| 2005 | A concurrent BIST scheme for on-line/off-line testing based on a pre-computed test set. | Ioannis Voyiatzis, Dimitris Gizopoulos, Antonis M. Paschalis, Constantin Halatsis |
| 2005 | Soft errors: is the concern for soft-errors overblown? | Narayanan Vijaykrishnan |
| 2005 | Achieving higher yield through diagnosis? | Srikanth Venkataraman |
| 2005 | Drive only at speed functional testing; one of the techniques Intel is using to control test costs. | Mike Tripp, Silvio Picano, Baruch Schnarch |
| 2005 | JTAG-based vector and chain management for system test. | Bradford G. Van Treuren, Bryan E. Peterson, Jos M. Miranda |
| 2005 | Logic proximity bridges. | Eric N. Tran, Vamsee Krishna, Sujit T. Zachariah, Sreejit Chakravarty |
| 2005 | Methods for improving test compression. | Nur A. Touba |
| 2005 | An optimal test pattern selection method to improve the defect coverage. | Yuxin Tian, Michael R. Grimaila, Weiping Shi, M. Ray Mercer |
| 2005 | Test methodology for Freescale's high performance e600 core based on PowerPC© instruction set architecture. | Nandu Tendolkar, Dawit Belete, Ashutosh Razdan, Hereman Reyes, Bill Schwarz, Marie Sullivan |
| 2005 | Business constraints drive test decisions - not vice versa. | Sanjiv Taneja |
| 2005 | Achieving higher yield through diagnosis. | Nagesh Tamarapalli |
| 2005 | Jitter spectrum analysis using continuous time interval analyzer (CTIA). | Sassan Tabatabaei, Freddy Ben-Zeev, Touraj Farahmand |
| 2005 | Diagnosis and analysis of an analog circuit failure using time resolved emission microscopy. | Ahmed Syed, Richard F. Herlein, Ben Cain, Frank Sauk |
| 2005 | Reducing test cost through the use of digital testers for analog tests. | John Sweeney, Alan Tsefrekas |
| 2005 | Structural tests for jitter tolerance in SerDes receivers. | Stephen K. Sunter, Aubin Roy |
| 2005 | Correct by construction is guaranteed to fail. | Stephen K. Sunter |
| 2005 | Defect-oriented testing and diagnosis of digital microfluidics-based biochips. | Fei Su, William L. Hwang, Arindam Mukherjee, Krishnendu Chakrabarty |
| 2005 | CMOS high-speed, high-precision timing generator for 4.266-Gbps memory test system. | Masakatsu Suda, Kazuhiro Yamamoto, Toshiyuki Okayasu, Shusuke Kantake, Satoshi Sudou, Daisuke Watanabe |
| 2005 | Enabling yield analysis with X-compact. | Zoran Stanojevic, Ruifeng Guo, Subhasish Mitra, Srikanth Venkataraman |
| 2005 | An advanced optical diagnostic technique of IBM z990 eServer microprocessor. | Peilin Song, Franco Stellari, Bill Huott, Otto Wagner, Uma Srinivasan, Yuen H. Chan, Rick Rizzolo, H. J. Nam, James P. Eckhardt, Timothy G. McNamara, Ching-Lung Tong, Alan J. Weger, Moyra K. McManus |
| 2005 | Guaranteed by design or guaranteed to fail or guaranteed by test? or ... neither? | Mani Soma |
| 2005 | How are we going to test SOC's on a board? | Michael J. Smith |
| 2005 | Reducing high-speed/RF test cost - guaranteed by design or guaranteed to fail? | Mustapha Slamani |
| 2005 | A self-timed structural test methodology for timing anomalies due to defects and process variations. | Adit D. Singh |
| 2005 | Functional vs. multi-VDD testing of RF circuits. | Estella Silva, Jos Pineda de Gyvez, Guido Gronthoud |