microprocessors. | T. M. Mak |
| 2008 | Testing Techniques for Hardware Security. | Mehrdad Majzoobi, Farinaz Koushanfar, Miodrag Potkonjak |
| 2008 | A Method to Generate a Very Low Distortion, High Frequency Sine Waveform Using an AWG. | Akinori Maeda |