| 2005 | A transparent solution for providing remote wired or wireless communication to board and system level boundary-scan architectures. | Peter Collins, Ilka Reis, Mikko Simonen, Marc van Houcke |
| 2005 | How are we going to test SoC's on a PCB? | Peter Collins |
| 2005 | Design and analysis of multiple weight linear compactors of responses containing unknown values. | Thomas Clouqueur, Kamran Zarrineh, Kewal K. Saluja, Hideo Fujiwara |
| 2005 | A new approach for massive parallel scan design. | Woo Cheol Chung, Dong Sam Ha |
| 2005 | Gate exhaustive testing. | Kyoung Youn Cho, Subhasish Mitra, Edward J. McCluskey |
| 2005 | Comparative study of CA with phase shifters and GLFSRs. | S. Chidambaram, Dimitrios Kagaris, Dhiraj K. Pradhan |
| 2005 | Diagnosis framework for locating failed segments of path delay faults. | Ying-Yen Chen, Min-Pin Kuo, Jing-Jia Liou |
| 2005 | Panel discussion for "have we overcome the challenges associated with SoC and multi-core testing?". | Nathan Chelstrom |
| 2005 | Microprocessor silicon debug based on failure propagation tracing. | Olivier Caty, Peter Dahlgren, Ismet Bayraktaroglu |
| 2005 | Test connections - tying application to process. | John M. Carulli Jr., Thomas J. Anderson |
| 2005 | A test point selection method for data converters using Rademacher functions and wavelet transforms. | Chandra Carter, Simon S. Ang |
| 2005 | How are we going to test socs on a board? the users viewpoint. | Gunnar Carlsson |
| 2005 | How are we going to test SoCs on a board?: the users viewpoint. | Gunnar Carlsson |
| 2005 | Business constraints drive test decisions planning, partnerships and success. | Michael Campbell |
| 2005 | A test case for 3Gbps serial attached SCSI (SAS). | Yi Cai, Liming Fang, Robert Ratemo, J. Liu, K. Gross, Michael Kozma |
| 2005 | A comprehensive production test solution for 1.5Gb/s and 3Gb/s serial-ATA - based on AWG and undersampling techniques. | Yi Cai, Amit Bhattacharyya, Joe Martone, Anant Verma, William Burchanowski |
| 2005 | Programmable memory BIST. | Slimane Boutobza, Michael Nicolaidis, Kheiredine M. Lamara, Andrea Costa |
| 2005 | Production test enhancement techniques for MB-OFDM ultra-wide band (UWB) devices: EVM and CCDF. | Soumendu Bhattacharya, Rajarajan Senguttuvan, Abhijit Chatterjee |
| 2005 | Reconfigurable systems self-healing using mobile hardware agents. | Alfredo Benso, Alessandro Cilardo, Nicola Mazzocca, Liviu Miclea, Paolo Prinetto, Szilrd Enyedi |
| 2005 | March AB, March AB1: new March tests for unlinked dynamic memory faults. | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto |
| 2005 | The final D-frontier: should DFT be outsourced? | Luis Basto |
| 2005 | Progressive random access scan: a simultaneous solution to test power, test data volume and test time. | Dong Hyun Baik, Kewal K. Saluja |
| 2005 | Remote boundary-scan system test control for the ATCA standard. | David Bckstrm, Gunnar Carlsson, Erik Larsson |
| 2005 | Technique to improve the performance of time-interleaved A-D converters. | Koji Asami |
| 2005 | Evaluating ATE-equipment for volume diagnosis. | Ralf Arnold, Andreas Leininger |