| 2005 | Towards achieving relentless reliability gains in a server marketplace of teraflops, laptops, kilowatts, and "cost, cost, cost"...: making peace between a black art and the bottom line. | Jody Van Horn |
| 2005 | Outsourcing DFT: the right mix. | Carl Holzwarth |
| 2005 | Panel synopsis: reducing high-speed/RF test cost: guaranteed by design or guaranteed to fail? | Hosam Haggag, Abhijit Chatterjee |
| 2005 | Automated mapping of pre-computed module-level test sequences to processor instructions. | S. Guramurthy, Shobha Vasudevan, Jacob A. Abraham |
| 2005 | Test time reduction of successive approximation register A/D converter by selective code measurement. | Shalabh Goyal, Abhijit Chatterjee, Mike Atia, Howard Iglehart, Chung Yu Chen, Bassem Shenouda, Nash Khouzam, Hosam Haggag |
| 2005 | Node sensitivity analysis for soft errors in CMOS logic. | Balkaran S. Gill, Christos A. Papachristou, Francis G. Wolff, Norbert Seifert |
| 2005 | Built-in constraint resolution. | Grady Giles, Joel Irby, Daniela Toneva, Kun-Han Tsai |
| 2005 | Is the concern for soft-error overblown? | Rajesh Galivanche |
| 2005 | Development of a software framework for open architecture ATE. | William Fritzsche |
| 2005 | Darwin, thy name is system. | Craig Force |
| 2005 | A strategy for board level in-system programmable built-in assisted test and built-in self test. | Joshua Ferry, Jozef Scesnak, Shoeib Shaikh |
| 2005 | A DDJ calibration methodology for high-speed test and measurement equipments. | Touraj Farahmand, Sassan Tabatabaei, Freddy Ben-Zeev, Andr Ivanov |
| 2005 | A novel stuck-at based method for transistor stuck-open fault diagnosis. | Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud |
| 2005 | An update on IEEE 1149.6 - successes and issues. | Bill Eklow |
| 2005 | Synthesis of nonintrusive concurrent error detection using an even error detecting function. | Avijit Dutta, Nur A. Touba |
| 2005 | Full-speed field-programmable memory BIST architecture. | Xiaogang Du, Nilanjan Mukherjee, Wu-Tung Cheng, Sudhakar M. Reddy |
| 2005 | Business constraints drive test decisions. | Paul Domino |
| 2005 | Methods for improving transition delay fault coverage using broadside tests. | Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz |
| 2005 | The ITC test compression shootout. | Scott Davidson |
| 2005 | Understanding NTF components from the field. | Scott Davidson |
| 2005 | Testing and debugging delay faults in dynamic circuits. | Ramyanshu Datta, Sani R. Nassif, Robert K. Montoye, Jacob A. Abraham |
| 2005 | Data-driven models for statistical testing: measurements, estimates and residuals. | W. Robert Daasch, Robert Madge |
| 2005 | Variance reduction and outliers: statistical analysis of semiconductor test data. | W. Robert Daasch, Robert Madge |
| 2005 | Needs fabless yield ramp foundry partnership to be most successful. | Bruce Cory |
| 2005 | A practical perspective on reducing ASIC NTFs. | Zoe Conroy, Geoff Richmond, Xinli Gu, Bill Eklow |