| 2004 | 2003 Paper Awards. | |
| 2004 | Ned Kornfield Memorial. | |
| 2004 | Steering Committee and Subcommittees. | |
| 2004 | Welcoming Message. | |
| 2004 | International Test Conference - Copyright. | |
| 2004 | International Test Conference - Title Page. | |
| 2004 | International Test Conference - Cover. | |
| 2004 | Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. | Armin Wrtenberger, Christofer S. Tautermann, Sybille Hellebrand |
| 2004 | An Optimized DFT and Test Pattern Generation Strategy for an Intel High Performance Microprocessor. | David M. Wu, Mike Lin, Madhukar Reddy, Talal Jaber, Anil Sabbavarapu, Larry Thatcher |
| 2004 | Low Cost Concurrent Error Detection for the Advanced Encryption Standard. | Kaijie Wu, Ramesh Karri, Grigori Kuznetsov, Michael Gssel |
| 2004 | State Variable Extraction to Reduce Problem Complexity for ATPG and Design Validation. | Qingwei Wu, Michael S. Hsiao |
| 2004 | Digital Synchronization for Reconfigurable ATE. | Burnell G. West, Michael F. Jones |
| 2004 | Open Architecture ATE: Prospects and Problems. | Burnell G. West |
| 2004 | 34.1Gbps Low Jitter, Low BER High-Speed Parallel CMOS Interface for Interconnections in High-Speed Memory Test System. | Daisuke Watanabe, Masakatsu Suda, Toshiyuki Okayasu |
| 2004 | On-line Testing Field Programmable Analog Array Circuits. | Haibo Wang, Suchitra Kulkarni, Spyros Tragoudas |
| 2004 | VirtualScan: A New Compressed Scan Technology for Test Cost Reduction. | Laung-Terng Wang, Khader S. Abdel-Hafez, Shianling Wu, Xiaoqing Wen, Hiroshi Furukawa, Fei-Sheng Hsu, Shyh-Horng Lin, Sen-Wei Tsai |
| 2004 | Post-Packaging Auto Repair Techniques for Fast Row Cycle Embedded DRAM. | Osamu Wada, Toshimasa Namekawa, Hiroshi Ito, Atsushi Nakayama, Shuso Fujii |
| 2004 | Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. | Thomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, Vyacheslav Rovner, S. Tiwary |
| 2004 | Trends in Testing Integrated Circuits. | Bart Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert Van Rijsinge |
| 2004 | Production Test Effectiveness of Combined Automated Inspection and ICT Test Strategies. | Amit Verma, Charles Robinson, Steve Butkovich |
| 2004 | Diagnosis meets Physical Failure Analysis: What is needed to succeed? | Srikanth Venkataraman |
| 2004 | Elimination of Traditional Functional Testing of Interface Timings at Intel. | Mike Tripp, T. M. Mak, Anne Meixner |
| 2004 | ITC 2004 Panel: Cost of Test - Taking Control. | Mike Tripp |
| 2004 | Experimental Results for High-Speed Jitter Measurement Technique. | Karen Taylor, Bryan Nelson, Alan Chong, Hieu Nguyen, Henry C. Lin, Mani Soma, Hosam Haggag, Jeff Huard, Jim Braatz |
| 2004 | X-Masking During Logic BIST and Its Impact on Defect Coverage. | Yuyi Tang, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Piet Engelke, Ilia Polian, Bernd Becker |