| 2004 | Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test Environment without Increasing Test Time. | Christopher S. Taillefer, Gordon W. Roberts |
| 2004 | Interconnect Delay Testing of Designs on Programmable Logic Devices. | Mehdi Baradaran Tahoori, Subhasish Mitra |
| 2004 | Application-Dependent Diagnosis of FPGAs. | Mehdi Baradaran Tahoori |
| 2004 | Jitter Generation and Measurement for Test of Multigbps Serial IO. | Sassan Tabatabaei, Michael Lee, Freddy Ben-Zeev |
| 2004 | Automatic Delay Calibration Method for Multi-channel CMOS Formatter. | Ahmed Rashid Syed |
| 2004 | Identifying Untestable Transition Faults in Latch Based Designs with Multiple Clocks. | Manan Syal, Michael S. Hsiao, Sreejit Chakravarty |
| 2004 | An Automated, Complete, Structural Test Solution for SERDES. | Stephen K. Sunter, Aubin Roy, Jean-Francois Cote |
| 2004 | MRAM Defect Analysis and Fault Modeli. | Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Chien-Chung Hung, Ming-Jer Kao, Yeong-Jar Chang, Wen Ching Wu |
| 2004 | Concurrent Testing of Droplet-Based Microfluidic Systems for Multiplexed Biomedical Assays. | Fei Su, Krishnendu Chakrabarty |
| 2004 | Built-In Self-Test for System-on-Chip: A Case Study. | Charles E. Stroud, John Sunwoo, Srinivas M. Garimella, Jonathan Harris |
| 2004 | Testing in a high volume DSM Environment. | Thomas M. Storey |
| 2004 | A Little DFT Goes a Long Way When Testing Multi-Gb/s I/O Signals. | Jim Sproch |
| 2004 | Testing a secure device: High coverage with very low observability. | Laurent Sourgen |
| 2004 | A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current. | Peilin Song, Franco Stellari, Alan J. Weger, Tian Xia |
| 2004 | What do you mean my Board Test stinks? | Michael J. Smith |
| 2004 | Tester Architecture For The Source Synchronous Bus. | A. T. Sivaram, Masashi Shimanouchi, Howard Maassen, Robert Jackson |
| 2004 | Active Tester Interface Unit Design For Data Collection. | A. T. Sivaram, Pascal Pierra, Shida Sheibani, Nancy Wang-Lee, Jorge E. Solorzano, Lily Tran |
| 2004 | On-Chip Impulse Response Generation for Analog and Mixed-Signal Testing. | Abhishek Singh, Chintan Patel, Jim Plusquellic |
| 2004 | Autonomous Yet Deterministic Test of SOC Cores. | Ozgur Sinanoglu, Alex Orailoglu |
| 2004 | Timing Accuracy Enhancement by a New Calibration Scheme for Multi-Gbps ATE. | Masashi Shimanouchi |
| 2004 | SPIN-SIM: Logic and Fault Simulation for Speed-Independent Circuits. | Feng Shi, Yiorgos Makris |
| 2004 | IEEE Std 1149.6 Implementation for a XAUI-to-Serial 10-Gbps Transceiver. | Saghir A. Shaikh |
| 2004 | Extending the Digital Core-based Test Methodology to Support Mixed-Signal. | Geert Seuren, Tom Waayers |
| 2004 | Test Strategies for Nanometer Technologies. | Sanjay Sengupta |
| 2004 | Formal Verification of a System-on-Chip Using Computation Slicing. | Alper Sen, Vijay K. Garg, Jacob A. Abraham, Jayanta Bhadra |