| 2005 | A structured approach for the systematic test of embedded automotive communication systems. | Eric Armengaud, Florian Rothensteiner, Andreas Steininger, Roman Pallierer, Martin Horauer, Martin Zauner |
| 2005 | Lowering the cost of test with a scalable ATE custom processor and timing IC containing 400 high-linearity timing verniers. | Brian Arkin |
| 2005 | Analysis of error-masking and X-masking probabilities for convolutional compactors. | Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki |
| 2005 | A scalable test strategy for network-on-chip routers. | Alexandre M. Amory, Eduardo Wenzel Brio, rika F. Cota, Marcelo Lubaszewski, Fernando Gehm Moraes |
| 2005 | Enhanced launch-off-capture transition fault testing. | Nisar Ahmed, Mohammad Tehranipoor, C. P. Ravikumar |
| 2005 | Parallel, multi-DUT testing in an open architecture test system. | Toshiaki Adachi, Ankan K. Pramanick, Mark Elston |
| 2005 | Defect-based RF testing using a new catastrophic fault model. | Erkan Acar, Sule Ozev |
| 2004 | Investment vs. Yield Relationship for Memories in SOC. | Yervant Zorian |
| 2004 | Analysis of delay caused by bridging faults in RLC interconnects. | Quming Zhou, Kartik Mohanram |
| 2004 | IPV6 Conformance Testing: Theory and Practice. | Yujun Zhang, Zhongcheng Li |
| 2004 | On Random Pattern Generation with the Selfish Gene Algorithm for Testing Digital Sequential Circuits. | Junwu Zhang, Michael L. Bushnell, Vishwani D. Agrawal |
| 2004 | On Correlating Structural Tests with Functional Tests for Speed Binning of High Performance Design. | Jing Zeng, Magdy S. Abadir, A. Kolhatkar, G. Vandling, Li-C. Wang, Jacob A. Abraham |
| 2004 | How to Bridge the Gap Between Simulationand Test. | Martin Zambaldi, Wolfgang Ecker |
| 2004 | Performance Characterization of Mixed-Signal Circuits Using a Ternary Signal Representation. | Hak-soo Yu, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham |
| 2004 | A Computationally Efficient Method for Accurate Spectral Testing without Requiring Coherent Sampling. | Zhongjun Yu, Degang Chen, Randall L. Geiger |
| 2004 | Evaluating the Effectiveness of Detecting Delay Defects in the Slack Interval: A Simulation Study. | Haihua Yan, Adit D. Singh |
| 2004 | Scan Based Side Channel Attack on Dedicated Hardware Implementations of Data Encryption Standard. | Bo Yang, Kaijie Wu, Ramesh Karri |
| 2004 | A Real-Time Jitter Measurement Board for High-Performance Computer and Communication Systems. | Takahiro J. Yamaguchi, Masahiro Ishida, Kiyotaka Ichiyama, Mani Soma, Christian Krawinkel, Katsuaki Ohsawa, Masao Sugai |
| 2004 | Loopback or not? | Takahiro J. Yamaguchi |
| 2004 | Time/Area Tradeoffs in Testing Hierarchical SOCs With Hard Mega-Cores. | Qiang Xu, Nicola Nicolici |
| 2004 | Technical Paper Reviewers. | |
| 2004 | TTTC: Test Technology Technical Council. | |
| 2004 | 2005 Call for Papers. | |
| 2004 | ITC Technical Paper Evaluation and Selection Process. | |
| 2004 | Technical Program Committee. | |