| 2007 | Functional testing of digital microfluidic biochips. | Tao Xu, Krishnendu Chakrabarty |
| 2007 | A fully digital-compatible BIST strategy for ADC linearity testing. | Hanqing Xing, Hanjun Jiang, Degang Chen, Randall L. Geiger |
| 2007 | Fast and effective fault simulation for path delay faults based on selected testable paths. | Dong Xiang, Yang Zhao, Kaiwei Li, Hideo Fujiwara |
| 2007 | Statistical analysis and optimization of parametric delay test. | Sean Hsi Yuan Wu, Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir |
| 2007 | Fully X-tolerant combinational scan compression. | Peter Wohl, John A. Waicukauski, Sanjay Ramnath |
| 2007 | Car IC test changing but the same quality goal. | Gary Wittie |
| 2007 | A novel scheme to reduce power supply noise for high-quality at-speed scan testing. | Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Tatsuya Suzuki, Yuta Yamato, Patrick Girard, Yuji Ohsumi, Laung-Terng Wang |
| 2007 | A low cost test data compression technique for high n-detection fault coverage. | Seongmoon Wang, Zhanglei Wang, Wenlong Wei, Srimat T. Chakradhar |
| 2007 | The design-for-testability features of a general purpose microprocessor. | Da Wang, Xiaoxin Fan, Xiang Fu, Hui Liu, Ke Wen, Rui Li, Huawei Li, Yu Hu, Xiaowei Li |
| 2007 | ACCE: Automatic correction of control-flow errors. | Ramtilak Vemu, Sankar Gurumurthy, Jacob A. Abraham |
| 2007 | Automated handling of programmable on-product clock generation (OPCG) circuitry for delay test vector generation. | Anis Uzzaman, Bibo Li, Thomas J. Snethen, Brion L. Keller, Gary Grise |
| 2007 | Silicon evaluation of longest path avoidance testing for small delay defects. | Ritesh P. Turakhia, W. Robert Daasch, Mark Ward, John Van Slyke |
| 2007 | JTAG system test in a MicroTCA world. | Bradford G. Van Treuren, Adam W. Ley |
| 2007 | X-canceling MISR - An X-tolerant methodology for compacting output responses with unknowns using a MISR. | Nur A. Touba |
| 2007 | Diagnosis for MRAM write disturbance fault. | Chin-Lung Su, Chih-Wea Tsai, Cheng-Wen Wu, Ji-Jan Chen, Wen Ching Wu, Chien-Chung Hung, Ming-Jer Kao |
| 2007 | A selt-testing BOST for high-frequency PLLs, DLLs, and SerDes. | Stephen K. Sunter, Aubin Roy |
| 2007 | Low cost automatic mixed-signal board test using IEEE 1149.4. | Srividya Sundar, Bruce C. Kim, Toby Byrd, Felipe Toledo, Sudhir Wokhlu, Erika Beskar, Raul Rousselin, David Cotton, Gary Kendall |
| 2007 | Faster defect localization in nanometer technology based on defective cell diagnosis. | Manish Sharma, Wu-Tung Cheng, Ting-Pu Tai, Y. S. Cheng, Will Hsu, Chen Liu, Sudhakar M. Reddy, Albert Mann |
| 2007 | ERTG: A test generator for error-rate testing. | Shideh Shahidi, Sandeep K. Gupta |
| 2007 | Test cost reduction for the AMD™ Athlon processor using test partitioning. | Anuja Sehgal, Jeff Fitzgerald, Jeff Rearick |
| 2007 | Backside E-Beam Probing on Nano scale devices. | Rudolf Schlangen, Reiner Leihkauf, Uwe Kerst, Christian Boit, Rajesh Jain, Tahir Malik, Keneth R. Wilsher, Ted R. Lundquist, Bernd Krger |
| 2007 | A stereo audio Σ∑ ADC architecture with embedded SNDR self-test. | Lus Rolndez, Salvador Mir, Jean-Louis Carbonro, Dimitri Goguet, Nabil Chouba |
| 2007 | Measurement ratio testing for improved quality and outlier detection. | Jeffrey L. Roehr |
| 2007 | Power-aware test: Challenges and solutions. | Srivaths Ravi |
| 2007 | Critical roles of RF and microwave electromagnetic field solver simulators in multi-gigabit high-speed digital applications. | Minh Quach, Mark Hinton, Regee Petaja |