| 2007 | Using built-in sensors to cope with long duration transient faults in future technologies. | Carlos Arthur Lang Lisba, Fernanda Lima Kastensmidt, Egas Henes Neto, Gilson I. Wirth, Luigi Carro |
| 2007 | Impact of Quad Flat No Lead package (QFN) on automated X-ray inspection (AXI). | Tee Chwee Liong, Andy Pascual |
| 2007 | A generic and reconfigurable test paradigm using Low-cost integrated Poly-Si TFTs. | Jing Li, Swaroop Ghosh, Kaushik Roy |
| 2007 | Efficient power droop aware delay fault testing. | Bin Li, Lei Fang, Michael S. Hsiao |
| 2007 | New methods for receiver internal jitter measurement. | Mike Peng Li, Jinhua Chen |
| 2007 | A scanisland based design enabling prebond testability in die-stacked microprocessors. | Dean L. Lewis, Hsien-Hsin S. Lee |
| 2007 | Using timing flexibility of automatic test equipment to complement X-tolerant test compression techniques. | Andreas Leininger, Martin Fischer, Michael Richter, Michael Gssel |
| 2007 | Verification and debugging of IDDQ test of low power chips. | Michael Laisne, Triphuong Nguyen, Songlin Zuo, Xiangdong Pan, Hailong Cui, Cher Bai, A. Street, M. Parley, Neetu Agrawal, K. Sundararaman |
| 2007 | Sigma-delta ADC characterization using noise transfer function pole-zero tracking. | Hochul Kim, Kye-Shin Lee |
| 2007 | Testing for systematic defects based on DFM guidelines. | Dongok Kim, M. Enamul Amyeen, Srikanth Venkataraman, Irith Pomeranz, Swagato Basumallick, Berni Landau |
| 2007 | SPARTAN: a spectral and information theoretic approach to partial-scan. | Omar I. Khan, Michael L. Bushnell, Suresh Kumar Devanathan, Vishwani D. Agrawal |
| 2007 | Multi-GHz loopback testing using MEMs switches and SiGe logic. | David C. Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, John McKillop |
| 2007 | Fundamentals of timing information for test: How simple can we get? | Rohit Kapur, Jindrich Zejda, Thomas W. Williams |
| 2007 | Characterization of NBTI induced temporal performance degradation in nano-scale SRAM array using IDDQ. | Kunhyuk Kang, Muhammad Ashraful Alam, Kaushik Roy |
| 2007 | Case study of a low power MTCMOS based ARM926 SoC : Design, analysis and test challenges. | Sachin Idgunji |
| 2007 | Data jitter measurement using a delta-time-to-voltage converter method. | Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma |
| 2007 | Diagnose compound scan chain and system logic defects. | Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Will Hsu, Yuan-Shih Chen, Albert Mann |
| 2007 | A heuristic for thermal-safe SoC test scheduling. | Zhiyuan He, Zebo Peng, Petru Eles |
| 2007 | A methodology for detecting performance faults in microprocessors via performance monitoring hardware. | Miltiadis Hatzimihail, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis |
| 2007 | Programmable deterministic Built-In Self-Test. | Abdul Wahid Hakmi, Hans-Joachim Wunderlich, Christian G. Zoellin, Andreas Glowatz, Friedrich Hapke, Jrgen Schlffel, Laurent Souef |
| 2007 | Enhancing signal controllability in functional test-benches through automatic constraint extraction. | Onur Guzey, Li-C. Wang, Jayanta Bhadra |
| 2007 | A complete test set to diagnose scan chain failures. | Ruifeng Guo, Yu Huang, Wu-Tung Cheng |
| 2007 | Co-development of test electronics and PCI Express interface for a multi-Gbps optical switching network. | Carl Edward Gray, Odile Liboiron-Ladouceur, David C. Keezer, Keren Bergman |
| 2007 | Advancements in at-speed array BIST: multiple improvements. | Kevin W. Gorman, Michael Roberge, Adrian Paparelli, Gary Pomichter, Stephen Sliva, William Corbin |
| 2007 | A concurrent approach for testing address decoder faults in eFlash memories. | Olivier Ginez, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Jean Michel Daga |